mbedgt: greentea test automation tool ver. 1.6.5 mbedgt: test specification file 'o3\CY8CKIT_064S2_4343W\test_spec.json' (specified with --test-spec option) mbedgt: using 'o3\CY8CKIT_064S2_4343W\test_spec.json' from current directory! mbedgt: detecting connected mbed-enabled devices... mbedgt: detected 7 devices mbedgt: processing target 'CY8CKIT_064S2_4343W' toolchain 'IAR' compatible platforms... (note: switch set to --parallel 1) mbedgt: test case filter (specified with -n option) tests-* test filtered in 'tests-events-timing' test filtered in 'tests-events-queue' test filtered in 'tests-mbedmicro-mbed-call_before_main' test filtered in 'tests-mbedmicro-mbed-attributes' test filtered in 'tests-mbedmicro-mbed-cpp' test filtered in 'tests-mbedmicro-mbed-div' test filtered in 'tests-mbedmicro-mbed-static_assert' test filtered in 'tests-mbedmicro-rtos-mbed-basic' test filtered in 'tests-mbedmicro-rtos-mbed-condition_variable' test filtered in 'tests-mbedmicro-rtos-mbed-event_flags' test filtered in 'tests-mbedmicro-rtos-mbed-heap_and_stack' test filtered in 'tests-mbedmicro-rtos-mbed-kernel_tick_count' test filtered in 'tests-mbedmicro-rtos-mbed-mail' test filtered in 'tests-mbedmicro-rtos-mbed-malloc' test filtered in 'tests-mbedmicro-rtos-mbed-memorypool' test filtered in 'tests-mbedmicro-rtos-mbed-mutex' test filtered in 'tests-mbedmicro-rtos-mbed-queue' test filtered in 'tests-mbedmicro-rtos-mbed-rtostimer' test filtered in 'tests-mbedmicro-rtos-mbed-semaphore' test filtered in 'tests-mbedmicro-rtos-mbed-signals' test filtered in 'tests-mbedmicro-rtos-mbed-systimer' test filtered in 'tests-mbedmicro-rtos-mbed-threads' test filtered in 'tests-mbedtls-multi' test filtered in 'tests-mbedtls-selftest' test filtered in 'tests-mbed_drivers-crc' test filtered in 'tests-mbed_drivers-c_strings' test filtered in 'tests-mbed_drivers-dev_null' test filtered in 'tests-mbed_drivers-echo' test filtered in 'tests-mbed_drivers-flashiap' test filtered in 'tests-mbed_drivers-generic_tests' test filtered in 'tests-mbed_drivers-lp_ticker' test filtered in 'tests-mbed_drivers-lp_timeout' test filtered in 'tests-mbed_drivers-lp_timer' test filtered in 'tests-mbed_drivers-race_test' test filtered in 'tests-mbed_drivers-sleep_lock' test filtered in 'tests-mbed_drivers-rtc' test filtered in 'tests-mbed_drivers-stl_features' test filtered in 'tests-mbed_drivers-ticker' test filtered in 'tests-mbed_drivers-timeout' test filtered in 'tests-mbed_drivers-timer' test filtered in 'tests-mbed_drivers-timerevent' test filtered in 'tests-mbed_drivers-watchdog' test filtered in 'tests-mbed_drivers-watchdog_reset' test filtered in 'tests-mbed_functional-callback' test filtered in 'tests-mbed_functional-callback_big' test filtered in 'tests-mbed_functional-functionpointer' test filtered in 'tests-mbed_functional-callback_small' test filtered in 'tests-mbed_hal-common_tickers' test filtered in 'tests-mbed_hal-common_tickers_freq' test filtered in 'tests-mbed_hal-crc' test filtered in 'tests-mbed_hal-critical_section' test filtered in 'tests-mbed_hal-flash' test filtered in 'tests-mbed_hal-gpio' test filtered in 'tests-mbed_hal-minimum_requirements' test filtered in 'tests-mbed_hal-lp_ticker' test filtered in 'tests-mbed_hal-pinmap' test filtered in 'tests-mbed_hal-rtc' test filtered in 'tests-mbed_hal-rtc_reset' test filtered in 'tests-mbed_hal-rtc_time' test filtered in 'tests-mbed_hal-rtc_time_conv' test filtered in 'tests-mbed_hal-sleep' test filtered in 'tests-mbed_hal-sleep_manager' test filtered in 'tests-mbed_hal-sleep_manager_racecondition' test filtered in 'tests-mbed_hal-stack_size_unification' test filtered in 'tests-mbed_hal-us_ticker' test filtered in 'tests-mbed_hal-ticker' test filtered in 'tests-mbed_hal-trng' test filtered in 'tests-mbed_hal-watchdog' test filtered in 'tests-mbed_hal-watchdog_timing' test filtered in 'tests-mbed_hal-watchdog_reset' test filtered in 'tests-mbed_platform-critical_section' test filtered in 'tests-mbed_platform-circularbuffer' test filtered in 'tests-mbed_platform-atomic' test filtered in 'tests-mbed_platform-error_handling' test filtered in 'tests-mbed_platform-filehandle' test filtered in 'tests-mbed_platform-sharedptr' test filtered in 'tests-mbed_platform-minimal-printf' test filtered in 'tests-mbed_platform-singletonptr' test filtered in 'tests-mbed_platform-stream' test filtered in 'tests-mbed_platform-system_reset' test filtered in 'tests-mbed_platform-transaction' test filtered in 'tests-mbed_platform-wait_ns' test filtered in 'tests-network-l3ip' test filtered in 'tests-usb_device-hid' test filtered in 'tests-usb_device-basic' test filtered in 'tests-usb_device-msd' test filtered in 'tests-usb_device-serial' mbedgt: running 87 tests for platform 'CY8CKIT_064S2_4343W' and toolchain 'IAR' mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-events-timing' ............................................................. OK in 88.72 sec test case: 'Testing accuracy of equeue semaphore' ............................................ OK in 19.76 sec test case: 'Testing accuracy of equeue tick' ................................................. OK in 19.76 sec test case: 'Testing accuracy of timer' ....................................................... OK in 19.75 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-events-queue' .............................................................. OK in 35.40 sec test case: 'Testing allocate failure' ........................................................ OK in 0.05 sec test case: 'Testing call_every' .............................................................. OK in 1.89 sec test case: 'Testing call_in' ................................................................. OK in 1.89 sec test case: 'Testing calls with 0 args' ....................................................... OK in 0.05 sec test case: 'Testing calls with 1 args' ....................................................... OK in 0.05 sec test case: 'Testing calls with 2 args' ....................................................... OK in 0.05 sec test case: 'Testing calls with 3 args' ....................................................... OK in 0.05 sec test case: 'Testing calls with 4 args' ....................................................... OK in 0.05 sec test case: 'Testing calls with 5 args' ....................................................... OK in 0.05 sec test case: 'Testing event cancel 1' .......................................................... OK in 0.04 sec test case: 'Testing mixed dynamic & static events queue' ..................................... OK in 0.07 sec test case: 'Testing static events queue' ..................................................... OK in 0.06 sec test case: 'Testing the event class' ......................................................... OK in 0.05 sec test case: 'Testing the event class helpers' ................................................. OK in 0.06 sec test case: 'Testing the event inference' ..................................................... OK in 0.05 sec test case: 'Testing time_left' ............................................................... OK in 0.22 sec mbedgt: test case summary: 16 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbedmicro-mbed-call_before_main test case: tests-mbedmicro-mbed-call_before_main mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-mbed-call_before_main' ........................................... OK in 25.22 sec test case: 'tests-mbedmicro-mbed-call_before_main' ........................................... OK in 25.22 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-mbed-attributes' ................................................. OK in 39.92 sec test case: 'Testing ALIGN attribute' ......................................................... OK in 0.06 sec test case: 'Testing DEPRECATED attribute' .................................................... OK in 0.06 sec test case: 'Testing FORCEINLINE attribute' ................................................... OK in 0.05 sec test case: 'Testing NORETURN attribute' ...................................................... OK in 0.06 sec test case: 'Testing PACKED attribute' ........................................................ OK in 0.05 sec test case: 'Testing PURE attribute' .......................................................... OK in 0.05 sec test case: 'Testing UNREACHABLE attribute' ................................................... OK in 0.06 sec test case: 'Testing UNUSED attribute' ........................................................ OK in 0.06 sec test case: 'Testing WEAK attribute' .......................................................... OK in 0.05 sec mbedgt: test case summary: 9 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbedmicro-mbed-cpp test case: tests-mbedmicro-mbed-cpp mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-mbed-cpp' ........................................................ OK in 25.34 sec test case: 'tests-mbedmicro-mbed-cpp' ........................................................ OK in 25.34 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbedmicro-mbed-div test case: tests-mbedmicro-mbed-div mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-mbed-div' ........................................................ OK in 25.24 sec test case: 'tests-mbedmicro-mbed-div' ........................................................ OK in 25.24 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-mbed-static_assert' .............................................. OK in 25.62 sec test case: 'Compilation test' ................................................................ OK in 0.05 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-basic' ................................................. OK in 40.66 sec test case: 'Test ThisThread::sleep_for accuracy' ............................................. OK in 10.20 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-condition_variable' .................................... OK in 26.29 sec test case: 'Test linked list' ................................................................ OK in 0.05 sec test case: 'Test notify all' ................................................................. OK in 0.05 sec test case: 'Test notify one' ................................................................. OK in 0.05 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-event_flags' ........................................... OK in 32.12 sec test case: 'Test clear/set with prohibited flag' ............................................. OK in 0.06 sec test case: 'Test empty clear' ................................................................ OK in 0.06 sec test case: 'Test empty get' .................................................................. OK in 0.05 sec test case: 'Test empty set' .................................................................. OK in 0.04 sec test case: 'Test multi-threaded wait_all' .................................................... OK in 0.05 sec test case: 'Test multi-threaded wait_all many wait' .......................................... OK in 0.08 sec test case: 'Test multi-threaded wait_any' .................................................... OK in 0.05 sec test case: 'Test multi-threaded wait_any no clear' ........................................... OK in 0.07 sec test case: 'Test multi-threaded wait_any timeout' ............................................ OK in 0.24 sec test case: 'Test set/get/clear for full flag range' .......................................... OK in 0.06 sec mbedgt: test case summary: 10 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-heap_and_stack' ........................................ OK in 31.16 sec test case: 'Test heap allocation and free' ................................................... OK in 0.14 sec test case: 'Test heap in range' .............................................................. OK in 0.04 sec test case: 'Test isr stack in range' ......................................................... OK in 0.06 sec test case: 'Test main stack in range' ........................................................ OK in 0.05 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-kernel_tick_count' ..................................... OK in 28.18 sec test case: 'Test if kernel ticker increments by one' ......................................... OK in 0.93 sec test case: 'Test if kernel ticker interval is 1ms' ........................................... OK in 0.93 sec test case: 'Test kernel ticker frequency' .................................................... OK in 0.05 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-mail' .................................................. OK in 30.67 sec test case: 'Test calloc' ..................................................................... OK in 0.04 sec test case: 'Test get with timeout on empty mailbox' .......................................... OK in 0.07 sec test case: 'Test get without timeout on empty mailbox' ....................................... OK in 0.07 sec test case: 'Test invalid message free' ....................................................... OK in 0.05 sec test case: 'Test mail empty' ................................................................. OK in 0.05 sec test case: 'Test mail full' .................................................................. OK in 0.04 sec test case: 'Test mailbox max size' ........................................................... OK in 0.06 sec test case: 'Test message send order' ......................................................... OK in 0.06 sec test case: 'Test message send/receive multi-thread and per thread order' ..................... OK in 0.25 sec test case: 'Test message send/receive multi-thread, multi-Mail and per thread order' ......... OK in 0.10 sec test case: 'Test message send/receive single thread and order' ............................... OK in 0.08 sec test case: 'Test message type uint16' ........................................................ OK in 0.05 sec test case: 'Test message type uint32' ........................................................ OK in 0.05 sec test case: 'Test message type uint8' ......................................................... OK in 0.05 sec test case: 'Test null message free' .......................................................... OK in 0.06 sec mbedgt: test case summary: 15 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-malloc' ................................................ OK in 47.62 sec test case: 'Test 0 size allocation' .......................................................... OK in 0.06 sec test case: 'Test NULL pointer free' .......................................................... OK in 0.05 sec test case: 'Test large allocation' ........................................................... OK in 0.06 sec test case: 'Test multiple alloc and free calls' .............................................. OK in 0.94 sec test case: 'Test multithreaded allocations' .................................................. OK in 19.75 sec mbedgt: test case summary: 5 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-memorypool' ............................................ OK in 34.21 sec test case: 'Test: alloc()/calloc() - success, 1 bytes b_type, q_size equal to 1.' ............ OK in 0.10 sec test case: 'Test: alloc()/calloc() - success, 1 bytes b_type, q_size equal to 3.' ............ OK in 0.10 sec test case: 'Test: alloc()/calloc() - success, 4 bytes b_type, q_size equal to 1.' ............ OK in 0.09 sec test case: 'Test: alloc()/calloc() - success, 4 bytes b_type, q_size equal to 3.' ............ OK in 0.09 sec test case: 'Test: alloc()/calloc() - success, complex b_type, q_size equal to 1.' ............ OK in 0.10 sec test case: 'Test: alloc()/calloc() - success, complex b_type, q_size equal to 3.' ............ OK in 0.10 sec test case: 'Test: fail (out of free blocks).' ................................................ OK in 0.06 sec test case: 'Test: free() - robust (free called with invalid param - NULL).' .................. OK in 0.08 sec test case: 'Test: free() - robust (free called with invalid param).' ......................... OK in 0.09 sec test case: 'Test: free() - success, 4 bytes b_type, q_size equal to 1.' ...................... OK in 0.09 sec test case: 'Test: free() - success, 4 bytes b_type, q_size equal to 3.' ...................... OK in 0.09 sec test case: 'Test: free() - success, complex b_type, q_size equal to 1.' ...................... OK in 0.09 sec test case: 'Test: free() - success, complex b_type, q_size equal to 3.' ...................... OK in 0.10 sec test case: 'Test: re-allocation of the first block, basic type.' ............................. OK in 0.08 sec test case: 'Test: re-allocation of the first block, complex type.' ........................... OK in 0.09 sec test case: 'Test: re-allocation of the last block, basic type.' .............................. OK in 0.09 sec test case: 'Test: re-allocation of the last block, complex type.' ............................ OK in 0.09 sec test case: 'Test: timeout' ................................................................... OK in 0.05 sec test case: 'Test: wait forever' .............................................................. OK in 0.05 sec mbedgt: test case summary: 19 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-mutex' ................................................. OK in 30.28 sec test case: 'Test dual thread lock locked' .................................................... OK in 0.06 sec test case: 'Test dual thread lock unlock' .................................................... OK in 0.07 sec test case: 'Test dual thread second thread lock' ............................................. OK in 0.06 sec test case: 'Test dual thread second thread trylock' .......................................... OK in 0.08 sec test case: 'Test dual thread trylock locked' ................................................. OK in 0.07 sec test case: 'Test multiple thread' ............................................................ OK in 1.94 sec test case: 'Test single thread lock' ......................................................... OK in 0.05 sec test case: 'Test single thread lock recursive' ............................................... OK in 0.07 sec test case: 'Test single thread trylock' ...................................................... OK in 0.05 sec mbedgt: test case summary: 9 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-queue' ................................................. OK in 29.10 sec test case: 'Test get empty wait forever' ..................................................... OK in 0.06 sec test case: 'Test get from empty queue no timeout' ............................................ OK in 0.06 sec test case: 'Test get from empty queue timeout' ............................................... OK in 0.06 sec test case: 'Test message ordering' ........................................................... OK in 0.05 sec test case: 'Test message priority' ........................................................... OK in 0.05 sec test case: 'Test pass ptr msg' ............................................................... OK in 0.04 sec test case: 'Test pass uint msg' .............................................................. OK in 0.06 sec test case: 'Test pass uint msg twice' ........................................................ OK in 0.05 sec test case: 'Test put full no timeout' ........................................................ OK in 0.05 sec test case: 'Test put full timeout' ........................................................... OK in 0.05 sec test case: 'Test put full wait forever' ...................................................... OK in 0.05 sec test case: 'Test queue empty' ................................................................ OK in 0.05 sec test case: 'Test queue full' ................................................................. OK in 0.05 sec mbedgt: test case summary: 13 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-rtostimer' ............................................. OK in 28.09 sec test case: 'One-shot not restarted when elapsed' ............................................. OK in 0.07 sec test case: 'Periodic repeats continuously' ................................................... OK in 0.08 sec test case: 'Restart changes timeout' ......................................................... OK in 0.05 sec test case: 'Stopped timer can be started again' .............................................. OK in 0.06 sec test case: 'Timer can be stopped' ............................................................ OK in 0.04 sec test case: 'Timer is created in stopped state' ............................................... OK in 0.07 sec test case: 'Timer started with infinite delay' ............................................... OK in 0.07 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-semaphore' ............................................. OK in 30.59 sec test case: 'Test 0 tokens no timeout' ........................................................ OK in 0.06 sec test case: 'Test 1 token no timeout' ......................................................... OK in 0.05 sec test case: 'Test multiple threads' ........................................................... OK in 3.17 sec test case: 'Test multiple tokens release' .................................................... OK in 0.06 sec test case: 'Test multiple tokens wait' ....................................................... OK in 0.06 sec test case: 'Test single thread' .............................................................. OK in 0.05 sec test case: 'Test timeout' .................................................................... OK in 0.05 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-signals' ............................................... OK in 32.51 sec test case: 'Validate all signals clear in one shot' .......................................... OK in 0.06 sec test case: 'Validate all signals set in one shot' ............................................ OK in 0.06 sec test case: 'Validate all signals set one by one in loop' ..................................... OK in 0.08 sec test case: 'Validate if any signals are set on just created thread' .......................... OK in 0.08 sec test case: 'Validate if setting same signal twice cause any unwanted behaviour' .............. OK in 0.10 sec test case: 'Validate if signal_wait accumulate signals and return correctly when all signals set' OK in 0.11 sec test case: 'Validate if signal_wait return correctly when all signals set' ................... OK in 0.10 sec test case: 'Validate signal_wait return status if timeout specified: 0[ms] all signals' ...... OK in 0.11 sec test case: 'Validate signal_wait return status if timeout specified: 0[ms] no signals' ....... OK in 0.11 sec test case: 'Validate signal_wait return status if timeout specified: 1[ms] all signals' ...... OK in 0.11 sec test case: 'Validate signal_wait return status if timeout specified: 1[ms] no signals' ....... OK in 0.11 sec test case: 'Validate that call of signal_wait return correctly when thread has all signals already set' OK in 0.11 sec test case: 'Validate that call signal_clr(NO_SIGNALS) doesn't change thread signals and return actual signals' OK in 0.13 sec test case: 'Validate that call signal_set with prohibited signal doesn't change thread signals' OK in 0.11 sec mbedgt: test case summary: 14 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-systimer' .............................................. OK in 30.53 sec test case: 'Handler called twice' ............................................................ OK in 0.05 sec test case: 'Tick can be cancelled' ........................................................... OK in 0.06 sec test case: 'Tick count is updated correctly' ................................................. OK in 0.05 sec test case: 'Tick count is zero upon creation' ................................................ OK in 0.06 sec test case: 'Time is updated correctly' ....................................................... OK in 0.06 sec test case: 'Wake up from deep sleep' ......................................................... OK in 0.05 sec test case: 'Wake up from sleep' .............................................................. OK in 0.05 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedmicro-rtos-mbed-threads' ............................................... OK in 47.00 sec test case: 'Testing parallel threads' ........................................................ OK in 0.05 sec test case: 'Testing parallel threads with child' ............................................. OK in 0.06 sec test case: 'Testing parallel threads with murder' ............................................ OK in 0.07 sec test case: 'Testing parallel threads with wait' .............................................. OK in 0.06 sec test case: 'Testing parallel threads with yield' ............................................. OK in 0.06 sec test case: 'Testing serial threads' .......................................................... OK in 0.06 sec test case: 'Testing serial threads with child' ............................................... OK in 0.07 sec test case: 'Testing serial threads with murder' .............................................. OK in 0.08 sec test case: 'Testing serial threads with wait' ................................................ OK in 0.92 sec test case: 'Testing serial threads with yield' ............................................... OK in 0.07 sec test case: 'Testing single thread' ........................................................... OK in 0.06 sec test case: 'Testing single thread with child' ................................................ OK in 0.06 sec test case: 'Testing single thread with murder' ............................................... OK in 0.06 sec test case: 'Testing single thread with wait' ................................................. OK in 0.06 sec test case: 'Testing single thread with yield' ................................................ OK in 0.07 sec test case: 'Testing thread flags: flags clear' ............................................... OK in 0.06 sec test case: 'Testing thread flags: multi-bit all' ............................................. OK in 0.06 sec test case: 'Testing thread flags: multi-bit all timeout' ..................................... OK in 0.07 sec test case: 'Testing thread flags: multi-bit any' ............................................. OK in 0.06 sec test case: 'Testing thread flags: timeout' ................................................... OK in 0.05 sec test case: 'Testing thread flags: wait' ...................................................... OK in 0.05 sec test case: 'Testing thread name' ............................................................. OK in 0.04 sec test case: 'Testing thread priority ops' ..................................................... OK in 0.05 sec test case: 'Testing thread self terminate' ................................................... OK in 0.06 sec test case: 'Testing thread stack info' ....................................................... OK in 0.04 sec test case: 'Testing thread states: deleted' .................................................. OK in 0.07 sec test case: 'Testing thread states: wait delay' ............................................... OK in 0.06 sec test case: 'Testing thread states: wait event flag' .......................................... OK in 0.07 sec test case: 'Testing thread states: wait message get' ......................................... OK in 0.06 sec test case: 'Testing thread states: wait message put' ......................................... OK in 0.08 sec test case: 'Testing thread states: wait mutex' ............................................... OK in 0.06 sec test case: 'Testing thread states: wait semaphore' ........................................... OK in 0.06 sec test case: 'Testing thread states: wait thread flags' ........................................ OK in 0.08 sec test case: 'Testing thread wait' ............................................................. OK in 0.06 sec test case: 'Testing thread with external stack memory' ....................................... OK in 0.07 sec mbedgt: test case summary: 35 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedtls-multi' ............................................................. OK in 28.15 sec test case: 'Crypto: sha256_multi' ............................................................ OK in 0.80 sec test case: 'Crypto: sha256_split' ............................................................ OK in 0.28 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbedtls-selftest' .......................................................... OK in 33.06 sec test case: 'mbedtls_entropy_self_test' ....................................................... OK in 0.06 sec test case: 'mbedtls_sha256_self_test' ........................................................ OK in 0.06 sec test case: 'mbedtls_sha512_self_test' ........................................................ OK in 0.05 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-crc' .......................................................... OK in 38.27 sec test case: 'Test SD CRC polynomials' ......................................................... OK in 0.04 sec test case: 'Test not supported polynomials' .................................................. OK in 0.06 sec test case: 'Test partial CRC' ................................................................ OK in 0.04 sec test case: 'Test supported polynomials' ...................................................... OK in 0.06 sec test case: 'Test thread safety' .............................................................. OK in 0.05 sec mbedgt: test case summary: 5 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-c_strings' .................................................... OK in 41.02 sec test case: 'C strings: %e %E float formatting' ............................................... OK in 0.07 sec test case: 'C strings: %f %f float formatting' ............................................... OK in 0.06 sec test case: 'C strings: %g %g float formatting' ............................................... OK in 0.06 sec test case: 'C strings: %i %d integer formatting' ............................................. OK in 0.07 sec test case: 'C strings: %u %d integer formatting' ............................................. OK in 0.06 sec test case: 'C strings: %x %E integer formatting' ............................................. OK in 0.07 sec test case: 'C strings: strpbrk' .............................................................. OK in 0.05 sec test case: 'C strings: strtok' ............................................................... OK in 0.04 sec mbedgt: test case summary: 8 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbed_drivers-dev_null test case: tests-mbed_drivers-dev_null mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-dev_null' ..................................................... OK in 35.07 sec test case: 'tests-mbed_drivers-dev_null' ..................................................... OK in 35.07 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-echo' ......................................................... OK in 27.62 sec test case: 'Echo server: x16' ................................................................ OK in 1.93 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-flashiap' ..................................................... OK in 27.58 sec test case: 'FlashIAP - init' ................................................................. OK in 0.09 sec test case: 'FlashIAP - program' .............................................................. OK in 0.11 sec test case: 'FlashIAP - program across sectors' ............................................... OK in 0.11 sec test case: 'FlashIAP - program errors' ....................................................... OK in 0.10 sec test case: 'FlashIAP - timing' ............................................................... OK in 0.29 sec mbedgt: test case summary: 5 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-generic_tests' ................................................ OK in 26.52 sec test case: 'Basic' ........................................................................... OK in 0.02 sec test case: 'Blinky' .......................................................................... OK in 0.03 sec test case: 'C++ heap' ........................................................................ OK in 0.09 sec test case: 'C++ stack' ....................................................................... OK in 0.15 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-lp_ticker' .................................................... OK in 36.14 sec test case: 'Test attach for 0.001s and time measure' ......................................... OK in 0.06 sec test case: 'Test attach for 0.01s and time measure' .......................................... OK in 0.07 sec test case: 'Test attach for 0.1s and time measure' ........................................... OK in 0.07 sec test case: 'Test attach for 0.5s and time measure' ........................................... OK in 0.44 sec test case: 'Test attach_us for 100ms and time measure' ....................................... OK in 0.07 sec test case: 'Test attach_us for 10ms and time measure' ........................................ OK in 0.06 sec test case: 'Test attach_us for 1ms and time measure' ......................................... OK in 0.06 sec test case: 'Test attach_us for 500ms and time measure' ....................................... OK in 0.44 sec test case: 'Test detach' ..................................................................... OK in 0.59 sec test case: 'Test multi call and time measure' ................................................ OK in 0.93 sec test case: 'Test multi ticker' ............................................................... OK in 0.14 sec mbedgt: test case summary: 11 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-lp_timeout' ................................................... OK in 71.62 sec test case: '1 s delay accuracy (attach)' ..................................................... OK in 0.93 sec test case: '1 s delay accuracy (attach_us)' .................................................. OK in 0.92 sec test case: '1 s delay during deepsleep (attach)' ............................................. OK in 0.94 sec test case: '1 s delay during deepsleep (attach_us)' .......................................... OK in 0.96 sec test case: '1 s delay during sleep (attach)' ................................................. OK in 0.93 sec test case: '1 s delay during sleep (attach_us)' .............................................. OK in 0.93 sec test case: '10 ms delay accuracy (attach)' ................................................... OK in 0.06 sec test case: '10 ms delay accuracy (attach_us)' ................................................ OK in 0.06 sec test case: '5 s delay accuracy (attach)' ..................................................... OK in 4.92 sec test case: '5 s delay accuracy (attach_us)' .................................................. OK in 4.93 sec test case: 'Callback called once (attach)' ................................................... OK in 0.05 sec test case: 'Callback called once (attach_us)' ................................................ OK in 0.07 sec test case: 'Callback not called when cancelled (attach)' ..................................... OK in 0.06 sec test case: 'Callback not called when cancelled (attach_us)' .................................. OK in 0.07 sec test case: 'Callback override (attach)' ...................................................... OK in 0.05 sec test case: 'Callback override (attach_us)' ................................................... OK in 0.07 sec test case: 'Multiple timeouts running in parallel (attach)' .................................. OK in 0.07 sec test case: 'Multiple timeouts running in parallel (attach_us)' ............................... OK in 0.08 sec test case: 'Timing drift (attach)' ........................................................... OK in 9.55 sec test case: 'Timing drift (attach_us)' ........................................................ OK in 10.28 sec test case: 'Zero delay (attach)' ............................................................. OK in 0.05 sec test case: 'Zero delay (attach_us)' .......................................................... OK in 0.06 sec mbedgt: test case summary: 22 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-lp_timer' ..................................................... OK in 33.26 sec test case: 'Test: LowPowerTimer - float operator.' ........................................... OK in 0.06 sec test case: 'Test: LowPowerTimer - measure time accumulation.' ................................ OK in 1.10 sec test case: 'Test: LowPowerTimer - reset.' .................................................... OK in 0.06 sec test case: 'Test: LowPowerTimer - start started timer.' ...................................... OK in 0.08 sec test case: 'Test: LowPowerTimer - stopped after creation.' ................................... OK in 0.08 sec test case: 'Test: LowPowerTimer - time measurement 1 ms.' .................................... OK in 0.06 sec test case: 'Test: LowPowerTimer - time measurement 1 s.' ..................................... OK in 0.93 sec test case: 'Test: LowPowerTimer - time measurement 10 ms.' ................................... OK in 0.07 sec test case: 'Test: LowPowerTimer - time measurement 100 ms.' .................................. OK in 0.09 sec mbedgt: test case summary: 9 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-race_test' .................................................... OK in 31.39 sec test case: 'class init race' ................................................................. OK in 0.51 sec test case: 'function init race' .............................................................. OK in 0.41 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-sleep_lock' ................................................... OK in 33.14 sec test case: 'DeepSleepLock lock test' ......................................................... OK in 0.05 sec test case: 'timer lock test' ................................................................. OK in 0.05 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-rtc' .......................................................... OK in 49.65 sec test case: 'Functional Test: RTC counts seconds.' ............................................ OK in 9.83 sec test case: 'Functional Test: set time - CUSTOM_TIME_0.' ...................................... OK in 0.08 sec test case: 'Functional Test: set time - CUSTOM_TIME_1.' ...................................... OK in 0.07 sec test case: 'Functional Test: set time - CUSTOM_TIME_2.' ...................................... OK in 0.07 sec test case: 'Unit Test: attach original RTC functions.' ....................................... OK in 0.07 sec test case: 'Unit Test: attach stub RTC functions.' ........................................... OK in 0.06 sec test case: 'Unit Test: set_time() - RTC functions are defined.' .............................. OK in 0.07 sec test case: 'Unit Test: set_time() - init RTC function is undefined.' ......................... OK in 0.08 sec test case: 'Unit Test: set_time() - write RTC function is undefined.' ........................ OK in 0.08 sec test case: 'Unit Test: time() - RTC functions are defined, RTC is disabled.' ................. OK in 0.10 sec test case: 'Unit Test: time() - RTC functions are defined, RTC is enabled.' .................. OK in 0.10 sec test case: 'Unit Test: time() - isenabled RTC function is undefined.' ........................ OK in 0.09 sec test case: 'Unit Test: time() - read RTC function is undefined.' ............................. OK in 0.08 sec test case: 'Unit Test: time() - result is stored in given buffer.' ........................... OK in 0.08 sec mbedgt: test case summary: 14 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-stl_features' ................................................. OK in 27.30 sec test case: 'STL std::equal' .................................................................. OK in 0.04 sec test case: 'STL std::sort abs' ............................................................... OK in 0.05 sec test case: 'STL std::sort greater' ........................................................... OK in 0.04 sec test case: 'STL std::transform' .............................................................. OK in 0.04 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-ticker' ....................................................... OK in 50.74 sec test case: 'Test attach for 0.01s and time measure' .......................................... OK in 0.06 sec test case: 'Test attach for 0.1s and time measure' ........................................... OK in 0.06 sec test case: 'Test attach for 0.5s and time measure' ........................................... OK in 0.44 sec test case: 'Test attach_us for 100ms and time measure' ....................................... OK in 0.06 sec test case: 'Test attach_us for 10ms and time measure' ........................................ OK in 0.08 sec test case: 'Test attach_us for 500ms and time measure' ....................................... OK in 0.44 sec test case: 'Test detach' ..................................................................... OK in 0.60 sec test case: 'Test multi call and time measure' ................................................ OK in 0.92 sec test case: 'Test multi ticker' ............................................................... OK in 0.14 sec test case: 'Test timers: 1x ticker' .......................................................... OK in 9.40 sec test case: 'Test timers: 2x ticker' .......................................................... OK in 10.22 sec mbedgt: test case summary: 11 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-timeout' ...................................................... OK in 64.52 sec test case: '1 s delay accuracy (attach)' ..................................................... OK in 0.92 sec test case: '1 s delay accuracy (attach_us)' .................................................. OK in 0.92 sec test case: '1 s delay during sleep (attach)' ................................................. OK in 0.92 sec test case: '1 s delay during sleep (attach_us)' .............................................. OK in 0.93 sec test case: '10 ms delay accuracy (attach)' ................................................... OK in 0.06 sec test case: '10 ms delay accuracy (attach_us)' ................................................ OK in 0.07 sec test case: '5 s delay accuracy (attach)' ..................................................... OK in 4.88 sec test case: '5 s delay accuracy (attach_us)' .................................................. OK in 4.89 sec test case: 'Callback called once (attach)' ................................................... OK in 0.06 sec test case: 'Callback called once (attach_us)' ................................................ OK in 0.05 sec test case: 'Callback not called when cancelled (attach)' ..................................... OK in 0.08 sec test case: 'Callback not called when cancelled (attach_us)' .................................. OK in 0.07 sec test case: 'Callback override (attach)' ...................................................... OK in 0.07 sec test case: 'Callback override (attach_us)' ................................................... OK in 0.06 sec test case: 'Multiple timeouts running in parallel (attach)' .................................. OK in 0.08 sec test case: 'Multiple timeouts running in parallel (attach_us)' ............................... OK in 0.08 sec test case: 'Timing drift (attach)' ........................................................... OK in 9.40 sec test case: 'Timing drift (attach_us)' ........................................................ OK in 10.36 sec test case: 'Zero delay (attach)' ............................................................. OK in 0.05 sec test case: 'Zero delay (attach_us)' .......................................................... OK in 0.05 sec mbedgt: test case summary: 20 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-timer' ........................................................ OK in 36.91 sec test case: 'Test: Timer (based on os ticker) - float operator.' .............................. OK in 0.08 sec test case: 'Test: Timer (based on os ticker) - measured time accumulation.' .................. OK in 1.11 sec test case: 'Test: Timer (based on os ticker) - reset.' ....................................... OK in 0.06 sec test case: 'Test: Timer (based on os ticker) - start started timer.' ......................... OK in 0.08 sec test case: 'Test: Timer (based on os ticker) is stopped after creation.' ..................... OK in 0.10 sec test case: 'Test: Timer (based on user ticker) - float operator.' ............................ OK in 0.07 sec test case: 'Test: Timer (based on user ticker) - reset.' ..................................... OK in 0.07 sec test case: 'Test: Timer (based on user ticker) - start started timer.' ....................... OK in 0.09 sec test case: 'Test: Timer (based on user ticker) is stopped after creation.' ................... OK in 0.09 sec test case: 'Test: Timer (based on user ticker) measured time accumulation.' .................. OK in 0.08 sec test case: 'Test: Timer - time measurement 1 ms.' ............................................ OK in 0.07 sec test case: 'Test: Timer - time measurement 1 s.' ............................................. OK in 0.92 sec test case: 'Test: Timer - time measurement 10 ms.' ........................................... OK in 0.06 sec test case: 'Test: Timer - time measurement 100 ms.' .......................................... OK in 0.07 sec mbedgt: test case summary: 14 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-timerevent' ................................................... OK in 27.53 sec test case: 'Test insert' ..................................................................... OK in 0.05 sec test case: 'Test insert timestamp from the past' ............................................. OK in 0.06 sec test case: 'Test insert_absolute' ............................................................ OK in 0.06 sec test case: 'Test insert_absolute timestamp from the past' .................................... OK in 0.07 sec test case: 'Test insert_absolute zero' ....................................................... OK in 0.05 sec test case: 'Test remove after insert' ........................................................ OK in 0.07 sec test case: 'Test remove after insert_absolute' ............................................... OK in 0.08 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_drivers/watchdog/watchdog.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-watchdog' ..................................................... TIMEOUT in 70.67 sec test case: 'Restart multiple times' .......................................................... OK in 0.05 sec test case: 'Start, 100 ms' ................................................................... ERROR in 0.00 sec test case: 'Start, max_timeout' .............................................................. SKIPPED in 0.00 sec test case: 'Stop' ............................................................................ OK in 0.09 sec test case: 'max_timeout is valid' ............................................................ OK in 0.04 sec mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_drivers/watchdog_reset/watchdog_reset.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_drivers-watchdog_reset' ............................................... TIMEOUT in 116.48 sec test case: 'Kicking the Watchdog prevents reset' ............................................. SKIPPED in 0.00 sec test case: 'Watchdog reset' .................................................................. ERROR in 0.00 sec test case: 'Watchdog reset in sleep mode' .................................................... SKIPPED in 0.00 sec test case: 'Watchdog started again' .......................................................... SKIPPED in 0.00 sec mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_functional-callback' .................................................. OK in 29.91 sec test case: 'Testing callbacks with 0 ints' ................................................... OK in 0.06 sec test case: 'Testing callbacks with 1 ints' ................................................... OK in 0.06 sec test case: 'Testing callbacks with 2 ints' ................................................... OK in 0.07 sec test case: 'Testing callbacks with 3 ints' ................................................... OK in 0.06 sec test case: 'Testing callbacks with 4 ints' ................................................... OK in 0.05 sec test case: 'Testing callbacks with 5 ints' ................................................... OK in 0.05 sec mbedgt: test case summary: 6 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_functional-callback_big' .............................................. OK in 40.86 sec test case: 'Testing callbacks with 0 uint64s' ................................................ OK in 0.06 sec test case: 'Testing callbacks with 1 uint64s' ................................................ OK in 0.06 sec test case: 'Testing callbacks with 2 uint64s' ................................................ OK in 0.06 sec test case: 'Testing callbacks with 3 uint64s' ................................................ OK in 0.06 sec test case: 'Testing callbacks with 4 uint64s' ................................................ OK in 0.06 sec test case: 'Testing callbacks with 5 uint64s' ................................................ OK in 0.07 sec mbedgt: test case summary: 6 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_functional-functionpointer' ........................................... OK in 33.91 sec test case: 'Testing FunctionPointer compatibility' ........................................... OK in 0.06 sec test case: 'Testing FunctionPointerArg1 compatibility' ....................................... OK in 0.07 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_functional-callback_small' ............................................ OK in 27.99 sec test case: 'Testing callbacks with 0 uchars' ................................................. OK in 0.06 sec test case: 'Testing callbacks with 1 uchars' ................................................. OK in 0.07 sec test case: 'Testing callbacks with 2 uchars' ................................................. OK in 0.06 sec test case: 'Testing callbacks with 3 uchars' ................................................. OK in 0.07 sec test case: 'Testing callbacks with 4 uchars' ................................................. OK in 0.06 sec test case: 'Testing callbacks with 5 uchars' ................................................. OK in 0.06 sec mbedgt: test case summary: 6 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-common_tickers' ................................................... OK in 31.25 sec test case: 'Microsecond ticker fire interrupt' ............................................... OK in 0.06 sec test case: 'Microsecond ticker increment test' ............................................... OK in 0.06 sec test case: 'Microsecond ticker info test' .................................................... OK in 0.05 sec test case: 'Microsecond ticker init is safe to call repeatedly' .............................. OK in 0.08 sec test case: 'Microsecond ticker interrupt test' ............................................... OK in 0.06 sec test case: 'Microsecond ticker overflow test' ................................................ OK in 0.08 sec test case: 'Microsecond ticker past interrupt test' .......................................... OK in 0.07 sec test case: 'Microsecond ticker reschedule test' .............................................. OK in 0.07 sec test case: 'Microsecond ticker speed test' ................................................... OK in 0.06 sec test case: 'lp ticker fire interrupt' ........................................................ OK in 0.06 sec test case: 'lp ticker increment test' ........................................................ OK in 0.05 sec test case: 'lp ticker info test' ............................................................. OK in 0.04 sec test case: 'lp ticker init is safe to call repeatedly' ....................................... OK in 0.07 sec test case: 'lp ticker interrupt test' ........................................................ OK in 0.06 sec test case: 'lp ticker overflow test' ......................................................... OK in 0.08 sec test case: 'lp ticker past interrupt test' ................................................... OK in 0.06 sec test case: 'lp ticker reschedule test' ....................................................... OK in 0.05 sec test case: 'lp ticker speed test' ............................................................ OK in 0.06 sec mbedgt: test case summary: 18 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-common_tickers_freq' .............................................. OK in 45.84 sec test case: 'Low power ticker frequency test' ................................................. OK in 10.29 sec test case: 'Microsecond ticker frequency test' ............................................... OK in 9.41 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-crc' .............................................................. OK in 27.92 sec test case: 'test: CRC calculation - multi input.' ............................................ OK in 0.06 sec test case: 'test: CRC calculation - single input.' ........................................... OK in 0.08 sec test case: 'test: hal_crc_compute_partial() - invalid parameters.' ........................... OK in 0.08 sec test case: 'test: hal_crc_is_supported() - invalid parameter.' ............................... OK in 0.07 sec test case: 'test: re-configure without getting the result.' .................................. OK in 0.07 sec test case: 'test: supported polynomials.' .................................................... OK in 0.05 sec mbedgt: test case summary: 6 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-critical_section' ................................................. OK in 26.14 sec test case: 'Test critical section nested lock' ............................................... OK in 0.07 sec test case: 'Test critical section single lock' ............................................... OK in 0.06 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-flash' ............................................................ OK in 27.39 sec test case: 'Flash - clock and cache test' .................................................... OK in 0.21 sec test case: 'Flash - erase sector' ............................................................ OK in 0.10 sec test case: 'Flash - init' .................................................................... OK in 0.21 sec test case: 'Flash - mapping alignment' ....................................................... OK in 0.06 sec test case: 'Flash - program page' ............................................................ OK in 0.09 sec mbedgt: test case summary: 5 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-gpio' ............................................................. OK in 25.66 sec test case: 'gpio NC test' .................................................................... OK in 0.03 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-minimum_requirements' ............................................. OK in 26.62 sec test case: 'Minimum data test' ............................................................... OK in 0.04 sec test case: 'Minimum heap test' ............................................................... OK in 0.04 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-lp_ticker' ........................................................ OK in 34.98 sec test case: 'lp ticker glitch test' ........................................................... OK in 0.05 sec test case: 'lp ticker info test' ............................................................. OK in 0.05 sec test case: 'lp ticker sleep test' ............................................................ OK in 0.05 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-pinmap' ........................................................... OK in 34.61 sec test case: 'pinmap - validation' ............................................................. OK in 0.78 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-rtc' .............................................................. OK in 76.75 sec test case: 'RTC - accuracy' .................................................................. OK in 9.90 sec test case: 'RTC - enabled' ................................................................... OK in 0.03 sec test case: 'RTC - glitch' .................................................................... OK in 3.90 sec test case: 'RTC - init' ...................................................................... OK in 0.05 sec test case: 'RTC - persist' ................................................................... OK in 3.88 sec test case: 'RTC - range' ..................................................................... OK in 15.76 sec test case: 'RTC - sleep' ..................................................................... OK in 7.94 sec test case: 'RTC - write/read' ................................................................ OK in 0.05 sec mbedgt: test case summary: 8 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbed_hal-rtc_reset test case: tests-mbed_hal-rtc_reset mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-rtc_reset' ........................................................ OK in 30.97 sec test case: 'tests-mbed_hal-rtc_reset' ........................................................ OK in 30.97 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-rtc_time' ......................................................... OK in 30.26 sec test case: 'test is leap year - RTC leap years full support' ................................. OK in 0.07 sec test case: 'test is leap year - RTC leap years partial support' .............................. OK in 0.07 sec test case: 'test local time - invalid param' ................................................. OK in 0.06 sec test case: 'test make time - invalid param' .................................................. OK in 0.05 sec test case: 'test make time boundary values - RTC leap years full support' .................... OK in 0.09 sec test case: 'test make time boundary values - RTC leap years partial support' ................. OK in 0.10 sec test case: 'test set_time twice' ............................................................. OK in 1.90 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-rtc_time_conv' .................................................... OK in 45.85 sec test case: 'test make time and local time - RTC leap years full support' ..................... OK in 9.27 sec test case: 'test make time and local time - RTC leap years partial support' .................. OK in 9.24 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 22650, Actual wake up tick: 21996, delay ticks: 655, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 27628, Actual wake up tick: 26319, delay ticks: 1310, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 33290, Actual wake up tick: 31324, delay ticks: 1966, wake up after ticks: 0 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 38950, Actual wake up tick: 36330, delay ticks: 2621, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 44611, Actual wake up tick: 41336, delay ticks: 3276, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 50274, Actual wake up tick: 46342, delay ticks: 3932, wake up after ticks: 0 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 55934, Actual wake up tick: 51348, delay ticks: 4587, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 61595, Actual wake up tick: 56354, delay ticks: 5242, wake up after ticks: 1 mbedgt: :153::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 67257, Actual wake up tick: 61359, delay ticks: 5898, wake up after ticks: 0 mbedgt: :204::FAIL: Delta ticks: 331, Ticker width: 32, Expected wake up tick: 78220, Actual wake up tick: 77566 mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_hal/sleep/sleep.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-sleep' ............................................................ FAIL in 28.41 sec test case: 'deep-sleep - high-speed clocks are turned off' ................................... FAIL in 0.18 sec test case: 'deep-sleep - source of wake-up - lp ticker' ...................................... FAIL in 1.45 sec test case: 'sleep - source of wake-up - us ticker' ........................................... OK in 0.07 sec mbedgt: test case summary: 1 pass, 2 failures mbedgt: mbed-host-test-runner: started mbedgt: :209::FAIL: Deep sleep mode unlocked, but not used mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_hal/sleep_manager/sleep_manager.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-sleep_manager' .................................................... FAIL in 26.93 sec test case: 'deep sleep lock/unlock' .......................................................... OK in 0.05 sec test case: 'deep sleep lock/unlock test_check' ............................................... SKIPPED in 0.00 sec test case: 'deep sleep locked USHRT_MAX times' ............................................... OK in 0.07 sec test case: 'sleep_auto calls sleep/deep sleep based on lock' ................................. FAIL in 0.13 sec mbedgt: test case summary: 2 passes, 1 failure mbedgt: utest test case summary mismatch: utest reported passes and failures miscount! reported by utest: passes = 2, failures 1) test case result count: passes = 2, failures 2) mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-sleep_manager_racecondition' ...................................... OK in 38.82 sec test case: 'deep sleep lock/unlock is IRQ safe' .............................................. OK in 9.85 sec test case: 'deep sleep lock/unlock is thread safe' ........................................... OK in 2.43 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-stack_size_unification' ........................................... OK in 25.71 sec test case: 'Stack size unification test' ..................................................... OK in 0.06 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-us_ticker' ........................................................ OK in 29.10 sec test case: 'us ticker info test' ............................................................. OK in 0.05 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-ticker' ........................................................... OK in 45.89 sec test case: 'legacy insert event head' ........................................................ OK in 0.05 sec test case: 'legacy insert event in overflow range' ........................................... OK in 0.06 sec test case: 'legacy insert event multiple overflow' ........................................... OK in 0.07 sec test case: 'legacy insert event outside overflow range' ...................................... OK in 0.08 sec test case: 'legacy insert event overflow' .................................................... OK in 0.07 sec test case: 'legacy insert event tail' ........................................................ OK in 0.05 sec test case: 'test_frequencies_and_masks' ...................................................... OK in 1.35 sec test case: 'test_insert_event_us_head' ....................................................... OK in 0.05 sec test case: 'test_insert_event_us_in_overflow_range' .......................................... OK in 0.06 sec test case: 'test_insert_event_us_multiple_random' ............................................ OK in 0.06 sec test case: 'test_insert_event_us_outside_overflow_range' ..................................... OK in 0.08 sec test case: 'test_insert_event_us_tail' ....................................................... OK in 0.06 sec test case: 'test_insert_event_us_underflow' .................................................. OK in 0.06 sec test case: 'test_irq_handler_insert_immediate_in_irq' ........................................ OK in 0.06 sec test case: 'test_irq_handler_insert_non_immediate_in_irq' .................................... OK in 0.07 sec test case: 'test_irq_handler_multiple_event_multiple_dequeue' ................................ OK in 0.07 sec test case: 'test_irq_handler_multiple_event_single_dequeue' .................................. OK in 0.08 sec test case: 'test_irq_handler_multiple_event_single_dequeue_overflow' ......................... OK in 0.09 sec test case: 'test_irq_handler_single_event' ................................................... OK in 0.06 sec test case: 'test_irq_handler_single_event_spurious' .......................................... OK in 0.07 sec test case: 'test_legacy_insert_event_multiple_random' ........................................ OK in 0.07 sec test case: 'test_match_interval_passed' ...................................................... OK in 0.07 sec test case: 'test_match_interval_passed_table' ................................................ OK in 0.06 sec test case: 'test_remove_event_head' .......................................................... OK in 0.06 sec test case: 'test_remove_event_invalid' ....................................................... OK in 0.05 sec test case: 'test_remove_event_tail' .......................................................... OK in 0.05 sec test case: 'test_remove_random' .............................................................. OK in 0.04 sec test case: 'test_set_interrupt_past_time' .................................................... OK in 0.05 sec test case: 'test_set_interrupt_past_time_with_delay' ......................................... OK in 0.07 sec test case: 'test_suspend_resume' ............................................................. OK in 0.04 sec test case: 'test_ticker_max_value' ........................................................... OK in 0.05 sec test case: 'ticker initialization' ........................................................... OK in 0.06 sec test case: 'ticker multiple initialization' .................................................. OK in 0.05 sec test case: 'ticker read' ..................................................................... OK in 0.04 sec test case: 'ticker read overflow' ............................................................ OK in 0.04 sec test case: 'update overflow guard' ........................................................... OK in 0.06 sec test case: 'update overflow guard in case of spurious interrupt' ............................. OK in 0.08 sec mbedgt: test case summary: 37 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-trng' ............................................................. OK in 32.16 sec test case: 'TRNG: trng_test' ................................................................. OK in 0.19 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_hal/watchdog/watchdog.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-watchdog' ......................................................... TIMEOUT in 76.79 sec test case: 'Init, 100 ms' .................................................................... ERROR in 0.00 sec test case: 'Init, max_timeout' ............................................................... SKIPPED in 0.00 sec test case: 'Platform feature max_timeout is valid' ........................................... OK in 0.06 sec test case: 'Stopped watchdog can be started again' ........................................... OK in 0.08 sec test case: 'Update config with multiple init calls' .......................................... OK in 0.07 sec test case: 'Watchdog can be stopped' ......................................................... OK in 0.12 sec mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-watchdog_timing' .................................................. OK in 69.48 sec test case: 'Timing, 1000 ms' ................................................................. OK in 0.04 sec test case: 'Timing, 200 ms' .................................................................. OK in 0.04 sec test case: 'Timing, 3000 ms' ................................................................. OK in 0.05 sec test case: 'Timing, 500 ms' .................................................................. OK in 0.04 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: utest test case summary mismatch: utest reported passes and failures miscount! reported by utest: passes = 1, failures 0) test case result count: passes = 4, failures 0) mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/mbed_hal/watchdog_reset/watchdog_reset.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_hal-watchdog_reset' ................................................... TIMEOUT in 116.59 sec test case: 'Kicking the Watchdog prevents reset' ............................................. SKIPPED in 0.00 sec test case: 'Watchdog reset' .................................................................. ERROR in 0.00 sec test case: 'Watchdog reset in sleep mode' .................................................... SKIPPED in 0.00 sec test case: 'Watchdog started again' .......................................................... SKIPPED in 0.00 sec mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-critical_section' ............................................ OK in 27.83 sec test case: 'Test critical section C API' ..................................................... OK in 0.06 sec test case: 'Test critical section C API nested lock' ......................................... OK in 0.08 sec test case: 'Test critical section C++ API constructor/destructor' ............................ OK in 0.08 sec test case: 'Test critical section C++ API constructor/destructor nested lock' ................ OK in 0.09 sec test case: 'Test critical section C++ API enable/disable' .................................... OK in 0.08 sec test case: 'Test critical section C++ API enable/disable nested lock' ........................ OK in 0.10 sec mbedgt: test case summary: 6 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-circularbuffer' .............................................. OK in 32.41 sec test case: 'Input does not exceed capacity(1) push max, pop max.' ............................ OK in 0.09 sec test case: 'Input does not exceed capacity(10) push 2, pop 1.' ............................... OK in 0.07 sec test case: 'Input does not exceed capacity(3) push max, pop max.' ............................ OK in 0.08 sec test case: 'Input does not exceed capacity(5) push 2, pop 1.' ................................ OK in 0.07 sec test case: 'Input exceeds capacity(1) push max+1, pop max.' .................................. OK in 0.07 sec test case: 'Input exceeds capacity(10) push 2, pop 1.' ....................................... OK in 0.08 sec test case: 'Input exceeds capacity(3) push max+1, pop max.' .................................. OK in 0.08 sec test case: 'Input exceeds capacity(5) push 2, pop 1 - complex type.' ......................... OK in 0.08 sec test case: 'Input exceeds capacity(5) push 2, pop 1.' ........................................ OK in 0.07 sec test case: 'Test CounterType/BufferSize boarder case.' ....................................... OK in 0.08 sec test case: 'Test pop(), peek(), empty(), full(), size() after CircularBuffer creation.' ...... OK in 0.10 sec test case: 'empty() returns true when buffer(3 elements) is empty.' .......................... OK in 0.09 sec test case: 'empty() returns true when buffer(5 elements) is empty.' .......................... OK in 0.09 sec test case: 'full() returns true when buffer(3 elements) is full.' ............................ OK in 0.07 sec test case: 'full() returns true when buffer(5 elements) is full.' ............................ OK in 0.09 sec test case: 'peek() return data without popping the element.' ................................. OK in 0.07 sec test case: 'reset() clears the buffer.' ...................................................... OK in 0.05 sec mbedgt: test case summary: 17 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-atomic' ...................................................... OK in 36.29 sec test case: 'Test atomic add 16-bit' .......................................................... OK in 0.05 sec test case: 'Test atomic add 32-bit' .......................................................... OK in 0.05 sec test case: 'Test atomic add 64-bit' .......................................................... OK in 0.06 sec test case: 'Test atomic add 8-bit' ........................................................... OK in 0.04 sec test case: 'Test atomic add release 32-bit' .................................................. OK in 0.06 sec test case: 'Test atomic add signed 16-bit' ................................................... OK in 0.06 sec test case: 'Test atomic add signed 32-bit' ................................................... OK in 0.06 sec test case: 'Test atomic add signed 64-bit' ................................................... OK in 0.06 sec test case: 'Test atomic add signed 8-bit' .................................................... OK in 0.07 sec test case: 'Test atomic bitops 16-bit' ....................................................... OK in 0.16 sec test case: 'Test atomic bitops 32-bit' ....................................................... OK in 0.14 sec test case: 'Test atomic bitops 64-bit' ....................................................... OK in 0.15 sec test case: 'Test atomic bitops 8-bit' ........................................................ OK in 0.14 sec test case: 'Test atomic compare exchange strong 16-bit' ...................................... OK in 0.16 sec test case: 'Test atomic compare exchange strong 32-bit' ...................................... OK in 0.17 sec test case: 'Test atomic compare exchange strong 64-bit' ...................................... OK in 0.08 sec test case: 'Test atomic compare exchange strong 8-bit' ....................................... OK in 0.16 sec test case: 'Test atomic compare exchange weak 16-bit' ........................................ OK in 0.14 sec test case: 'Test atomic compare exchange weak 32-bit' ........................................ OK in 0.15 sec test case: 'Test atomic compare exchange weak 64-bit' ........................................ OK in 0.07 sec test case: 'Test atomic compare exchange weak 8-bit' ......................................... OK in 0.15 sec test case: 'Test atomic sub 16-bit' .......................................................... OK in 0.05 sec test case: 'Test atomic sub 32-bit' .......................................................... OK in 0.05 sec test case: 'Test atomic sub 64-bit' .......................................................... OK in 0.04 sec test case: 'Test atomic sub 8-bit' ........................................................... OK in 0.05 sec test case: 'Test large atomic custom structure' .............................................. OK in 0.25 sec test case: 'Test small atomic custom structure' .............................................. OK in 0.59 sec mbedgt: test case summary: 27 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-error_handling' .............................................. OK in 32.35 sec test case: 'Test error context capture' ...................................................... OK in 0.06 sec test case: 'Test error counting and reset' ................................................... OK in 0.05 sec test case: 'Test error encoding, value capture, first and last errors' ....................... OK in 0.09 sec test case: 'Test error hook' ................................................................. OK in 0.04 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-filehandle' .................................................. OK in 40.09 sec test case: 'Test fopen/fclose' ............................................................... OK in 0.04 sec test case: 'Test fprintf/fscanf' ............................................................. OK in 0.04 sec test case: 'Test fputc/fgetc' ................................................................ OK in 0.04 sec test case: 'Test fputs/fgets' ................................................................ OK in 0.05 sec test case: 'Test fseek/ftell' ................................................................ OK in 0.05 sec test case: 'Test ftruncate/fstat' ............................................................ OK in 0.06 sec test case: 'Test fwrite/fread' ............................................................... OK in 0.05 sec mbedgt: test case summary: 7 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-sharedptr' ................................................... OK in 26.52 sec test case: 'Test equality comparators' ....................................................... OK in 0.05 sec test case: 'Test instance sharing across multiple shared pointers' ........................... OK in 0.08 sec test case: 'Test single shared pointer instance' ............................................. OK in 0.07 sec mbedgt: test case summary: 3 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-minimal-printf' .............................................. OK in 31.28 sec test case: 'printf %d' ....................................................................... OK in 0.62 sec test case: 'printf %u' ....................................................................... OK in 0.47 sec test case: 'printf %x' ....................................................................... OK in 0.48 sec test case: 'snprintf %d' ..................................................................... OK in 0.13 sec test case: 'snprintf %u' ..................................................................... OK in 0.13 sec test case: 'snprintf %x' ..................................................................... OK in 0.13 sec test case: 'snprintf buffer overflow %d' ..................................................... OK in 0.05 sec test case: 'snprintf buffer overflow %ld' .................................................... OK in 0.05 sec test case: 'snprintf buffer overflow %lld' ................................................... OK in 0.06 sec test case: 'snprintf buffer overflow %llu' ................................................... OK in 0.06 sec test case: 'snprintf buffer overflow %llx' ................................................... OK in 0.06 sec test case: 'snprintf buffer overflow %lu' .................................................... OK in 0.05 sec test case: 'snprintf buffer overflow %lx' .................................................... OK in 0.05 sec test case: 'snprintf buffer overflow %u' ..................................................... OK in 0.06 sec test case: 'snprintf buffer overflow %x' ..................................................... OK in 0.06 sec mbedgt: test case summary: 15 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-singletonptr' ................................................ OK in 26.00 sec test case: 'Test lazy initialization' ........................................................ OK in 0.05 sec test case: 'Test single instance' ............................................................ OK in 0.04 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-stream' ...................................................... OK in 27.03 sec test case: 'Test printf/scanf' ............................................................... OK in 0.05 sec test case: 'Test putc/getc' .................................................................. OK in 0.05 sec test case: 'Test puts/gets' .................................................................. OK in 0.05 sec test case: 'Test vprintf/vscanf' ............................................................. OK in 0.06 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-mbed_platform-system_reset test case: tests-mbed_platform-system_reset mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-system_reset' ................................................ OK in 43.05 sec test case: 'tests-mbed_platform-system_reset' ................................................ OK in 43.05 sec mbedgt: test case summary: 1 pass, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-transaction' ................................................. OK in 26.72 sec test case: 'Test Transaction - init ' ................................................ OK in 0.06 sec test case: 'Test Transaction - init ' ................................................. OK in 0.06 sec test case: 'Test Transaction - no init ' ............................................. OK in 0.07 sec test case: 'Test Transaction - no init ' .............................................. OK in 0.07 sec mbedgt: test case summary: 4 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-mbed_platform-wait_ns' ..................................................... OK in 28.05 sec test case: 'Test: wait_ns - compare with lp_timer 1s' ........................................ OK in 0.93 sec test case: 'Test: wait_ns - compare with us_timer 1s' ........................................ OK in 0.93 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-network-l3ip' .............................................................. OK in 25.97 sec test case: 'L3IP_START' ...................................................................... OK in 0.05 sec test case: 'L3IP_STOP' ....................................................................... OK in 0.06 sec mbedgt: test case summary: 2 passes, 0 failures mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/usb_device/hid/hid.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-usb_device-hid' ............................................................ ERROR in 39.15 sec test case: 'Configuration descriptor, generic' ............................................... ERROR in 0.00 sec test case: 'Configuration descriptor, keyboard' .............................................. SKIPPED in 0.00 sec test case: 'Configuration descriptor, mouse' ................................................. SKIPPED in 0.00 sec test case: 'HID class descriptors, generic' .................................................. SKIPPED in 0.00 sec test case: 'HID class descriptors, keyboard' ................................................. SKIPPED in 0.00 sec test case: 'HID class descriptors, mouse' .................................................... SKIPPED in 0.00 sec test case: 'Raw input/output, 1-byte reports' ................................................ SKIPPED in 0.00 sec test case: 'Raw input/output, 20-byte reports' ............................................... SKIPPED in 0.00 sec test case: 'Raw input/output, 64-byte reports' ............................................... SKIPPED in 0.00 sec mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/usb_device/basic/basic.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-usb_device-basic' .......................................................... FAIL in 219.41 sec test case: 'endpoint test abort' ............................................................. SKIPPED in 0.00 sec test case: 'endpoint test data correctness' .................................................. SKIPPED in 0.00 sec test case: 'endpoint test data toggle reset' ................................................. SKIPPED in 0.00 sec test case: 'endpoint test halt' .............................................................. SKIPPED in 0.00 sec test case: 'endpoint test parallel transfers' ................................................ SKIPPED in 0.00 sec test case: 'endpoint test parallel transfers ctrl' ........................................... SKIPPED in 0.00 sec test case: 'usb control basic test' .......................................................... ERROR in 0.00 sec test case: 'usb control sizes test' .......................................................... SKIPPED in 0.00 sec test case: 'usb control stall test' .......................................................... SKIPPED in 0.00 sec test case: 'usb control stress test' ......................................................... SKIPPED in 0.00 sec test case: 'usb device reset test' ........................................................... SKIPPED in 0.00 sec test case: 'usb repeated construction destruction test' ...................................... SKIPPED in 0.00 sec test case: 'usb soft reconnection test' ...................................................... SKIPPED in 0.00 sec mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/usb_device/msd/msd.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test case summary event not found no test case report present, assuming test suite to be a single test case! test suite: tests-usb_device-msd test case: tests-usb_device-msd mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-usb_device-msd' ............................................................ ERROR in 40.69 sec test case: 'tests-usb_device-msd' ............................................................ ERROR in 40.69 sec mbedgt: test case summary: 0 passes, 1 failure mbedgt: mbed-host-test-runner: started mbedgt: retry mbedhtrun 1/1 mbedgt: ['mbedhtrun', '-m', 'CY8CKIT_064S2_4343W', '-p', 'COM77:9600', '-f', '"o3/CY8CKIT_064S2_4343W/TESTS/usb_device/serial/serial.hex"', '-e', '"TESTS\\host_tests"', '-d', 'E:', '-c', 'default', '-t', '190A13016c161909036c161900000000000000002e127069', '-r', 'default', '-C', '10', '-R', '5', '--sync', '5', '-P', '60'] failed after 1 count mbedgt: checking for GCOV data... mbedgt: test on hardware with target id: 190A13016c161909036c161900000000000000002e127069 mbedgt: test suite 'tests-usb_device-serial' ......................................................... TIMEOUT in 79.75 sec test case: 'CDC RX multiple bytes' ........................................................... SKIPPED in 0.00 sec test case: 'CDC RX multiple bytes concurrent' ................................................ SKIPPED in 0.00 sec test case: 'CDC RX single bytes' ............................................................. SKIPPED in 0.00 sec test case: 'CDC RX single bytes concurrent' .................................................. SKIPPED in 0.00 sec test case: 'CDC USB reconnect' ............................................................... ERROR in 0.00 sec test case: 'CDC loopback' .................................................................... SKIPPED in 0.00 sec test case: 'Serial USB reconnect' ............................................................ SKIPPED in 0.00 sec test case: 'Serial getc' ..................................................................... SKIPPED in 0.00 sec test case: 'Serial line coding change' ....................................................... SKIPPED in 0.00 sec test case: 'Serial printf/scanf' ............................................................. SKIPPED in 0.00 sec test case: 'Serial terminal reopen' .......................................................... SKIPPED in 0.00 sec mbedgt: all tests finished! mbedgt: shuffle seed: 0.8152093411 mbedgt: test suite report: | target | platform_name | test suite | result | elapsed_time (sec) | copy_method | |-------------------------|---------------------|----------------------------------------------|---------|--------------------|-------------| | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | OK | 35.4 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-timing | OK | 88.72 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | OK | 41.02 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | OK | 38.27 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-dev_null | OK | 35.07 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-echo | OK | 27.62 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | OK | 27.58 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-generic_tests | OK | 26.52 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | OK | 36.14 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | OK | 71.62 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | OK | 33.26 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-race_test | OK | 31.39 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | OK | 49.65 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-sleep_lock | OK | 33.14 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-stl_features | OK | 27.3 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | OK | 50.74 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | OK | 64.52 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | OK | 36.91 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | OK | 27.53 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | TIMEOUT | 70.67 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog_reset | TIMEOUT | 116.48 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | OK | 29.91 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | OK | 40.86 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | OK | 27.99 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-functionpointer | OK | 33.91 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | OK | 31.25 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers_freq | OK | 45.84 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | OK | 27.92 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-critical_section | OK | 26.14 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | OK | 27.39 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-gpio | OK | 25.66 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-lp_ticker | OK | 34.98 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-minimum_requirements | OK | 26.62 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-pinmap | OK | 34.61 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | OK | 76.75 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_reset | OK | 30.97 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | OK | 30.26 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time_conv | OK | 45.85 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep | FAIL | 28.41 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager | FAIL | 26.93 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager_racecondition | OK | 38.82 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-stack_size_unification | OK | 25.71 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | OK | 45.89 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-trng | OK | 32.16 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-us_ticker | OK | 29.1 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | TIMEOUT | 76.79 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_reset | TIMEOUT | 116.59 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_timing | OK | 69.48 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | OK | 36.29 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | OK | 32.41 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | OK | 27.83 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-error_handling | OK | 32.35 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | OK | 40.09 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | OK | 31.28 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-sharedptr | OK | 26.52 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-singletonptr | OK | 26.0 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-stream | OK | 27.03 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-system_reset | OK | 43.05 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-transaction | OK | 26.72 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-wait_ns | OK | 28.05 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | OK | 39.92 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-call_before_main | OK | 25.22 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-cpp | OK | 25.34 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-div | OK | 25.24 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-static_assert | OK | 25.62 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-basic | OK | 40.66 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-condition_variable | OK | 26.29 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | OK | 32.12 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-heap_and_stack | OK | 31.16 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-kernel_tick_count | OK | 28.18 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | OK | 30.67 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | OK | 47.62 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | OK | 34.21 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | OK | 30.28 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | OK | 29.1 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | OK | 28.09 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | OK | 30.59 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | OK | 32.51 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | OK | 30.53 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | OK | 47.0 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-multi | OK | 28.15 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-selftest | OK | 33.06 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-network-l3ip | OK | 25.97 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | FAIL | 219.41 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | ERROR | 39.15 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-msd | ERROR | 40.69 | default | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | TIMEOUT | 79.75 | default | mbedgt: test suite results: 77 OK / 5 TIMEOUT / 3 FAIL / 2 ERROR mbedgt: test case report: | target | platform_name | test suite | test case | passed | failed | result | elapsed_time (sec) | |-------------------------|---------------------|----------------------------------------------|---------------------------------------------------------------------------------------------------|--------|--------|---------|--------------------| | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing allocate failure | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing call_every | 1 | 0 | OK | 1.89 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing call_in | 1 | 0 | OK | 1.89 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 0 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 1 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 2 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 3 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 4 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing calls with 5 args | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing event cancel 1 | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing mixed dynamic & static events queue | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing static events queue | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing the event class | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing the event class helpers | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing the event inference | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-queue | Testing time_left | 1 | 0 | OK | 0.22 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-timing | Testing accuracy of equeue semaphore | 1 | 0 | OK | 19.76 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-timing | Testing accuracy of equeue tick | 1 | 0 | OK | 19.76 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-events-timing | Testing accuracy of timer | 1 | 0 | OK | 19.75 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %e %E float formatting | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %f %f float formatting | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %g %g float formatting | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %i %d integer formatting | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %u %d integer formatting | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: %x %E integer formatting | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: strpbrk | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-c_strings | C strings: strtok | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | Test SD CRC polynomials | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | Test not supported polynomials | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | Test partial CRC | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | Test supported polynomials | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-crc | Test thread safety | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-dev_null | tests-mbed_drivers-dev_null | 1 | 0 | OK | 35.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-echo | Echo server: x16 | 1 | 0 | OK | 1.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | FlashIAP - init | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | FlashIAP - program | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | FlashIAP - program across sectors | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | FlashIAP - program errors | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-flashiap | FlashIAP - timing | 1 | 0 | OK | 0.29 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-generic_tests | Basic | 1 | 0 | OK | 0.02 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-generic_tests | Blinky | 1 | 0 | OK | 0.03 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-generic_tests | C++ heap | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-generic_tests | C++ stack | 1 | 0 | OK | 0.15 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach for 0.001s and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach for 0.01s and time measure | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach for 0.1s and time measure | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach for 0.5s and time measure | 1 | 0 | OK | 0.44 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach_us for 100ms and time measure | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach_us for 10ms and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach_us for 1ms and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test attach_us for 500ms and time measure | 1 | 0 | OK | 0.44 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test detach | 1 | 0 | OK | 0.59 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test multi call and time measure | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_ticker | Test multi ticker | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay accuracy (attach) | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay accuracy (attach_us) | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay during deepsleep (attach) | 1 | 0 | OK | 0.94 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay during deepsleep (attach_us) | 1 | 0 | OK | 0.96 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay during sleep (attach) | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 1 s delay during sleep (attach_us) | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 10 ms delay accuracy (attach) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 10 ms delay accuracy (attach_us) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 5 s delay accuracy (attach) | 1 | 0 | OK | 4.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | 5 s delay accuracy (attach_us) | 1 | 0 | OK | 4.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback called once (attach) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback called once (attach_us) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback not called when cancelled (attach) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback not called when cancelled (attach_us) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback override (attach) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Callback override (attach_us) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Multiple timeouts running in parallel (attach) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Multiple timeouts running in parallel (attach_us) | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Timing drift (attach) | 1 | 0 | OK | 9.55 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Timing drift (attach_us) | 1 | 0 | OK | 10.28 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Zero delay (attach) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timeout | Zero delay (attach_us) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - float operator. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - measure time accumulation. | 1 | 0 | OK | 1.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - reset. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - start started timer. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - stopped after creation. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 1 ms. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 1 s. | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 10 ms. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-lp_timer | Test: LowPowerTimer - time measurement 100 ms. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-race_test | class init race | 1 | 0 | OK | 0.51 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-race_test | function init race | 1 | 0 | OK | 0.41 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Functional Test: RTC counts seconds. | 1 | 0 | OK | 9.83 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_0. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_1. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Functional Test: set time - CUSTOM_TIME_2. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: attach original RTC functions. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: attach stub RTC functions. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: set_time() - RTC functions are defined. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: set_time() - init RTC function is undefined. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: set_time() - write RTC function is undefined. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: time() - RTC functions are defined, RTC is disabled. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: time() - RTC functions are defined, RTC is enabled. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: time() - isenabled RTC function is undefined. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: time() - read RTC function is undefined. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-rtc | Unit Test: time() - result is stored in given buffer. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-sleep_lock | DeepSleepLock lock test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-sleep_lock | timer lock test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-stl_features | STL std::equal | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-stl_features | STL std::sort abs | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-stl_features | STL std::sort greater | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-stl_features | STL std::transform | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach for 0.01s and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach for 0.1s and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach for 0.5s and time measure | 1 | 0 | OK | 0.44 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach_us for 100ms and time measure | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach_us for 10ms and time measure | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test attach_us for 500ms and time measure | 1 | 0 | OK | 0.44 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test detach | 1 | 0 | OK | 0.6 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test multi call and time measure | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test multi ticker | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test timers: 1x ticker | 1 | 0 | OK | 9.4 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-ticker | Test timers: 2x ticker | 1 | 0 | OK | 10.22 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 1 s delay accuracy (attach) | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 1 s delay accuracy (attach_us) | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 1 s delay during sleep (attach) | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 1 s delay during sleep (attach_us) | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 10 ms delay accuracy (attach) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 10 ms delay accuracy (attach_us) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 5 s delay accuracy (attach) | 1 | 0 | OK | 4.88 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | 5 s delay accuracy (attach_us) | 1 | 0 | OK | 4.89 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback called once (attach) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback called once (attach_us) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback not called when cancelled (attach) | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback not called when cancelled (attach_us) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback override (attach) | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Callback override (attach_us) | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Multiple timeouts running in parallel (attach) | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Multiple timeouts running in parallel (attach_us) | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Timing drift (attach) | 1 | 0 | OK | 9.4 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Timing drift (attach_us) | 1 | 0 | OK | 10.36 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Zero delay (attach) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timeout | Zero delay (attach_us) | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on os ticker) - float operator. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on os ticker) - measured time accumulation. | 1 | 0 | OK | 1.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on os ticker) - reset. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on os ticker) - start started timer. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on os ticker) is stopped after creation. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on user ticker) - float operator. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on user ticker) - reset. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on user ticker) - start started timer. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on user ticker) is stopped after creation. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer (based on user ticker) measured time accumulation. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer - time measurement 1 ms. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer - time measurement 1 s. | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer - time measurement 10 ms. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timer | Test: Timer - time measurement 100 ms. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test insert | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test insert timestamp from the past | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test insert_absolute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test insert_absolute timestamp from the past | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test insert_absolute zero | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test remove after insert | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-timerevent | Test remove after insert_absolute | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | Restart multiple times | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | Start, 100 ms | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | Start, max_timeout | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | Stop | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog | max_timeout is valid | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog_reset | Kicking the Watchdog prevents reset | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog_reset | Watchdog reset | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog_reset | Watchdog reset in sleep mode | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_drivers-watchdog_reset | Watchdog started again | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 0 ints | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 1 ints | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 2 ints | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 3 ints | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 4 ints | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback | Testing callbacks with 5 ints | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 0 uint64s | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 1 uint64s | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 2 uint64s | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 3 uint64s | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 4 uint64s | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_big | Testing callbacks with 5 uint64s | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 0 uchars | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 1 uchars | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 2 uchars | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 3 uchars | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 4 uchars | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-callback_small | Testing callbacks with 5 uchars | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-functionpointer | Testing FunctionPointer compatibility | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_functional-functionpointer | Testing FunctionPointerArg1 compatibility | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker fire interrupt | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker increment test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker info test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker init is safe to call repeatedly | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker interrupt test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker overflow test | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker past interrupt test | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker reschedule test | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | Microsecond ticker speed test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker fire interrupt | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker increment test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker info test | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker init is safe to call repeatedly | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker interrupt test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker overflow test | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker past interrupt test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker reschedule test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers | lp ticker speed test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers_freq | Low power ticker frequency test | 1 | 0 | OK | 10.29 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-common_tickers_freq | Microsecond ticker frequency test | 1 | 0 | OK | 9.41 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: CRC calculation - multi input. | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: CRC calculation - single input. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: hal_crc_compute_partial() - invalid parameters. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: hal_crc_is_supported() - invalid parameter. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: re-configure without getting the result. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-crc | test: supported polynomials. | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-critical_section | Test critical section nested lock | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-critical_section | Test critical section single lock | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | Flash - clock and cache test | 1 | 0 | OK | 0.21 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | Flash - erase sector | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | Flash - init | 1 | 0 | OK | 0.21 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | Flash - mapping alignment | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-flash | Flash - program page | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-gpio | gpio NC test | 1 | 0 | OK | 0.03 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-lp_ticker | lp ticker glitch test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-lp_ticker | lp ticker info test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-lp_ticker | lp ticker sleep test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-minimum_requirements | Minimum data test | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-minimum_requirements | Minimum heap test | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-pinmap | pinmap - validation | 1 | 0 | OK | 0.78 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - accuracy | 1 | 0 | OK | 9.9 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - enabled | 1 | 0 | OK | 0.03 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - glitch | 1 | 0 | OK | 3.9 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - init | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - persist | 1 | 0 | OK | 3.88 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - range | 1 | 0 | OK | 15.76 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - sleep | 1 | 0 | OK | 7.94 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc | RTC - write/read | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_reset | tests-mbed_hal-rtc_reset | 1 | 0 | OK | 30.97 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test is leap year - RTC leap years full support | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test is leap year - RTC leap years partial support | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test local time - invalid param | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test make time - invalid param | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test make time boundary values - RTC leap years full support | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test make time boundary values - RTC leap years partial support | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time | test set_time twice | 1 | 0 | OK | 1.9 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time_conv | test make time and local time - RTC leap years full support | 1 | 0 | OK | 9.27 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-rtc_time_conv | test make time and local time - RTC leap years partial support | 1 | 0 | OK | 9.24 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep | deep-sleep - high-speed clocks are turned off | 0 | 1 | FAIL | 0.18 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep | deep-sleep - source of wake-up - lp ticker | 0 | 9 | FAIL | 1.45 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep | sleep - source of wake-up - us ticker | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager | deep sleep lock/unlock | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager | deep sleep lock/unlock test_check | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager | deep sleep locked USHRT_MAX times | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager | sleep_auto calls sleep/deep sleep based on lock | 0 | 1 | FAIL | 0.13 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager_racecondition | deep sleep lock/unlock is IRQ safe | 1 | 0 | OK | 9.85 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-sleep_manager_racecondition | deep sleep lock/unlock is thread safe | 1 | 0 | OK | 2.43 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-stack_size_unification | Stack size unification test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event head | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event in overflow range | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event multiple overflow | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event outside overflow range | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event overflow | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | legacy insert event tail | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_frequencies_and_masks | 1 | 0 | OK | 1.35 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_head | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_in_overflow_range | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_multiple_random | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_outside_overflow_range | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_tail | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_insert_event_us_underflow | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_insert_immediate_in_irq | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_insert_non_immediate_in_irq | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_multiple_event_multiple_dequeue | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_multiple_event_single_dequeue | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_multiple_event_single_dequeue_overflow | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_single_event | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_irq_handler_single_event_spurious | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_legacy_insert_event_multiple_random | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_match_interval_passed | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_match_interval_passed_table | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_remove_event_head | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_remove_event_invalid | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_remove_event_tail | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_remove_random | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_set_interrupt_past_time | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_set_interrupt_past_time_with_delay | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_suspend_resume | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | test_ticker_max_value | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | ticker initialization | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | ticker multiple initialization | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | ticker read | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | ticker read overflow | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | update overflow guard | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-ticker | update overflow guard in case of spurious interrupt | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-trng | TRNG: trng_test | 1 | 0 | OK | 0.19 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-us_ticker | us ticker info test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Init, 100 ms | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Init, max_timeout | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Platform feature max_timeout is valid | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Stopped watchdog can be started again | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Update config with multiple init calls | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog | Watchdog can be stopped | 1 | 0 | OK | 0.12 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_reset | Kicking the Watchdog prevents reset | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_reset | Watchdog reset | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_reset | Watchdog reset in sleep mode | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_reset | Watchdog started again | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_timing | Timing, 1000 ms | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_timing | Timing, 200 ms | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_timing | Timing, 3000 ms | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_hal-watchdog_timing | Timing, 500 ms | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add 16-bit | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add 32-bit | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add 64-bit | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add 8-bit | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add release 32-bit | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add signed 16-bit | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add signed 32-bit | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add signed 64-bit | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic add signed 8-bit | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic bitops 16-bit | 1 | 0 | OK | 0.16 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic bitops 32-bit | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic bitops 64-bit | 1 | 0 | OK | 0.15 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic bitops 8-bit | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange strong 16-bit | 1 | 0 | OK | 0.16 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange strong 32-bit | 1 | 0 | OK | 0.17 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange strong 64-bit | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange strong 8-bit | 1 | 0 | OK | 0.16 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange weak 16-bit | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange weak 32-bit | 1 | 0 | OK | 0.15 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange weak 64-bit | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic compare exchange weak 8-bit | 1 | 0 | OK | 0.15 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic sub 16-bit | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic sub 32-bit | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic sub 64-bit | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test atomic sub 8-bit | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test large atomic custom structure | 1 | 0 | OK | 0.25 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-atomic | Test small atomic custom structure | 1 | 0 | OK | 0.59 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input does not exceed capacity(1) push max, pop max. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input does not exceed capacity(10) push 2, pop 1. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input does not exceed capacity(3) push max, pop max. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input does not exceed capacity(5) push 2, pop 1. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input exceeds capacity(1) push max+1, pop max. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input exceeds capacity(10) push 2, pop 1. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input exceeds capacity(3) push max+1, pop max. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input exceeds capacity(5) push 2, pop 1 - complex type. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Input exceeds capacity(5) push 2, pop 1. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Test CounterType/BufferSize boarder case. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | Test pop(), peek(), empty(), full(), size() after CircularBuffer creation. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | empty() returns true when buffer(3 elements) is empty. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | empty() returns true when buffer(5 elements) is empty. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | full() returns true when buffer(3 elements) is full. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | full() returns true when buffer(5 elements) is full. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | peek() return data without popping the element. | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-circularbuffer | reset() clears the buffer. | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C API | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C API nested lock | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C++ API constructor/destructor | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C++ API constructor/destructor nested lock | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C++ API enable/disable | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-critical_section | Test critical section C++ API enable/disable nested lock | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-error_handling | Test error context capture | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-error_handling | Test error counting and reset | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-error_handling | Test error encoding, value capture, first and last errors | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-error_handling | Test error hook | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fopen/fclose | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fprintf/fscanf | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fputc/fgetc | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fputs/fgets | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fseek/ftell | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test ftruncate/fstat | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-filehandle | Test fwrite/fread | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | printf %d | 1 | 0 | OK | 0.62 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | printf %u | 1 | 0 | OK | 0.47 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | printf %x | 1 | 0 | OK | 0.48 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf %d | 1 | 0 | OK | 0.13 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf %u | 1 | 0 | OK | 0.13 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf %x | 1 | 0 | OK | 0.13 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %d | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %ld | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %lld | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %llu | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %llx | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %lu | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %lx | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %u | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-minimal-printf | snprintf buffer overflow %x | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-sharedptr | Test equality comparators | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-sharedptr | Test instance sharing across multiple shared pointers | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-sharedptr | Test single shared pointer instance | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-singletonptr | Test lazy initialization | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-singletonptr | Test single instance | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-stream | Test printf/scanf | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-stream | Test putc/getc | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-stream | Test puts/gets | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-stream | Test vprintf/vscanf | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-system_reset | tests-mbed_platform-system_reset | 1 | 0 | OK | 43.