An OpenSource Boundary Scan Test System (JTAG / IEEE1149.x)
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README.md

M-1

An OpenSource Boundary Scan Test System (JTAG / IEEE1149.x) for:

  • design checking
  • low level hardware testing and repairing
  • detection of opens, shorts, misloaded parts
  • bring-up of prototypes and systems
  • system testing in the field

Test Pattern Generators and UUT datastructures open for:

  • In-Circuit and Flying Probe Test
  • optical inspection (AOI/AXI)
  • customer specific requirements and extensions

Special Features:

  • runs natively on Linux
  • source code written in Ada (for mission critical applications)
  • rugged boundary scan controller hardware

Find more colorful details at: http://www.blunk-electronic.de/products.html

WE LOOK FORWARD TO WORK WITH YOU !