sz_jlc_capacitor.dcm

EESchema-DOCLIB  Version 2.0
#
$CMP 75pF(750),±5%,50V,C0G,0805,C10417
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39pF(390),±5%,50V,C0G,0402,C106223
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±5%,50V,C0G,0402,C107003
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51pF(510),±5%,50V,C0G,0402,C111774
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9pF(090),±0.5pF,50V,C0G,0402,C111805
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180pF(181),±5%,50V,C0G,0402,C12209
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4pF(2R4),±0.1pF,50V,C0G,0402,C123475
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6pF(5R6),±0.25pF,50V,C0G,0603,C123584
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56nF(563),±10%,16V,X7R,0402,C12466
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nF(684),±10%,16V,X7R,0603,C12479
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68nF(683),±10%,16V,X7R,0402,C12529
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF(225),±20%,6.3V,X5R,0402,C12530
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18pF(180),±1%,50V,C0G,0603,C126551
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF,(225),±10%,50V,X5R,1206,C12656
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF(226),±10%,25V,1206,C12891
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 430pF(431),±5%,50V,C0G,0603,C13515
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82pF(820),±5%,50V,C0G,0402,C13532
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF,(331),±5%,50V,C0G,0402,C13533
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF,(106),±10%,50V,X5R,1206,C13585
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,50V,X7R,0805,C136621
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF(105),±10%,100V,X7R,1206,C13832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF,(474),±10%,50V,X7R,0805,C13967
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68pF,(680),±5%,50V,C0G,0402,C14441
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,50V,X7R,0402,C14442
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF,(104),±10%,50V,X7R,0603,C14663
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47pF,(470),±5%,50V,C0G,0805,C14857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF,(101),±5%,50V,C0G,0603,C14858
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1pF,(010),±0.25pF,50V,C0G,0805,C14971
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100uF(107),±20%,6.3V,X5R,1206,C15008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,100V,X7R,0805,C15177
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF,(103),±10%,50V,X7R,0402,C15195
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF,(102),±10%,50V,X7R,0402,C1523
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF,(104),±10%,16V,X7R,0402,C1525
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF,(151),±10%,50V,X7R,0402,C1527
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF(221),±5%,100V,C0G,0603,C152914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF,(221),±10%,50V,X7R,0402,C1530
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF,(222),±10%,50V,X7R,0402,C1531
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nF,(223),±10%,50V,X7R,0402,C1532
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,50V,X7R,1206,C153290
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,100V,X7R,0603,C153291
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,X7R,1206,C153292
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820pF(821),±10%,50V,X7R,0603,C153293
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF,(471),±10%,50V,X7R,0402,C1537
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6nF(562),±10%,50V,X7R,0805,C153719
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF,(472),±10%,50V,X7R,0402,C1538
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8nF,(682),±10%,50V,X7R,0402,C1542
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8nF(182),±10%,50V,X7R,0603,C154498
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF,(101),±5%,50V,C0G,0402,C1546
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12pF,(120),±5%,50V,C0G,0402,C1547
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15pF,(150),±5%,50V,C0G,0402,C1548
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18pF,(180),±5%,50V,C0G,0402,C1549
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1pF,(1R0),±0.25pF,50V,C0G,0402,C1550
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF,(1R5),±0.25pF,50V,C0G,0402,C1552
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF,(106),±20%,6.3V,X5R,0402,C15525
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20pF,(200),±5%,50V,C0G,0402,C1554
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,25V,X7R,0402,C155422
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22pF,(220),±5%,50V,C0G,0402,C1555
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27pF,(270),±5%,50V,C0G,0402,C1557
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2pF,(2R0),±0.25pF,50V,C0G,0402,C1558
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2pF,(2R2),±0.25pF,50V,C0G,0402,C1559
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7pF,(2R7),±0.25pF,50V,C0G,0402,C1561
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33pF,(330),±5%,50V,C0G,0402,C1562
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 11pF(110),±5%,50V,C0G,0603,C156474
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3pF,(3R3),±0.25pF,50V,C0G,0402,C1565
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47pF,(470),±5%,50V,C0G,0402,C1567
