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EasyReflectometry

EasyReflectometry is a scientific software for modelling and analysis of reflectometry data. Currently, EasyReflectometry covers single contrast measurements of layered structures.

EasyReflectometry Screenshot

What is EasyReflectometry for?

EasyReflectometry allows simulation of reflectometry profiles based on layered structures and the refinements of the structural parameters. For refinement, the program uses a number of fitting engines (minimizers).

EasyReflectometry offers a graphical user interface for the analysis of reflectometry data, built on external reflectometry packages such as refnx and refl1d. This allows EasyReflectometry to cover different functionality aspects within a signle, intuitive, and user-friendly interface.
The reflectomety packages are included with the installation so there is no need to download andn compile any additional components.

Main features

EasyReflectometry is open source and cross-platform, with support for Windows, macOS and Linux (Ubuntu).

The intuitive tabbed interface allows for a clear and defined data modelling and analysis workflow. There are also built-in step-by-step user guides and video tutorials for new users.

Current main features of EasyReflectometry:

  • Support for the analysis of a single contrast of reflectometry data.
  • Creation of materials to be used in structure from scattering length density.
  • The ability to define repeating multi-layers of materials and refine these structures using refnx or refl1d.
  • Growing support for flexible item types, including chemically consistent models.
  • Ability to corefine multiple contrasts of reflectometry data.
  • Multiple minimization engines: lmfit, bumps and DFO-LS (including the differential evolution method).
  • Interactive HTML and standard PDF report generation.
  • Undo/redo for both parameter changes and fitting.
  • Saving and loading of projects.

Planned improvements / new functionality for EasyReflectometry:

  • Support for magnetic structures and polarised reflectometry measurements.
  • Support for mixed model reflectometry datasets.
  • Reading of q-dependent resolution from a file.

Full details of the future plans for EasyReflectometry is available in the roadmap.

Getting Started

Downloading

Download the official EasyReflectometry installer for your operating system.

Installing

Run EasyReflectometry installer and follow the instructions.

macOS: If you see the message EasyReflectometrySetup.app can't be opened because it is from an unidentified developer, do the following: In the Finder, locate the EasyReflectometry installer app, then control-click the app icon, then choose Open from the shortcut menu and finally click Open.

Uninstalling

Run MaintenanceTool from the EasyReflectometry installation directory, select Remove all components and follow the instructions.

Get in touch

For bug reports and feature requests, please use Issue Tracker instead.