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ASR6601 Test Report

简体中文

Introduction

About This Document

This document provides the test report for IoT LPWAN SoC ASR6601.

Included Chip Models

The product models corresponding to this document are as follows.

Model Flash SRAM Core Package Frequency
ASR6601SE 256 KB 64 KB 32-bit 48 MHz Arm China STAR-MC1 QFN68, 8*8 mm 150 ~ 960 MHz
ASR6601CB 128 KB 16 KB 32-bit 48 MHz Arm China STAR-MC1 QFN48, 6*6 mm 150 ~ 960 MHz
ASR6601SER 256 KB 64 KB 32-bit 48 MHz Arm China STAR-MC1 QFN68, 8*8 mm 150 ~ 960 MHz
ASR6601CBR 128 KB 16 KB 32-bit 48 MHz Arm China STAR-MC1 QFN48, 6*6 mm 150 ~ 960 MHz

Copyright Notice

© 2021 ASR Microelectronics Co., Ltd. All rights reserved. No part of this document can be reproduced, transmitted, transcribed, stored, or translated into any language in any form or by any means without the written permission of ASR Microelectronics Co., Ltd.

Trademark Statement

ASR and ASR Microelectronics Co., Ltd. are trademarks of ASR Microelectronics Co., Ltd.

Other trade names, trademarks, and registered trademarks mentioned in this document are the property of their respective owners and are hereby declared.

Disclaimer

ASR does not give any warranty of any kind and may make improvements and/or changes in this document or in the product described in this document at any time.

This document is only used as a guide, and no contents in the document constitute any form of warranty. Information in this document is subject to change without notice.

All liability, including liability for infringement of any proprietary rights caused by using the information in this document, is disclaimed.

Revision History

Date Version Release Notes
2021.05 V1.0.0 First release.

1. Test Overview

1.1 Hardware

68-Pin ASR6601-SE V1.0 Development Board

1.2 Software

ASR6601 V1.0 SDK

1.3 Equipment

Agilent N5182B and Agilent N9020A

1.4 Test Items and Results Summary

image1

2. Test Implementation

2.1 TX Test

2.1.1 Setup TX Test Environment

image2

2.1.2 Frequency Offset Test

  1. Test Method
  1. Frequency setting:
  • Set to LoRa CW mode with 470.0 MHz frequency
  • Set the power to 22.0 dBm
  1. Spectrum analyzer setting:
  • Center frequency is 470.0 MHz, Span is 2 MHz, Ref amp is 25.0 dBm
  • Measure the CW frequency with the marker of the spectrum analyzer
  1. Illustration

image3

  1. Test Result
SN Set (MHz) Test (MHz) PPM
1# 470.000 469.9980 4.25

2.1.3 Transmit Power Test

  1. Test Method
  1. Frequency setting:
  • Set to LoRa CW mode with 470.0 MHz frequency
  • Set the power to 22 dBm
  1. Spectrum analyzer setting:
  • Set frequency point at 1st, 2nd, 3rd, 4th and 5th of the basic frequency
  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm
  • Max Hold mode
  1. Illustration

image4

  1. Test Result

Maximum Transmit Power Test Result

SN Frequency (MHz) Set (dBm) Basic (dBm)
1# 470 22 21.06
2# 470 22 20.97

2.1.4 Harmonic Test

  1. Test Method
  1. Frequency settings
  • Set to LoRa CW mode with 470.0 MHz frequency
  • Set the power to 22 dBm
  1. Spectrum analyzer settings
  • Set frequency point at 1st, 2nd, 3rd, 4th and 5th of the basic frequency
  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm
  • Max Hold mode
  1. Illustration

image5

2nd/3rd/4th/5th Harmonic Test

  1. Test Result
SN Frequency (MHz) Set (dBm) Basic (dBm) 2nd (dBm) 3rd (dBm) 4th (dBm) 5th (dBm)
1# 470 22 21.06 -46.94 -50.74 -55.80 -60.41
2# 470 22 20.97 -45.42 -49.57 -56.22 -59.28

2.1.5 Phase Noise Test

  1. Test Method
  1. Frequency setting:
  • Set to LoRa CW mode with 470.0 MHz frequency
  • Set the power to 22 dBm
  1. Spectrum analyzer setting:
  • Maker -> Delta, Function -> maker noise
  • Span is 2 MHz (or 5 MHz), Ref amp is 25 dBm
  • Max Hold mode
  1. Illustration

image6

  1. Test Result
SN Frequency (MHz) ACT (MHz) Phase Noise (dB/Hz)
1# 470 469.999 -98.653
2# 470 469.999 -99.965

2.2 RX Test

2.2.1 RX Test Environment Setup

image7

2.2.2 RX Sensitivity Test

  1. Test Method
  1. Frequency setting:
Set to LoRa RX test mode with 470.0 MHz frequency
  1. Signal generator setting:
  • Load related waveform for different SF
  • Measure the SNR threshold as below

RX Sensitivity Test Specification

SF BW (KHz) Package RSSI (dBm) SNR Limit (dB)
SF7 125 <123 -7.5
SF8 125   -10
SF9 125   -12.5
SF10 125 <130 -15
SF11 125   -17.5
SF12 125 <135 -20
  1. Test Result

image8

2.3 Power Consumption Test

  1. Test Method
  1. Frequency setting:
Set to 470 MHz frequency under TX, RX, Standby and Sleep mode
  1. Multimeter setting:
Set the multimeter to current test mode
  1. AT Command:
  • TX: AT+CTXCW=470000000,22
  • RX: AT+CRX=470000000,0
  • Deep sleep: AT+CSLEEP=1
  1. Illustration

image9

  1. Test Result

image10

  1. Note

The power consumption test result is for ASR6601 SoC with front-end RF.