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7pF,(4R7),±0.25pF,50V,C0G,0402,C1569
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,X7R,0805,C15698
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30pF,(300),±5%,50V,C0G,0402,C1570
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56pF,(560),±5%,50V,C0G,0402,C1572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,100V,X7R,0603,C15725
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8pF,(6R8),±0.25pF,50V,C0G,0402,C1576
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF,(105),±10%,50V,X5R,0603,C15849
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nF,(333),±20%,50V,Y5V,0402,C1585
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF,(106),±10%,25V,X5R,0805,C15850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF,(102),±10%,50V,X7R,0603,C1588
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,X7R,0603,C1589
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12nF,(123),±10%,50V,X7R,0603,C1593
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF,(151),±10%,50V,X7R,0603,C1594
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF,(152),±10%,50V,X7R,0603,C1595
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15nF,(153),±10%,50V,X7R,0603,C1596
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,500V,C0G,1206,C159750
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,100V,C0G,1206,C159751
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,50V,C0G,1206,C159752
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nF(684),±10%,25V,X7R,1206,C159753
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF(221),±10%,500V,X7R,1206,C159755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,200V,X7R,1206,C159756
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF(681),±5%,50V,C0G,0805,C159762
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560pF(561),±5%,50V,C0G,0805,C159763
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9pF(3R9),±0.25pF,50V,C0G,0805,C159764
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3pF(3R3),±0.1pF,50V,C0G,0805,C159765
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF(331),±5%,50V,C0G,0805,C159766
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF(152),±5%,50V,C0G,0805,C159768
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF(151),±5%,50V,C0G,0805,C159769
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120pF(121),±5%,50V,C0G,0805,C159770
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,100V,C0G,0805,C159771
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5pF(0R5),±0.1pF,50V,C0G,0805,C159772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3pF(3R0),±0.25pF,50V,C0G,0805,C159773
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF(473),±10%,50V,X7R,0805,C159774
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uF(335),±10%,10V,X7R,0805,C159775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nF(333),±10%,100V,X7R,0805,C159776
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nF(333),±10%,50V,X7R,0805,C159777
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF(151),±10%,50V,X7R,0805,C159778
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,200V,X7R,0805,C159779
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,X7R,0805,C159780
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 75pF(75R),±5%,50V,C0G,0603,C159786
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51pF(51R),±5%,50V,C0G,0603,C159787
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6pF(3R6),±0.1pF,50V,C0G,0603,C159788
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3pF(3R3),±0.1pF,50V,C0G,0603,C159789
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 36pF(36R),±5%,50V,C0G,0603,C159790
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300pF(301),±5%,50V,C0G,0603,C159791
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25pF(25R),±5%,50V,C0G,0603,C159793
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200pF(201),±5%,50V,C0G,0603,C159794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2pF(1R2),±0.1pF,50V,C0G,0603,C159795
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF(472),±5%,50V,X7R,0603,C159797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 300pF(301),±10%,50V,X7R,0603,C159799
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3pF(4R3),±0.25pF,50V,C0G,0402,C159803
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30pF(30R),±5%,50V,C0G,0402,C159804
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7pF(2R7),±0.1pF,50V,C0G,0402,C159805
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2pF(2R2),±0.25pF,50V,C0G,0402,C159806
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2pF(1R2),±0.25pF,50V,C0G,0402,C159808
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2pF(1R2),±0.1pF,50V,C0G,0402,C159809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF(152),±5%,50V,X7R,0402,C159813
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF(225),±20%,25V,X5R,0402,C159814
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200pF,(201),±10%,50V,X7R,0603,C1600
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,200V,X7R,0805,C16005
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF,(221),±10%,50V,X7R,0603,C1603
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,50V,X7R,0603,C16033
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF,(222),±10%,50V,X7R,0603,C1604
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7nF,(272),±10%,50V,X7R,0603,C1609
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nF,(332),±10%,50V,X7R,0603,C1613
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4pF(2R4),±0.25pF,50V,C0G,0402,C161317
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.3pF(4R3),±0.25pF,50V,C0G,0603,C16148
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7pF,(2R7),±0.25pF,50V,C0G,0603,C16149
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nF,(334),±10%,25V,X7R,0603,C1615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±1%,50V,C0G,0402,C161545
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF,(471),±10%,50V,X7R,0603,C1620
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF,(473),±10%,50V,X7R,0603,C1622
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF,(474),±10%,25V,X7R,0603,C1623
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF,(681),±10%,50V,X7R,0603,C1630
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8nF,(682),±10%,50V,X7R,0603,C1631
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10pF,(100),±5%,50V,C0G,0603,C1634
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,50V,C0G,0603,C1635
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±5%,50V,C0G,0603,C163508
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF,(1R5),±0.25pF,50V,C0G,0603,C1639
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15pF,(150),±5%,50V,C0G,0603,C1644
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16pF(160),±5%,50V,C0G,0603,C1646
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18pF,(180),±5%,50V,C0G,0603,C1647
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20pF,(200),±5%,50V,C0G,0603,C1648
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nF(122),±10%,50V,X7R,0402,C16529
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22pF,(220),±5%,50V,C0G,0603,C1653
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27pF,(270),±5%,50V,C0G,0603,C1656
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±5%,50V,C0G,0603,C1657
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33pF,(330),±5%,50V,C0G,0603,C1663
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF,(331),±5%,50V,C0G,0603,C1664
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7pF,(4R7),±0.25pF,50V,C0G,0603,C1669
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47pF,(470),±5%,50V,C0G,0603,C1671
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF,(224),±10%,16V,X7R,0402,C16772
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47uF(476),±20%,6.3V,X5R,0805,C16780
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8pF,(6R8),±0.25pF,50V,C0G,0603,C1679
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82pF,(820),±5%,50V,C0G,0603,C1683
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2pF,(8R2),±0.25pF,50V,C0G,0603,C1685
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27nF,(273),±20%,50V,Y5V,0603,C1700
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82pF(820),±5%,50V,C0G,0805,C170103
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62pF(620),±5%,50V,C0G,0805,C170104
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56pF(560),±5%,50V,C0G,0805,C170105
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3pF(3R3),±0.25pF,50V,C0G,0805,C170106
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 25pF(250),±5%,50V,C0G,0805,C170107
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF(1R5),±0.25pF,50V,C0G,0805,C170108
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18pF(180),±5%,50V,C0G,0805,C170109
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12pF(120),±5%,50V,C0G,0805,C170110
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8pF(080),±0.5pF,50V,C0G,0805,C170111
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7pF(070),±0.5pF,50V,C0G,0805,C170112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6pF(060),±0.5pF,50V,C0G,0805,C170113
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5pF(050),±0.25pF,50V,C0G,0805,C170114
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4pF(040),±0.25pF,50V,C0G,0805,C170115
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2pF(020),±0.25pF,50V,C0G,0805,C170116
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2nF(822),±10%,50V,X7R,0805,C170117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390pF(391),±10%,50V,X7R,0805,C170118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7nF(272),±10%,50V,X7R,0805,C170119
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±10%,50V,X7R,0805,C170120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nF(223),±10%,50V,X7R,0805,C170121
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nF(122),±10%,50V,X7R,0805,C170122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.75pF(R75),±0.25pF,50V,C0G,0603,C170124
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9.1pF(9R1),±0.5pF,50V,C0G,0603,C170125
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2pF(8R2),±0.5pF,50V,C0G,0603,C170126
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7.5pF(7R5),±0.5pF,50V,C0G,0603,C170127
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8pF(6R8),±0.5pF,50V,C0G,0603,C170128
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 43pF(430),±5%,50V,C0G,0603,C170129
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.5pF(2R5),±0.25pF,50V,C0G,0603,C170130
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22pF(220),±5%,50V,C0G,0603,C170132
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8pF(1R8),±0.25pF,50V,C0G,0603,C170133
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2pF(1R2),±0.25pF,50V,C0G,0603,C170134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 16pF(160),±5%,50V,C0G,0603,C170135
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13pF(130),±5%,50V,C0G,0603,C170137
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±10%,50V,C0G,0603,C170138
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10pF(10R),±0.5pF,50V,C0G,0603,C170139
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.3pF(0R3),±0.25pF,50V,C0G,0603,C170140
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 9pF(090),±0.5pF,50V,C0G,0603,C170141
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6pF(060),±0.5pF,50V,C0G,0603,C170142
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5.6nF(562),±10%,50V,X7R,0603,C170143
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 510pF(511),±10%,50V,X7R,0603,C170144
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9nF(392),±10%,50V,X7R,0603,C170145
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±10%,50V,X7R,0603,C170146
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2nF(202),±10%,50V,X7R,0603,C170147
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF(151),±10%,50V,X7R,0603,C170148
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF(474),±10%,50V,X5R,0603,C170149
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF(1R5),±0.25pF,50V,C0G,0402,C170150
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF(473),±10%,100V,X7R,0805,C17074
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF,(103),±10%,50V,X7R,0805,C1710
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF,(151),±10%,50V,X7R,0805,C1716
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF,(152),±10%,50V,X7R,0805,C1717
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200pF,(201),±10%,50V,X7R,0805,C1724
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,50V,X7R,0805,C1728
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nF,(223),±10%,50V,X7R,0805,C1729
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nF,(333),±10%,50V,X7R,0805,C1739
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nF,(334),±10%,50V,X7R,0805,C1740
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF,(471),±10%,50V,X7R,0805,C1743
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF,(472),±10%,50V,X7R,0805,C1744
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8nF,(682),±10%,50V,X7R,0805,C1755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68nF,(683),±10%,50V,X7R,0805,C1756
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uF,(475),±10%,25V,X5R,0805,C1779
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10pF,(100),±5%,50V,C0G,0805,C1785
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF,(1R5),±0.25pF,50V,C0G,0805,C1788
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF,(101),±5%,50V,C0G,0805,C1790
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±5%,50V,C0G,0805,C1791
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12pF,(120),±5%,50V,C0G,0805,C1792
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15pF,(150),±5%,50V,C0G,0805,C1794
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18pF,(180),±5%,50V,C0G,0805,C1797
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20pF,(200),±5%,50V,C0G,0805,C1798
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2pF,(2R0),±0.25pF,50V,C0G,0805,C1800
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7pF,(2R7),±0.25pF,50V,C0G,0805,C1803
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22pF,(220),±5%,50V,C0G,0805,C1804
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9nF(392),±10%,50V,X7R,0402,C18047
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39nF(393),±10%,16V,X7R,0402,C18048
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30pF,(300),±5%,50V,C0G,0805,C1809
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33pF,(330),±5%,50V,C0G,0805,C1814
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7pF,(4R7),±0.25pF,50V,C0G,0805,C1820
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56pF,(560),±5%,50V,C0G,0805,C1828
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8pF,(6R8),±0.25pF,50V,C0G,0805,C1832
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68pF,(680),±5%,50V,C0G,0805,C1834
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180pF(181),±5%,50V,C0G,0603,C18437
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120pF,(121),±5%,50V,C0G,0603,C18438
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF(152),±5%,100V,C0G,0805,C184499
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF,(103),±10%,50V,X7R,1206,C1846
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF,(105),±10%,50V,X7R,1206,C1848
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF,(221),±10%,50V,X7R,1206,C1854
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF,(224),±10%,50V,X7R,1206,C1857
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF,(471),±10%,50V,X7R,1206,C1868
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF,(474),±10%,50V,X7R,1206,C1871
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,100V,X7R,0805,C18741
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 82pF(820),±5%,50V,C0G,0603,C188276
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±5%,50V,X7R,0402,C188845
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF(331),±5%,50V,C0G,1206,C1907
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,500V,X7R,1206,C1944
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,100V,X7R,1206,C1945
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uF,(475),±10%,16V,X5R,0603,C19666
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF,(106),±10%,10V,X5R,0603,C19702
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270nF(274),±10%,16V,X7R,0805,C20008
