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Upon a fault trip, it would be beneficial if the list of faults is stored in the flash memory for later inspection. This will allow for more accurate debugging of issues happening in the field.
Care must be taken to avoid corruptions in cases of extreme EMI or supply voltage sag, common under a fault condition.
The text was updated successfully, but these errors were encountered:
Upon a fault trip, it would be beneficial if the list of faults is stored in the flash memory for later inspection. This will allow for more accurate debugging of issues happening in the field.
Care must be taken to avoid corruptions in cases of extreme EMI or supply voltage sag, common under a fault condition.
The text was updated successfully, but these errors were encountered: