| target | platform_name | test suite | result | elapsed_time (sec) | copy_method | |-------------------------|-----------------|---------------------------------------------------------|--------|--------------------|-------------| | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | OK | 46.3 | default | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | OK | 99.73 | default | 2 OK | target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) | |-------------------------|-----------------|---------------------------------------------------------|-------------------------------------------------------|--------|--------|--------|--------------------| | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | DEFAULT Testing get type functionality | 1 | 0 | OK | 0.1 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing BlockDevice erase functionality | 1 | 0 | OK | 0.38 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing Deinit block device | 1 | 0 | OK | 0.11 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing Init block device | 1 | 0 | OK | 0.09 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing contiguous erase, write and read | 1 | 0 | OK | 0.36 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing multi threads erase program read | 1 | 0 | OK | 0.9 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing program read small data sizes | 1 | 0 | OK | 0.13 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing read write random blocks | 1 | 0 | OK | 0.27 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | FLASHIAP Testing unaligned erase blocks | 1 | 0 | OK | 0.13 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing BlockDevice erase functionality | 1 | 0 | OK | 0.2 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing Deinit block device | 1 | 0 | OK | 0.09 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing Init block device | 1 | 0 | OK | 0.09 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing contiguous erase, write and read | 1 | 0 | OK | 6.79 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing multi threads erase program read | 1 | 0 | OK | 0.42 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing program read small data sizes | 1 | 0 | OK | 3.12 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing read write random blocks | 1 | 0 | OK | 0.28 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | features-storage-tests-blockdevice-general_block_device | QSPIF Testing unaligned erase blocks | 1 | 0 | OK | 0.49 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi frequency setting test | 1 | 0 | OK | 2.64 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi init/free test | 1 | 0 | OK | 0.37 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi memory id test | 1 | 0 | OK | 0.1 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-1)/x1 repeat/x1 test | 1 | 0 | OK | 0.38 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-1)/x1 repeat/x4 test | 1 | 0 | OK | 1.79 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-1)/x4 repeat/x1 test | 1 | 0 | OK | 0.39 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.39 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-2)/x1 repeat/x4 test | 1 | 0 | OK | 1.76 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-2)/x4 repeat/x1 test | 1 | 0 | OK | 0.35 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-4)/x1 repeat/x1 test | 1 | 0 | OK | 0.79 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-4)/x1 repeat/x4 test | 1 | 0 | OK | 3.52 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-1-4)/x4 repeat/x1 test | 1 | 0 | OK | 0.8 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-2-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.37 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-2-2)/x1 repeat/x4 test | 1 | 0 | OK | 1.73 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-2-2)/x4 repeat/x1 test | 1 | 0 | OK | 0.38 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-4-4)/x1 repeat/x1 test | 1 | 0 | OK | 0.81 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-4-4)/x1 repeat/x4 test | 1 | 0 | OK | 3.48 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x1 read(1-4-4)/x4 repeat/x1 test | 1 | 0 | OK | 0.84 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x4 read(1-1-1)/x1 repeat/x1 test | 1 | 0 | OK | 0.42 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x4 read(1-1-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.39 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x4 read(1-1-4)/x1 repeat/x1 test | 1 | 0 | OK | 0.81 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x4 read(1-2-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.39 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-1)/x4 read(1-4-4)/x1 repeat/x1 test | 1 | 0 | OK | 0.8 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-1)/x1 repeat/x1 test | 1 | 0 | OK | 0.84 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-1)/x1 repeat/x4 test | 1 | 0 | OK | 3.5 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-1)/x4 repeat/x1 test | 1 | 0 | OK | 0.82 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.87 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-2)/x1 repeat/x4 test | 1 | 0 | OK | 3.63 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-2)/x4 repeat/x1 test | 1 | 0 | OK | 0.86 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-4)/x1 repeat/x1 test | 1 | 0 | OK | 1.24 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-4)/x1 repeat/x4 test | 1 | 0 | OK | 5.14 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-1-4)/x4 repeat/x1 test | 1 | 0 | OK | 1.22 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-2-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.85 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-2-2)/x1 repeat/x4 test | 1 | 0 | OK | 3.46 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-2-2)/x4 repeat/x1 test | 1 | 0 | OK | 0.83 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-4-4)/x1 repeat/x1 test | 1 | 0 | OK | 1.22 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-4-4)/x1 repeat/x4 test | 1 | 0 | OK | 5.11 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x1 read(1-4-4)/x4 repeat/x1 test | 1 | 0 | OK | 1.21 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x4 read(1-1-1)/x1 repeat/x1 test | 1 | 0 | OK | 0.83 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x4 read(1-1-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.81 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x4 read(1-1-4)/x1 repeat/x1 test | 1 | 0 | OK | 1.22 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x4 read(1-2-2)/x1 repeat/x1 test | 1 | 0 | OK | 0.85 | | CY8CKIT_062_BLE-GCC_ARM | CY8CKIT_062_BLE | tests-mbed_hal-qspi | qspi write(1-1-4)/x4 read(1-4-4)/x1 repeat/x1 test | 1 | 0 | OK | 1.2 | 60 OK