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,200V,X7R,0805,C209838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33nF,(333),±10%,50V,X7R,0603,C21117
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nF(154),±10%,25V,X7R,0603,C21118
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF,(224),±10%,25V,X7R,0603,C21120
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nF,(223),±10%,50V,X7R,0603,C21122
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF(472),±10%,100V,X7R,0805,C21217
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.8pF(0R8),±0.1pF,50V,C0G,0603,C21357
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2pF,(020),±0.25pF,50V,C0G,0603,C21895
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5pF(1R5),±0.1pF,50V,C0G,0603,C21897
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±10%,50V,X7R,0603,C22396
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 30pF,(300),±5%,50V,C0G,0603,C22397
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,100V,X7R,0805,C22423
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 24pF(240),±5%,50V,C0G,0402,C22728
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF,(225),±10%,16V,X5R,0603,C23630
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,2KV,1206,C23631
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 18nF(183),±10%,50V,X7R,0402,C23688
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uF,(475),±20%,10V,X5R,0402,C23733
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF,(152),±10%,50V,X7R,0402,C23967
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1pF,(010),±0.25pF,50V,C0G,0603,C23969
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±5%,50V,X7R,0603,C24452
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF,(104),±10%,50V,X7R,1206,C24497
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF(473),±10%,16V,X7R,0402,C26403
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nF,(332),±10%,50V,X7R,0402,C26404
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12pF(120),±5%,50V,C0G,0402,C26406
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8pF(8R0),±0.5pF,50V,C0G,0402,C26408
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,50V,C0G,0402,C26409
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF(681),±10%,50V,X7R,0402,C26410
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±10%,50V,X7R,0402,C26412
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF(226),±10%,25V,X5R,1210,C268020
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±5%,50V,C0G,0805,C27071
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF(221),±5%,50V,C0G,0603,C27675
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±5%,50V,C0G,0603,C27694
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2pF(1R2),±0.25pF,50V,0402,C277490
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2nF,(822),±10%,50V,X7R,0603,C27920
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,100V,X7R,0805,C28233
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±5%,50V,C0G,0805,C28256
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF,(222),±5%,50V,C0G,0805,C28260
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68pF,(680),±5%,50V,C0G,0603,C28262
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nF(122),±10%,1KV,1206,C282827
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF,(105),±10%,50V,X7R,0805,C28323
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±5%,50V,NP0,0603,C296055
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5pF(0R5),±0.25pF,50V,0603,C296716
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uF,(475),±10%,50V,X7R,1206,C29823
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120nF(124),±10%,16V,X7R,0603,C29901
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF(105),±10%,25V,X7R,0603,C29936
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 270pF(271),±5%,50V,NP0,0402,C301975
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6pF,(6R0),±0.25pF,50V,C0G,0402,C30274
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2pF(020),±0.25pF,50V,C0G,0402,C30331
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.2nF,(122),±10%,50V,X7R,0603,C30615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,50V,0402,C307331
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7pF(070),±0.5PF,50V,0402,C307438
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820pF(821),±5%,50V,0402,C307452
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,0603,C307477
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4pF(040),±0.25PF,50V,0603,C307494
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,10V,0805,C307523
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nF(154),±10%,50V,0805,C307539
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,100V,1206,C307570
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nF(334),±10%,50V,1206,C307572
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF(473),±10%,50V,1206,C307574
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nF(684),±10%,50V,1206,C307578
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,630V,1206,C307580
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF(681),±5%,50V,C0G,0603,C30816
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,2000V,X7R,1206,C314237
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 68nF,(683),±10%,50V,X7R,0603,C31658
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF(221),±10%,100V,X7R,0805,C31838
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.4pF(2R4),±0.25PF,50V,C0G,0402,C318575
