Skip to content
New issue

Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.

By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.

Already on GitHub? Sign in to your account

Add option to indirect diffraction to provide a PAR file for VESUVIO #12588

Closed
DanNixon opened this issue May 13, 2015 · 2 comments
Closed

Add option to indirect diffraction to provide a PAR file for VESUVIO #12588

DanNixon opened this issue May 13, 2015 · 2 comments
Assignees
Labels
Indirect/Inelastic Issues and pull requests related to indirect or inelastic
Milestone

Comments

@DanNixon
Copy link
Member

The detector parameters change based on the calibration so you can't rely on the angles and lengths in the IDF.

@DanNixon
Copy link
Member Author

DanNixon commented Jun 3, 2015

This issue was originally trac ticket 11750

@DanNixon DanNixon added the Indirect/Inelastic Issues and pull requests related to indirect or inelastic label Jun 3, 2015
@DanNixon DanNixon self-assigned this Jun 3, 2015
@DanNixon DanNixon added this to the Release 3.5 milestone Jun 3, 2015
@DanNixon DanNixon closed this as completed Jun 3, 2015
@DanNixon DanNixon reopened this Jun 4, 2015
@DanNixon
Copy link
Member Author

This has been done here.

Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment
Labels
Indirect/Inelastic Issues and pull requests related to indirect or inelastic
Projects
None yet
Development

No branches or pull requests

1 participant