Various small test changes #183
Merged
Conversation
This file contains bidirectional Unicode text that may be interpreted or compiled differently than what appears below. To review, open the file in an editor that reveals hidden Unicode characters.
Learn more about bidirectional Unicode characters
|
It's expected that several devicefactory tests fail without #182. |
|
Looks good to me otherwise. |
They are prone to breaking and leaving a mess on the test system. They should be converted to use a vm to eliminate tainting (or being tainted by) other tests.
Sign up for free
to join this conversation on GitHub.
Already have an account?
Sign in to comment
Add this suggestion to a batch that can be applied as a single commit.
This suggestion is invalid because no changes were made to the code.
Suggestions cannot be applied while the pull request is closed.
Suggestions cannot be applied while viewing a subset of changes.
Only one suggestion per line can be applied in a batch.
Add this suggestion to a batch that can be applied as a single commit.
Applying suggestions on deleted lines is not supported.
You must change the existing code in this line in order to create a valid suggestion.
Outdated suggestions cannot be applied.
This suggestion has been applied or marked resolved.
Suggestions cannot be applied from pending reviews.
Suggestions cannot be applied on multi-line comments.
Suggestions cannot be applied while the pull request is queued to merge.
Suggestion cannot be applied right now. Please check back later.
Improvement of loop device cleanup and disabling of image-backed tests are so we can start running the test suite in jenkins again, @clumens.
The device factory tests fail without the changes from #182. They increase coverage of devicefactory.py from 19% to 74% (IIRC).