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bibliography.bib
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bibliography.bib
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@article{brewick2019nlpar,
author = {Brewick, Patrick T. and Wright, Stuart I. and Rowenhorst, David J.},
doi = {10.1016/j.ultramic.2019.02.013},
journal = {Ultramicroscopy},
pages = {50–61},
title = {{NLPAR: Non-local smoothing for enhanced EBSD pattern indexing}},
volume = {200},
year = {2019}
}
@article{britton2016tutorial,
author = {Britton, T. B. and Jiang, J. and Guo, Y. and Vilalta-Clemente, A. and Wallis, D. and Hansen, L. N. and Winkelmann, Aimo and Wilkinson, Angus J.},
doi = {10.1016/j.matchar.2016.04.008},
isbn = {1044-5803},
issn = {10445803},
journal = {Materials Characterization},
keywords = {Crystal orientation, Electron backscatter diffraction, Electron microscopy, Texture, ebsd, indexing},
pages = {113–126},
publisher = {The Authors},
title = {{Tutorial: Crystal orientations and EBSD - Or which way is up?}},
volume = {117},
year = {2016}
}
@article{callahan2013dynamical,
author = {Callahan, Patrick G. and {De Graef}, Marc},
doi = {10.1017/S1431927613001840},
isbn = {1431927613001},
journal = {Microscopy and Microanalysis},
keywords = {dynamic electron scattering, ebsd, ebsd simulation, electron backscatter diffraction, energy-filtered ebsd, lambert projection, monte carlo simulation},
pages = {1255–1265},
title = {{Dynamical Electron Backscatter Diffraction Patterns. Part I: Pattern Simulations}},
year = {2013}
}
@article{chen2015dictionary,
author = {Chen, Yu H. and Park, Se Un and Wei, Dennis and Newstadt, Greg and Jackson, Michael A. and Simmons, Jeff P. and {De Graef}, Marc and Hero, Alfred O.},
doi = {10.1017/S1431927615000756},
issn = {14358115},
journal = {Microscopy and Microanalysis},
keywords = {EBSD, Von Mises-Fisher mixture distribution, dictionary matching, dynamical electron scattering, electron backscatter diffraction pattern, maximum likelihood orientation estimates},
number = {3},
pages = {739–752},
title = {{A Dictionary Approach to Electron Backscatter Diffraction Indexing}},
volume = {21},
year = {2015}
}
@article{foden2019indexing,
author = {Foden, Alexander and Collins, David M. and Wilkinson, Angus J. and Britton, Thomas B.},
journal = {Ultramicroscopy},
pages = {112845},
publisher = {Elsevier},
title = {{Indexing electron backscatter diffraction patterns with a refined template matching approach}},
doi = {10.1016/j.ultramic.2019.112845},
volume = {207},
year = {2019}
}
@book{gonzalez2017digital,
author = {Gonzalez, Rafael C. and Woods, Richard E.},
edition = {4th},
isbn = {978-0133356724},
keywords = {image processng, computer vision},
publisher = {Pearson Education Limited},
title = {{Digital Image Processing}},
year = {2017}
}
@book{goshtasby2012image,
author = {Goshtasby, Ardeshir A.},
publisher = {Springer Science \& Business Media},
title = {{Image registration: Principles, tools and methods}},
year = {2012}
}
@article{hjelen1991electron,
author = {Hjelen, Jarle and Hoel, Eivind and Ørsund, Roar},
doi = {10.1016/0739-6260(91)90128-M},
journal = {Micron and Microscopica Acta},
keywords = {ebsd, indexing},
number = {1-2},
pages = {137–138},
publisher = {Pergamon},
title = {{Electron diffraction in the SEM}},
volume = {22},
year = {1991}
}
@article{jackson2014h5ebsd,
author = {Jackson, Michael A. and Groeber, Michael A. and Uchic, Michael D. and Rowenhorst, David J. and {De Graef}, Marc},
doi = {10.1186/2193-9772-3-4},
journal = {Integrating Materials and Manufacturing Innovation},
keywords = {h5ebsd, hdf5, ebsd, emsoft},
number = {1},
pages = {4},
publisher = {Springer},
title = {{h5ebsd: an archival data format for electron back-scatter diffraction data sets}},
volume = {3},
year = {2014}
}
@article{jackson2019dictionary,
author = {Jackson, Michael A. and Pascal, Elena and {De Graef}, Marc},
journal = {Integrating Materials and Manufacturing Innovation},
pages = {1–21},
publisher = {Springer},
title = {{Dictionary Indexing of Electron Back-Scatter Diffraction Patterns: a Hands-On Tutorial}},
year = {2019},
doi = {10.1007/s40192-019-00137-4},
}
@phdthesis{lassen1994automated,
author = {Lassen, Niels Christian Krieger},
school = {Institute of Mathematical Modelling},
title = {{Automated Determanation of Crystal Orientations from Electron Backscattering Patterns}},
year = {1994}
}
@article{marquardt2017quantitative,
author = {Marquardt, Katharina and {De Graef}, Marc and Singh, Saransh and Marquardt, Hauke and Rosenthal, Anja and Koizuimi, Sanae},
doi = {10.2138/am-2017-6062},
issn = {19453027},
