From 3e16286f22c2c1f3fb031d510176ea171c7c232b Mon Sep 17 00:00:00 2001 From: Johannes Kasimir Date: Tue, 26 Aug 2025 09:36:38 +0200 Subject: [PATCH 1/2] fix: link directly do doi page - other link breaks --- docs/bibliography.bib | 2 +- 1 file changed, 1 insertion(+), 1 deletion(-) diff --git a/docs/bibliography.bib b/docs/bibliography.bib index f20e0df2..15da8d67 100644 --- a/docs/bibliography.bib +++ b/docs/bibliography.bib @@ -6,7 +6,7 @@ @article{STAHN201644 year = {2016}, issn = {0168-9002}, doi = {https://doi.org/10.1016/j.nima.2016.03.007}, -url = {https://www.sciencedirect.com/science/article/pii/S0168900216300250}, +url = {https://doi.org/10.1016/j.nima.2016.03.007}, author = {J. Stahn and A. Glavic}, keywords = {Reflectometry, Neutron, Focusing}, abstract = {Neutron reflectometry is a powerful tool to investigate chemical and magnetic depth profiles near surfaces. The advantages of neutrons compared to x-rays are their sensitivity to isotopes, the high penetration capabilities and the high sensitivity to magnetic induction. The biggest disadvantage however is the low flux available, which leads to much longer counting times on much larger samples. In order to boost the performance of neutron reflectometers, a focusing guide system was developed and realised over recent years. Here we report on the application and performance of a down-scaled demonstrator of such a Selene guide, installed as an add-on on the time-of-flight (TOF) reflectometer Amor at the PSI. Due to the limited size of the guide, the flux is concentrated to a footprint of at most 2mm width. It is thus possible to avoid illumination of contacts even on small samples. Despite the fact that typical samples measured on Amor with a size of 10×10mm2 are markedly under illuminated, the presented set-up leads to a reduction in counting time of 80%. The use of the demonstrator thus allows for in-situ or in-operando investigations with a time resolution of a few minutes for a qz range from 0.005Å−1 to 0.08Å−1. Besides a short recapitulation of the concept of focusing reflectometry, a detailed description of the data reduction and its quality is given, followed by an application example.} From 45377382b4dc73d132f7f269e23d2a523f7c19d6 Mon Sep 17 00:00:00 2001 From: Johannes Kasimir Date: Tue, 26 Aug 2025 11:15:12 +0200 Subject: [PATCH 2/2] fix: remove url --- docs/bibliography.bib | 1 - 1 file changed, 1 deletion(-) diff --git a/docs/bibliography.bib b/docs/bibliography.bib index 15da8d67..69233c59 100644 --- a/docs/bibliography.bib +++ b/docs/bibliography.bib @@ -6,7 +6,6 @@ @article{STAHN201644 year = {2016}, issn = {0168-9002}, doi = {https://doi.org/10.1016/j.nima.2016.03.007}, -url = {https://doi.org/10.1016/j.nima.2016.03.007}, author = {J. Stahn and A. Glavic}, keywords = {Reflectometry, Neutron, Focusing}, abstract = {Neutron reflectometry is a powerful tool to investigate chemical and magnetic depth profiles near surfaces. The advantages of neutrons compared to x-rays are their sensitivity to isotopes, the high penetration capabilities and the high sensitivity to magnetic induction. The biggest disadvantage however is the low flux available, which leads to much longer counting times on much larger samples. In order to boost the performance of neutron reflectometers, a focusing guide system was developed and realised over recent years. Here we report on the application and performance of a down-scaled demonstrator of such a Selene guide, installed as an add-on on the time-of-flight (TOF) reflectometer Amor at the PSI. Due to the limited size of the guide, the flux is concentrated to a footprint of at most 2mm width. It is thus possible to avoid illumination of contacts even on small samples. Despite the fact that typical samples measured on Amor with a size of 10×10mm2 are markedly under illuminated, the presented set-up leads to a reduction in counting time of 80%. The use of the demonstrator thus allows for in-situ or in-operando investigations with a time resolution of a few minutes for a qz range from 0.005Å−1 to 0.08Å−1. Besides a short recapitulation of the concept of focusing reflectometry, a detailed description of the data reduction and its quality is given, followed by an application example.}