This repository contains supplemental materials for:

Jim Basney, Phuong Cao, and Terry Fleury, "Investigating Root Causes of Authentication Failures Using a SAML and OIDC Observatory," IEEE 6th International Conference on Dependability in Sensor, Cloud and Big Data Systems and Applications (DependSys), December, 2020. https://doi.org/10.1109/DependSys51298.2020.00026

http://www.ieee-cybermatics.org/2020/dependsys/