journal = {American Mineralogist},
keywords = {electron backscatter diffraction, dictionary indexing, indexing},
number = {9},
pages = {1843–1855},
title = {{Quantitative electron backscatter diffraction (EBSD) data analyses using the dictionary indexing (DI) approach: Overcoming indexing difficulties on geological materials}},
volume = {102},
year = {2017}
}
@article{nolze2016pattern,
author = {Nolze, Gert and Winkelmann, Aimo and Boyle, Alan P.},
doi = {10.1016/j.ultramic.2015.10.010},
journal = {Ultramicroscopy},
pages = {146–154},
publisher = {Elsevier},
title = {{Pattern matching approach to pseudosymmetry problems in electron backscatter diffraction}},
volume = {160},
year = {2016}
}
@article{nolze2017electron,
author = {Nolze, Gert and Hielscher, Ralf and Winkelmann, Aimo},
doi = {10.1002/crat.201600252},
isbn = {0232-1300},
issn = {15214079},
journal = {Crystal Research and Technology},
keywords = {channeling-in and out, ebsd, element number contrast, image{\_}processing, indexing, lattice parameters, polarity, pseudosymmetry, virtual{\_}imaging},
number = {1},
pages = {1–24},
title = {{Electron backscatter diffraction beyond the mainstream}},
volume = {52},
year = {2017}
}
@article{pang2020optimization,
title = {Global optimization for accurate determination of EBSD pattern centers},
volume = {209},
ISSN = {0304-3991},
DOI = {10.1016/j.ultramic.2019.112876},
journal = {Ultramicroscopy},
publisher = {Ultramicroscopy},
author = {Pang, Edward L. and Larsen, Peter M. and Schuh, Christopher A.},
year = {2020},
pages = {112876}
}
@article{singh2017application,
author = {Singh, Saransh and Ram, Farangis and {De Graef}, Marc},
doi = {10.1107/S1600576717014200},
journal = {Journal of Applied Crystallography},
number = {6},
pages = {1664–1676},
publisher = {International Union of Crystallography},
title = {{Application of forward models to crystal orientation refinement}},
volume = {50},
year = {2017}
}
@article{wilkinson2006high,
author = {Wilkinson, Angus J. and Meaden, Graham and Dingley, David J.},
doi = {10.1016/j.ultramic.2005.10.001},
isbn = {0123739071},
issn = {03043991},
journal = {Ultramicroscopy},
keywords = {electron backscatter diffraction, strain, stress, high-resolution electron backscatter diffraction, fast fourier transform},
number = {4-5},
pages = {307–313},
title = {{High-resolution elastic strain measurement from electron backscatter diffraction patterns: New levels of sensitivity}},
volume = {106},
year = {2006}
}
@article{winkelmann2020refined,
author = {Winkelmann, Aimo and Nolze, Gert and Cios, Grzegorz and Tokarski, Tomasz and Bała, Piotr},
doi = {10.3390/ma13122816},
journal = {Materials},
number = {12},
pages = {2816},
publisher = {Multidisciplinary Digital Publishing Institute},
title = {{Refined Calibration Model for Improving the Orientation Precision of Electron Backscatter Diffraction Maps}},
volume = {13},
year = {2020}
}
@article{wright2015introduction,
author = {Wright, Stuart I. and Nowell, Matthew M. and Lindeman, Scott P. and Camus, Patrick P. and {De Graef}, Marc and Jackson, Michael A.},
doi = {10.1016/j.ultramic.2015.08.001},
issn = {18792723},
journal = {Ultramicroscopy},
keywords = {EBSD, Electron Backscatter Diffraction, indexing, orientation{\_}averaging},
pages = {81–94},
pmid = {26342553},
publisher = {Elsevier},
title = {{Introduction and comparison of new EBSD post-processing methodologies}},
volume = {159},
year = {2015}
}
@article{wright2015electron,
author = {Wright, Stuart I. and Nowell, Matthew M. and {De Kloe}, René and Camus, Patrick and Rampton, Travis},
doi = {10.1016/j.ultramic.2014.10.002},
isbn = {0304-3991},
issn = {18792723},
journal = {Ultramicroscopy},
keywords = {EBSD, Electron imaging, PRIAS, Synthetic-BSD, Virtual FSD, ebsd},
pages = {132–145},
pmid = {25461590},
publisher = {Elsevier},
title = {{Electron imaging with an EBSD detector}},
volume = {148},
year = {2015}
}
@book{aanes2019electron,
author = {Ånes, Håkon W. and Hjelen, Jarle and van Helvoort, Antonius T. J. and Marthinsen, Knut},
title = {{Electron backscatter patterns from Nickel acquired with varying camera gain}},
year = 2019,
note = {[Data set].},
publisher = {Zenodo},
doi = {10.5281/zenodo.3265037},
}
@inproceedings{aanes2020processing,
author = {Ånes, HW and Hjelen, J and Sørensen, BE and van Helvoort, ATJ and Marthinsen, K},
booktitle = {{IOP Conference Series: Materials Science and Engineering}},
doi = {10.1088/1757-899X/891/1/012002},
number = {1},
organization = {IOP Publishing},
pages = {012002},
title = {{Processing and indexing of electron backscatter patterns using open-source software}},
volume = {891},
year = {2020}
}