[TC-Mode Base- 1.1] Yaml Script has to be updated as per Test Plan

[Ashwinigrl]

Description:

• TC-LWM-1.1

• Step 3 - In Test plan there is no features in feature map list, But Script is verifying the "LWM.S.F00(DEPONOFF)" feature.

• Step 4c - In Test Plan there is no Feature dependent attribute(DEPONOFF) in AttributeList, But Script is verifying OnMode(0x0003) attribute.

• TC-TCCM-1.1

• Step 3 - In Test plan there is no features in feature map list, But Script is verifying the "TCCM.S.F00(DEPONOFF)" feature.

• Step 4c - In Test Plan there is no Feature dependent attribute(DEPONOFF) in AttributeList, But Script is verifying OnMode(0x0003) attribute.

Steps to reproduce:

TC-LWM-Steps 3, 4c
TC-TCCM-Steps 3, 4c

Test Plan References:

• https://github.com/CHIP-Specifications/chip-test-plans/blob/master/src/cluster/mode_laundry_washer.adoc
• https://github.com/CHIP-Specifications/connectedhomeip-spec/blob/master/src/app_clusters/Mode_Refrigerator.adoc

Yaml References:

• https://github.com/project-chip/connectedhomeip/blob/master/src/app/tests/suites/certification/Test_TC_LWM_1_1.yaml
• https://github.com/project-chip/connectedhomeip/blob/master/src/app/tests/suites/certification/Test_TC_TCCM_1_1.yaml

[Survensa]

@raul-marquez-csa Here is how the yaml should be for this issue similar for both TC-LWM-1.1 & TC-TCCM-1.1

Actual Step 3 :

    - label: "Step 3: TH reads from the DUT the FeatureMap attribute."
      command: "readAttribute"
      attribute: "FeatureMap"
      PICS: "!TCCM.S.F00"
      response:
          value: 0
          constraints:
              type: bitmap32

    - label:
          "Step 3: TH reads from the DUT the FeatureMap attribute, bit 0: SHALL
          be 1 if and only if TCCM.S.F00(DEPONOFF)"
      command: "readAttribute"
      attribute: "FeatureMap"
      PICS: TCCM.S.F00
      response:
          constraints:
              type: bitmap32
              hasMasksSet: [0x1]

Expected Step 3 :

    - label: "Step 3: TH reads from the DUT the FeatureMap attribute."
      command: "readAttribute"
      attribute: "FeatureMap"
      response:
          value: 0
          constraints:
              type: bitmap32

For STEP 4C below lines has to be removed :

    - label:
          "Step 4c: TH reads from the DUT the AttributeList attribute. 0x0003
          SHALL be included if and only if TCCM.S.F00(DEPONOFF)"
      PICS: TCCM.S.F00
      command: "readAttribute"
      attribute: "AttributeList"
      response:
          constraints:
              type: list
              contains: [3]

[gvargas-csa]

Hi @Survensa so if I understood, just should be only one step 3 not both and PICS value should be remove for the first one and also the text ", bit 0: SHALL be 1 if and only if TCCM.S.F00(DEPONOFF)" right?

Just add more context to this in the Matter_V_1_3_TestPlanVerificationSteps
there is not any value for PICS in that column.

And also in the test plan document for this appears weird

like there is nothing to show up maybe that's why the confuse

[Survensa]

Please check Test Plan here : https://github.com/CHIP-Specifications/chip-test-plans/tree/gh-site if you are seeing only macros in repo

[raul-marquez-csa]

Addresses in PR
project-chip/connectedhomeip#32116

[rbultman]

I believe the test plans and scripts are correct with respect to the devices currently using those clusters.

• DEPONOFF is inherited from the Mode Base cluster. It should be present within the SDK for these clusters and the associated PICS value (LWM.S.F00 and TCCM.S.F00) should be used to determine the response during testing. Since both refrigerators and laundry washers override this feature (they disallow it), this bit should be 0 for all current implementations.
• Test step 3 should be updated to reflect the state of the DEPONOFF PICS value, but these test steps for both LWM and TCCM reflect the existing device types so they should be fine for the TE and SVE.
• Test step 4c is correct for both LWM and TCCM as they are gated on the support for the DEPONOFF feature bit.