Optimize sparse bitmap operations (set, test and clear) with mostly consecutive values [CORE1070]

[firebird-issue-importer]

Submitted by: @hvlad

SparseBitmap::set, test and clear spend most it's run time in relatively costly BePlusTree::locate method.
As bunch of bits reside on the same BePlusTree node we can avoid unnecessary call's to BePlusTree::locate when many SparseBitmap operations done with consecutive values. It often happens when we do an index scan as key duplicates now sorted by record numbers

Commits: 2b771cc

[firebird-issue-importer]

Modified by: @hvlad

status: Open [ 1 ] => Resolved [ 5 ]

resolution: Fixed [ 1 ]

Fix Version: 2.1 [ 10041 ]

[firebird-issue-importer]

Modified by: @pcisar

status: Resolved [ 5 ] => Closed [ 6 ]

[firebird-issue-importer]

Commented by: @pcisar

Reopened to update ticket information.

[firebird-issue-importer]

Modified by: @pcisar

status: Closed [ 6 ] => Reopened [ 4 ]

resolution: Fixed [ 1 ] =>

[firebird-issue-importer]

Modified by: @pcisar

Fix Version: 2.1 Alpha 1 [ 10150 ]

Fix Version: 2.1.0 [ 10041 ] =>

[firebird-issue-importer]

Modified by: @pcisar

status: Reopened [ 4 ] => Closed [ 6 ]

resolution: Fixed [ 1 ]

[firebird-issue-importer]

Modified by: @pcisar

Workflow: jira [ 11441 ] => Firebird [ 14971 ]

[firebird-issue-importer]

Modified by: @pavel-zotov

QA Status: No test

[firebird-issue-importer]

Modified by: @pavel-zotov

status: Closed [ 6 ] => Closed [ 6 ]

QA Status: No test => Cannot be tested