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3pF(3R0),±0.1PF,50V,0402,C318583
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 8.2pF(8R2),±0.25PF,50V,0402,C318599
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4pF(4R0),±0.1PF,50V,0402,C318615
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5pF(050),±0.1pF,50V,0402,C318616
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,25V,0805,C318691
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,6.3V,0805,C318698
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,25V,1206,C318755
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330nF(334),±10%,25V,1206,C318760
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.80pF(R80),±0.05pF,50V,0402,C326068
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF(224),±10%,100V,X7R,1210,C326640
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,2KV,X7R,1206,C328909
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10pF(100),±5%,50V,C0G,0402,C328913
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10pF,(100),±5%,50V,C0G,0402,C32949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 20pF(200),±5%,50V,C0G,0402,C32950
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±5%,50V,C0G,0603,C33353
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nF(684),±10%,6.3V,X5R,0402,C34850
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF,(102),±10%,500V,X7R,1206,C35216
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,500V,X7R,1206,C35220
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390pF(391),±5%,50V,C0G,0603,C35460
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF(224),±10%,100V,X7R,1210,C363568
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 240pF(241),±5%,50V,C0G,0805,C36982
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 13pF(130),±5%,50V,C0G,0805,C37059
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150pF(151),±5%,50V,C0G,0603,C37298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6pF,(6R0),±0.25pF,50V,C0G,0603,C37474
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF(152),±10%,50V,X7R,0603,C37788
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nF(154),±10%,10V,0402,C380295
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF(225),±10%,50V,1812,C382097
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 12pF,(120),±5%,50V,C0G,0603,C38523
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56pF,(560),±5%,50V,C0G,0603,C39148
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3pF(030),±0.25pF,50V,C0G,0603,C40189
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF(472),±10%,2KV,1206,C41017
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.5nF(152),±10%,50V,X7R,0805,C41756
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF,(226),±20%,25V,X5R,0805,C45783
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3pF,(3R0),±0.25pF,50V,C0G,0603,C46219
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF(331),±5%,100V,C0G,0805,C46242
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF,(102),±10%,50V,X7R,0805,C46653
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±5%,50V,X7R,0805,C46659
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF(224),±10%,25V,X5R,0402,C47129
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF,(474),±10%,10V,X5R,0402,C47339
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22nF(223),±10%,500V,X7R,1206,C47526
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9pF(3R9),±0.25pF,50V,C0G,0402,C48151
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF,(225),±20%,50V,Y5V,0805,C49217
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,50V,X7R,0805,C49678
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF(472),±10%,50V,X7R,0805,C50131
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 51pF(510),±5%,50V,C0G,0805,C50206
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6.8nF(682),±10%,50V,X7R,0805,C50208
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF,(225),±10%,50V,X7R,1206,C50254
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±5%,50V,X7R,0603,C51203
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF,(331),±10%,50V,X7R,0805,C51207
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560pF(561),±10%,50V,X7R,0805,C51208
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,50V,X7R,0805,C51210
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uF(335),±10%,10V,X5R,0603,C51412
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 150nF(154),±10%,10V,X5R,0402,C51554
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 15nF(153),±10%,50V,X7R,0805,C52412
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF,(105),±10%,25V,X5R,0402,C52923
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1.8nF(182),±10%,50V,X7R,0402,C5296
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47nF,(473),±10%,50V,X7R,0805,C53134
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF,(681),±10%,50V,X7R,0805,C53150
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 820pF(821),±10%,50V,X7R,0805,C53154
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF,(221),±10%,50V,X7R,0805,C53172
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nF,(332),±10%,50V,X7R,0805,C53175
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 39pF(390),±5%,50V,C0G,0603,C53278
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,2KV,1206,C53737
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 7pF(070),±0.5pF,50V,C0G,0603,C53775
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF,(224),±10%,50V,X7R,0805,C5378
