While migrating the code generation tests for load/store combiners to to the top-level testsuite (fad31e5), I had to disable some tests for arm64 and ppc64le because it looks like that store combining is failing in some situations.
For instance:
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func store_le16_idx(b []byte, idx int) { |
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// amd64:`MOVW\s` |
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// arm64(DISABLED):`MOVH`,-`MOVB` |
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// ppc64le(DISABLED):`MOVH\s` |
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binary.LittleEndian.PutUint16(b[idx:], sink16) |
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} |
It looks like the bug is related to the fact that the store is made from a global variable rather than a local variable (as was being previously tested).
While migrating the code generation tests for load/store combiners to to the top-level testsuite (fad31e5), I had to disable some tests for arm64 and ppc64le because it looks like that store combining is failing in some situations.
For instance:
go/test/codegen/memcombine.go
Lines 132 to 137 in fad31e5
It looks like the bug is related to the fact that the store is made from a global variable rather than a local variable (as was being previously tested).