Aircraft Vision Perception (AVP) Lab, Sun Yat-Sen University, Shenzhen, China
You are free to use CXray dataset and all empirical data and metadata under the CC-BY licence. You can download the dataset (only partially provided) using Baidu Drive(passward: avp0) or Google Drive. When using this dataset in your research, we would appreciate that you cite our paper.
The dataset is still under development, and being maintained by JieWang. Please contact me via e-mail if you have any questions: wangj688@mail2.sysu.edu.cn
If you use this dataset in scientific context, please cite the following publications:
Wang, J.; Lin, B.; Li, G.; Zhou, Y.; Zhong, L.; Li, X.; Zhang, X. YOLO-Xray: A Bubble Defect Detection Algorithm for Chip X-ray Images Based on Improved YOLOv5. Electronics 2023, 12, 3060. https://doi.org/10.3390/electronics12143060
BibTeX details:
@Article{electronics12143060,
AUTHOR = {Wang, Jie and Lin, Bin and Li, Gaomin and Zhou, Yuezheng and Zhong, Lijun and Li, Xuan and Zhang, Xiaohu},
TITLE = {YOLO-Xray: A Bubble Defect Detection Algorithm for Chip X-ray Images Based on Improved YOLOv5},
JOURNAL = {Electronics},
VOLUME = {12},
YEAR = {2023},
NUMBER = {14},
ARTICLE-NUMBER = {3060},
URL = {https://www.mdpi.com/2079-9292/12/14/3060},
ISSN = {2079-9292},
DOI = {10.3390/electronics12143060}
}