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Increase L0 ADC sample time #4641

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merged 1 commit into from Jun 29, 2017

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@LMESTM
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LMESTM commented Jun 27, 2017

Description

With default sampling time, the MBED2 and CI test shield tests would fail
because the stabilization slope of ADC is relatively slow.
ERROR (out:0.8000) - (in:0.7407) = (0.0593)
ERROR (out:0.9000) - (in:0.8354) = (0.0646)
ERROR (out:1.0000) - (in:0.9289) = (0.0711)

This is related to the 10kOhms resistors used to connect Ain to
Aout mounted on the CI shileds, and internal capacitance of L0 targets.
If connecting Ain and Aout with wires, bypassing the resistors, the test
is passed. So we're increasing the sampling time to let the automated
ci shiled tests PASS.

OK (out:0.8000) - (in:0.7863) = (0.0137)
OK (out:0.9000) - (in:0.8869) = (0.0131)
OK (out:1.0000) - (in:0.9844) = (0.0156)

Notes:

  • Pull requests will not be accepted until the submitter has agreed to the contributer agreement.
  • This is just a template, so feel free to use/remove the unnecessary things

Status

READY/IN DEVELOPMENT/HOLD

Tests results

image

Increase L0 ADC sample time
With default sampling time, the MBED2 and CI test shield tests would fail
because the stabilization slope of ADC is relatively slow.
ERROR (out:0.8000) - (in:0.7407) = (0.0593)
ERROR (out:0.9000) - (in:0.8354) = (0.0646)
ERROR (out:1.0000) - (in:0.9289) = (0.0711)

This is related to the 10kOhms resistors used to connect Ain to
Aout mounted on the CI shileds, and internal capacitance of L0 targets.
If connecting Ain and Aout with wires, bypassing the resistors, the test
is passed. So we're increasing the sampling time to let the automated
ci shiled tests PASS.

OK    (out:0.8000) - (in:0.7863) = (0.0137)
OK    (out:0.9000) - (in:0.8869) = (0.0131)
OK    (out:1.0000) - (in:0.9844) = (0.0156)
@0xc0170

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0xc0170 commented Jun 27, 2017

This is related to the 10kOhms resistors used to connect Ain to
Aout mounted on the CI shileds, and internal capacitance of L0 targets.
If connecting Ain and Aout with wires, bypassing the resistors, the test
is passed. So we're increasing the sampling time to let the automated
ci shiled tests PASS.

Is this regular use case, that we are considering here?

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LMESTM commented Jun 27, 2017

Is this regular use case, that we are considering here?

I am not sure about what a regular case actually is - there are probably hundreds of different cases out there, so using the sampling time of about 1 to 2 µs should not hurt.

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0xc0170 commented Jun 27, 2017

I understand now better. Thanks for the info. Iwas not certain how long are those <200 cycles (the change here), as the above description sounded like this fix is only because of CI test shield, it is more general.

LGTM

@0xc0170 0xc0170 added the needs: CI label Jun 27, 2017

@theotherjimmy

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theotherjimmy commented Jun 28, 2017

/morph test

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mbed-bot commented Jun 28, 2017

Result: SUCCESS

Your command has finished executing! Here's what you wrote!

/morph test

Output

mbed Build Number: 680

All builds and test passed!

@0xc0170 0xc0170 added ready for merge and removed needs: CI labels Jun 29, 2017

@theotherjimmy theotherjimmy merged commit 0c5fc5b into ARMmbed:master Jun 29, 2017

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