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[Original #1295] v2 dcd format and tests #1330

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merged 8 commits into from May 10, 2017

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@avtolstoy
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commented May 10, 2017

Correctly rebased

Original #1295

Problem

Hypothesised write errors in flash that appear only after power cycle can corrupt the configuration data.
Flash access is not thread-safe.

Solution

Adds CRC checking to the Electron DCD implementation so that write errors are detected.
Add a critical section around flash operations and around DCD operations.

Steps to Test

Run the firmware unit tests.

Manual testing:

  • flash system firmware to an electron that was connecting to the cloud
  • verify that the device continues to connect to the cloud
  • make a change in DCD via DFU
  • verify the device still connects to the cloud (the DCD contents will have been upgraded to the V2 format.)

Example App

This is an internal system change. No example application.


Completeness

  • User is totes amazing for contributing!
  • Contributor has signed CLA (Info here)
  • Problem and Solution clearly stated
  • Run unit/integration/application tests on device
  • Added documentation (N/A)
  • Added to CHANGELOG.md after merging (add links to docs and issues)

Enhancement

  • [PR #1330] [Electron] Added CRC checking to the Electron DCD implementation so that write errors are detected. Added a critical section around flash operations and around DCD operations to make them thread safe.

@avtolstoy avtolstoy added this to the 0.7.0 milestone May 10, 2017

@technobly
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Previously approved by Andrey

@technobly technobly merged commit 6fb7f0d into feature/photon/wiced-3.7.0-7 May 10, 2017

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@technobly technobly deleted the feature/dcd_crc_rebased branch May 10, 2017

avtolstoy added a commit to avtolstoy/firmware that referenced this pull request May 10, 2017
avtolstoy pushed a commit to avtolstoy/firmware that referenced this pull request May 10, 2017
@avtolstoy avtolstoy referenced this pull request Dec 28, 2017
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