FPGA tests: SPI test cases order issue

[yarbcy]

Description of defect

FPGA tests: SPI test case order issue

@0xc0170 @mprse

I run SPI tests.

Case cases[] = {
// This will be run for all pins
Case("SPI - init/free test all pins", all_ports<SPIPort, DefaultFormFactor, spi_test_init_free>),

// This will be run for all peripherals
Case("SPI - basic test", all_peripherals<SPIPort, DefaultFormFactor, spi_test_common<SPITester::Mode0, 8, TRANSFER_SPI_MASTER_WRITE_SYNC, FREQ_1_MHZ> >),

Expected is to PASS 2 test cases. First passed, second failed.
When I run them separatelly - each of them passed.

Target(s) affected by this defect ?

Tested on CY8CKIT_062_WIFI_BT

Toolchain(s) (name and version) displaying this defect ?

Tested on GCC_ARM

What version of Mbed-os are you using (tag or sha) ?

Latest

What version(s) of tools are you using. List all that apply (E.g. mbed-cli)

N/N

How is this defect reproduced ?

Always.

[ciarmcom]

Internal Jira reference: https://jira.arm.com/browse/MBOTRIAGE-2282

[yarbcy]

@0xc0170 Could you please take a look?

[0xc0170]

@0xc0170 Could you please take a look?

@ARMmbed/mbed-os-hal to review

[mprse]

This also looks like a problem with releasing the peripheral. @yarbcy How the test fails? Can you provide the output?

[yarbcy]

@mprse Looks like the problem is different. Now working on debug. Close this issue.