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-transaction | Test Transaction - init | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-transaction | Test Transaction - init | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-transaction | Test Transaction - no init | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-transaction | Test Transaction - no init | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-wait_ns | Test: wait_ns - compare with lp_timer 1s | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbed_platform-wait_ns | Test: wait_ns - compare with us_timer 1s | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing ALIGN attribute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing DEPRECATED attribute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing FORCEINLINE attribute | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing NORETURN attribute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing PACKED attribute | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing PURE attribute | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing UNREACHABLE attribute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing UNUSED attribute | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-attributes | Testing WEAK attribute | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-call_before_main | tests-mbedmicro-mbed-call_before_main | 1 | 0 | OK | 25.22 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-cpp | tests-mbedmicro-mbed-cpp | 1 | 0 | OK | 25.34 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-div | tests-mbedmicro-mbed-div | 1 | 0 | OK | 25.24 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-mbed-static_assert | Compilation test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-basic | Test ThisThread::sleep_for accuracy | 1 | 0 | OK | 10.2 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-condition_variable | Test linked list | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-condition_variable | Test notify all | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-condition_variable | Test notify one | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test clear/set with prohibited flag | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test empty clear | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test empty get | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test empty set | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test multi-threaded wait_all | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test multi-threaded wait_all many wait | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test multi-threaded wait_any | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test multi-threaded wait_any no clear | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test multi-threaded wait_any timeout | 1 | 0 | OK | 0.24 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-event_flags | Test set/get/clear for full flag range | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-heap_and_stack | Test heap allocation and free | 1 | 0 | OK | 0.14 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-heap_and_stack | Test heap in range | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-heap_and_stack | Test isr stack in range | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-heap_and_stack | Test main stack in range | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-kernel_tick_count | Test if kernel ticker increments by one | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-kernel_tick_count | Test if kernel ticker interval is 1ms | 1 | 0 | OK | 0.93 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-kernel_tick_count | Test kernel ticker frequency | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test calloc | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test get with timeout on empty mailbox | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test get without timeout on empty mailbox | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test invalid message free | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test mail empty | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test mail full | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test mailbox max size | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message send order | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message send/receive multi-thread and per thread order | 1 | 0 | OK | 0.25 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message send/receive multi-thread, multi-Mail and per thread order | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message send/receive single thread and order | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message type uint16 | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message type uint32 | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test message type uint8 | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mail | Test null message free | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | Test 0 size allocation | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | Test NULL pointer free | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | Test large allocation | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | Test multiple alloc and free calls | 1 | 0 | OK | 0.94 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-malloc | Test multithreaded allocations | 1 | 0 | OK | 19.75 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, 1 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, 1 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, 4 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, 4 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, complex b_type, q_size equal to 1. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: alloc()/calloc() - success, complex b_type, q_size equal to 3. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: fail (out of free blocks). | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - robust (free called with invalid param - NULL). | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - robust (free called with invalid param). | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - success, 4 bytes b_type, q_size equal to 1. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - success, 4 bytes b_type, q_size equal to 3. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - success, complex b_type, q_size equal to 1. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: free() - success, complex b_type, q_size equal to 3. | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: re-allocation of the first block, basic type. | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: re-allocation of the first block, complex type. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: re-allocation of the last block, basic type. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: re-allocation of the last block, complex type. | 1 | 0 | OK | 0.09 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-memorypool | Test: wait forever | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test dual thread lock locked | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test dual thread lock unlock | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test dual thread second thread lock | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test dual thread second thread trylock | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test dual thread trylock locked | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test multiple thread | 1 | 0 | OK | 1.94 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test single thread lock | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test single thread lock recursive | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-mutex | Test single thread trylock | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test get empty wait forever | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test get from empty queue no timeout | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test get from empty queue timeout | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test message ordering | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test message priority | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test pass ptr msg | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test pass uint msg | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test pass uint msg twice | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test put full no timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test put full timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test put full wait forever | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test queue empty | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-queue | Test queue full | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | One-shot not restarted when elapsed | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Periodic repeats continuously | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Restart changes timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Stopped timer can be started again | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Timer can be stopped | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Timer is created in stopped state | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-rtostimer | Timer started with infinite delay | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test 0 tokens no timeout | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test 1 token no timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test multiple threads | 1 | 0 | OK | 3.17 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test multiple tokens release | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test multiple tokens wait | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test single thread | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-semaphore | Test timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate all signals clear in one shot | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate all signals set in one shot | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate all signals set one by one in loop | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate if any signals are set on just created thread | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate if setting same signal twice cause any unwanted behaviour | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate if signal_wait accumulate signals and return correctly when all signals set | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate if signal_wait return correctly when all signals set | 1 | 0 | OK | 0.1 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate signal_wait return status if timeout specified: 0[ms] all signals | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate signal_wait return status if timeout specified: 0[ms] no signals | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate signal_wait return status if timeout specified: 1[ms] all signals | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate signal_wait return status if timeout specified: 1[ms] no signals | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate that call of signal_wait return correctly when thread has all signals already set | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate that call signal_clr(NO_SIGNALS) doesn't change thread signals and return actual signals | 1 | 0 | OK | 0.13 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-signals | Validate that call signal_set with prohibited signal doesn't change thread signals | 1 | 0 | OK | 0.11 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Handler called twice | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Tick can be cancelled | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Tick count is updated correctly | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Tick count is zero upon creation | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Time is updated correctly | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Wake up from deep sleep | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-systimer | Wake up from sleep | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing parallel threads | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing parallel threads with child | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing parallel threads with murder | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing parallel threads with wait | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing parallel threads with yield | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing serial threads | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing serial threads with child | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing serial threads with murder | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing serial threads with wait | 1 | 0 | OK | 0.92 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing serial threads with yield | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing single thread | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing single thread with child | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing single thread with murder | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing single thread with wait | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing single thread with yield | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: flags clear | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: multi-bit all | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: multi-bit all timeout | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: multi-bit any | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: timeout | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread flags: wait | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread name | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread priority ops | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread self terminate | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread stack info | 1 | 0 | OK | 0.04 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: deleted | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait delay | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait event flag | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait message get | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait message put | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait mutex | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait semaphore | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread states: wait thread flags | 1 | 0 | OK | 0.08 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread wait | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedmicro-rtos-mbed-threads | Testing thread with external stack memory | 1 | 0 | OK | 0.07 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-multi | Crypto: sha256_multi | 1 | 0 | OK | 0.8 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-multi | Crypto: sha256_split | 1 | 0 | OK | 0.28 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-selftest | mbedtls_entropy_self_test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-selftest | mbedtls_sha256_self_test | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-mbedtls-selftest | mbedtls_sha512_self_test | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-network-l3ip | L3IP_START | 1 | 0 | OK | 0.05 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-network-l3ip | L3IP_STOP | 1 | 0 | OK | 0.06 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test abort | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test data correctness | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test data toggle reset | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test halt | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test parallel transfers | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | endpoint test parallel transfers ctrl | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb control basic test | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb control sizes test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb control stall test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb control stress test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb device reset test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb repeated construction destruction test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-basic | usb soft reconnection test | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Configuration descriptor, generic | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Configuration descriptor, keyboard | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Configuration descriptor, mouse | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | HID class descriptors, generic | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | HID class descriptors, keyboard | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | HID class descriptors, mouse | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Raw input/output, 1-byte reports | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Raw input/output, 20-byte reports | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-hid | Raw input/output, 64-byte reports | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-msd | tests-usb_device-msd | 0 | 1 | ERROR | 40.69 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC RX multiple bytes | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC RX multiple bytes concurrent | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC RX single bytes | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC RX single bytes concurrent | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC USB reconnect | 0 | 0 | ERROR | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | CDC loopback | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | Serial USB reconnect | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | Serial getc | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | Serial line coding change | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | Serial printf/scanf | 0 | 0 | SKIPPED | 0.0 | | CY8CKIT_064S2_4343W-IAR | CY8CKIT_064S2_4343W | tests-usb_device-serial | Serial terminal reopen | 0 | 0 | SKIPPED | 0.0 | mbedgt: test case results: 557 OK / 8 ERROR / 39 SKIPPED / 3 FAIL mbedgt: completed in 3542.08 sec mbedgt: exited with code 10