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.gitignore tests: usb-gadget0: gitignore generated linker scripts Aug 27, 2018
70-libopencm3.rules tests: gadget0: include sample udev rules and document Oct 2, 2017
Makefile gadget0: allow parallel submake Jun 28, 2019
Makefile.efm32hg309-generic tests: gadget0: efm32hg: add gadget0 test for efm32hg Mar 2, 2018
Makefile.stm32f072disco tests: gadget0: delay between calls to trigger races Jun 8, 2017
Makefile.stm32f103-generic tests: gadget0: delay between calls to trigger races Jun 8, 2017
Makefile.stm32f3-disco tests: gadget0: add stm32f3-disco May 1, 2018
Makefile.stm32f429i-disco tests: gadget0: delay between calls to trigger races Jun 8, 2017
Makefile.stm32f4disco tests: gadget0: delay between calls to trigger races Jun 8, 2017
Makefile.stm32l053disco tests: gadget0: delay between calls to trigger races Jun 8, 2017
Makefile.stm32l1-generic gadget0: stm32l1: target the "hw1" test board explicitly Apr 14, 2018
Makefile.tilm4f120xl tests: usb gadget0: add ti lm4f120xl board Aug 27, 2018
README.md tests: gadget0: include sample udev rules and document Oct 2, 2017
delay.c tests/gadget0: avoid floating point division Jan 4, 2020
delay.h tests: gadget0: delay between calls to trigger races Jun 8, 2017
delay_efm32.c tests: gadget0: efm32hg: add gadget0 test for efm32hg Mar 2, 2018
main-efm32hg309-generic.c tests: gadget0: efm32hg: add gadget0 test for efm32hg Mar 2, 2018
main-stm32f072disco.c tests: gadget0: delay between calls to trigger races Jun 8, 2017
main-stm32f103-generic.c tests: gadget0: stm32f1 hack should be consistent Sep 1, 2017
main-stm32f3-disco.c tests: gadget0: stm32f3: use library clock setups Aug 29, 2018
main-stm32f429i-disco.c gadget0: f429: update to newest rcc api Jul 2, 2019
main-stm32f4disco.c gadget0: f4: update to newest rcc api Jun 28, 2019
main-stm32l053disco.c tests: gadget0: delay between calls to trigger races Jun 8, 2017
main-stm32l1-generic.c gadget0: stm32l1: target the "hw1" test board explicitly Apr 14, 2018
main-tilm4f120xl.c tests: usb gadget0: ti: use dummy delay handlers Aug 27, 2018
openocd.common.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.efm32hg309-generic.cfg tests: gadget0: efm32hg: add gadget0 test for efm32hg Mar 2, 2018
openocd.stm32f072disco.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.stm32f103-generic.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.stm32f3-disco.cfg tests: gadget0: add stm32f3-disco May 1, 2018
openocd.stm32f429i-disco.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.stm32f4disco.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.stm32l053disco.cfg tests: extract serials to optional local config Feb 28, 2016
openocd.stm32l1-generic.cfg tests: extract serials to optional local config Feb 28, 2016
stub.py tests: usb: gadget0 compatible interface (stm32f4) Oct 3, 2015
test_gadget0.py usb gadget0: ctrl write/read loopback tests Aug 27, 2018
usb-gadget0.c usb gadget0: ctrl write/read loopback tests Aug 27, 2018
usb-gadget0.h tests: gadget0: delay between calls to trigger races Jun 8, 2017

README.md

This project, inspired by usbtest and the linux usb gadget zero driver is used for regression testing changes to the libopencm3 usb stack.

The firmware itself is meant to be portable to any supported hardware, and then identical unit test code is run against all platforms. This project can and should be built for multiple devices.

Requirements:

  • pyusb for running the tests.
  • OpenOCD >= 0.9 for automated flashing of specific boards
  • python3 for running the tests at the command line.

Building the device firmware

There are Makefile.xxxxx files for all the currently tested targets.

make -f Makefile.stm32f4disco clean all V=1

The V=1 is optional, and turns on verbose mode, which can be useful if things don't work. This will give you a .elf file you can program using your own toolchain, but if you have a functional OpenOCD installed, then...

make -f Makefile.stm32f4disco clean all flash

Will handle flashing as well.

Setting up the test runner (using python virtual environments)

pyvenv .env  # ensures a python3 virtual env
. .env/bin/activate
pip install pyusb

If you have multiple test boards connected, have a look at opencd.common.cfg for some tips on selectively matching the right board. For people with just a single matching board, you don't need to do anything.

Tests marked as @unittest.skip are either for functionality that is known to be broken, and are awaiting code fixes, or are long running performance tests

Access rights

On some systems (most linux systems) you probably won't have access to the usb vendor id being used/hijacked by the test cases. See 70-libopencm3.rules for installation instructions, or, if you have your own system, grant yourself access to the usb vid: 0xcafe

Running the tests

Below is an example of running the full suite of tests from the command line. The argument specifies the serial number to look for in the usb gadget, if you have more than one. No argument will the tests against all gadget-zero's found.

$ python test_gadget0.py
Running tests for DUT:  stm32f072disco
.........ss................
----------------------------------------------------------------------
Ran 27 tests in 0.388s

OK (skipped=2)

To be even more brutal, run this in a shell loop.

$ while true; do python test_gadget0.py stm32f072disco; done

You can also run individual tests, or individual sets of tests, see the unittest documentation for more information.

Many development environments, such as PyCharm can also be used to edit and run the tests, in whole or individually, with a nice visual test runner.

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