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF,(472),±10%,50V,X7R,0603,C53987
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560pF(561),±5%,50V,C0G,0603,C55393
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nF(332),±5%,50V,C0G,0603,C55395
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF(226),±10%,10V,X5R,1206,C5672
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1uF(105),±10%,25V,X5R,0603,C5673
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF,(103),±10%,50V,X7R,0603,C57112
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7pF(4R7),±0.25pF,50V,C0G,0603,C57140
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2uF(225),±10%,25V,X5R,0603,C57895
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF,(226),±20%,6.3V,X5R,0603,C59461
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±10%,100V,X7R,0805,C61096
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220pF(221),±5%,50V,C0G,0805,C61747
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 62pF(620),±5%,50V,C0G,0603,C62683
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 1nF(102),±10%,50V,X7R,0603_x4,C62856
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±5%,50V,X7R,0805,C62912
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180pF(181),±5%,50V,C0G,0805,C62914
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,50V,X7R,0805,C64592
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 220nF(224),±10%,50V,X7R,0603,C64705
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3uF(335),±10%,25V,X5R,1206,C66012
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6pF,(6R0),±0.25pF,50V,C0G,0805,C67560
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47uF(476),±20%,6.3V,X5R,1206,C68361
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7uF(475),±10%,25V,X5R,0603,C69335
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22pF(220),±5%,50V,C0G,0402,C70464
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 33pF(330),±5%,50V,C0G,0402,C70465
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680nF(684),±10%,16V,X7R,0805,C71069
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±5%,50V,X7R,0603,C7248
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100nF(104),±10%,250V,X7R,1206,C73745
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3nF(332),±5%,50V,C0G,0805,C76473
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF,(103),±5%,50V,C0G,0603,C76710
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120pF(121),±5%,50V,C0G,0402,C76949
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47uF(476),±10%,16V,X5R,1210,C77101
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200pF(201),±10%,50V,X7R,0603,C77394
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 27pF,(270),±5%,50V,C0G,0805,C8031
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2nF(222),±10%,50V,X7R,0402,C84703
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7nF(272),±10%,50V,X7R,0402,C84704
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7nF(472),±10%,50V,X7R,0402,C84705
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 47pF(470),±5%,50V,C0G,0402,C84706
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 56pF(560),±5%,50V,C0G,0402,C84707
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,100V,X7R,0603,C84709
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.2pF(2R2),±0.25pF,50V,C0G,0603,C84711
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 2.7nF(272),±10%,50V,X7R,0603,C84713
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10nF(103),±10%,50V,X7R,0805,C84715
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470pF(471),±10%,50V,X7R,0805,C84717
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 390pF(391),±10%,50V,X7R,0603,C84719
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 560pF(561),±10%,50V,X7R,0603,C84721
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 680pF(681),±10%,50V,X7R,0603,C84722
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 6800pF(682),±10%,50V,X7R,0603,C84723
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120pF(121),±10%,50V,X7R,0603,C85298
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 180pF(181),±10%,50V,X7R,0603,C85299
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.3pF(3R3),±0.25pF,50V,C0G,0603,C85300
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.6pF(3R6),±0.25pF,50V,C0G,0603,C85301
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 3.9pF(3R9),±0.25pF,50V,C0G,0603,C85302
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 200pF(201),±10%,50V,X7R,0805,C85303
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 4.7pF(4R7),±0.25pF,50V,C0G,0805,C85304
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 330pF(331),±10%,50V,X7R,0603,C85310
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 100pF(101),±5%,100V,C0G,0603,C85983
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 0.5pF(R50),±0.25pF,50V,C0G,0402,C86284
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 22uF(226),±20%,10V,X5R,0603,C86295
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,50V,X7R,1206,C89632
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±10%,25V,X7R,1206,C90538
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 120pF(121),±5%,50V,C0G,0603,C90723
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 470nF(474),±10%,25V,X5R,0402,C92361
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 5pF(050),±0.25pF,50V,C0G,0603,C93045
D test description,
K test key,
F ~
$ENDCMP
#
$CMP 10uF(106),±20%,25V,X5R,0603,C96446
D test description,
K test key,
F ~
$ENDCMP
#End Doc Library