Fixes key mapping

FAIRmat-NFDI · Jun 1, 2023 · 675b646 · 675b646
1 parent 8196a8d
commit 675b646
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Showing 3 changed files with 9 additions and 7 deletions.
diff --git a/examples/ellipsometry/eln_data.yaml b/examples/ellipsometry/eln_data.yaml
@@ -2,7 +2,7 @@ Data:
   data_identifier: 1
   data_software: WVASE
   data_software/@url: https://www.jawoollam.com/ellipsometry-software/wvase
-  data_software/@version: '3.882'
+  data_software/version: '3.882'
   data_type: Psi/Delta
   spectrum_type: wavelength
   spectrum_unit: Angstroms
@@ -35,9 +35,10 @@ Instrument:
   rotating_element_type: compensator (source side)
   software: CompleteEASE
   software/@url: https://www.jawoollam.com/ellipsometry-software/completeease
-  software/@version: '6.37'
+  software/version: '6.37'
 Sample:
   atom_types: Si, O
+  backside_roughness: false
   chemical_formula: SiO2
   layer_structure: 2nm SiO2 on Si
   sample_history: Commercially purchased sample
@@ -68,4 +69,4 @@ filename: test-data.dat
 plot_name: Psi and Delta
 sep: \t
 skip: 3
-start_time: '2022-01-27T03:35:00+00:00'
+start_time: '2022-01-27T03:35:00+00:00'
diff --git a/pynxtools/dataconverter/readers/ellips/reader.py b/pynxtools/dataconverter/readers/ellips/reader.py
@@ -40,7 +40,7 @@
     'Environment': 'environment_conditions',
     'Instrument': 'INSTRUMENT[instrument]',
     'Sample': 'SAMPLE[sample]',
-    'Stage': 'sample_stage',
+    'Sample_stage': 'sample_stage',
     'User': 'USER[user]',
     'Instrument/angle_of_incidence': 'INSTRUMENT[instrument]/angle_of_incidence',
     'Instrument/angle_of_incidence/unit': 'INSTRUMENT[instrument]/angle_of_incidence/@units',

diff --git a/tests/data/dataconverter/readers/ellips/eln_data.yaml b/tests/data/dataconverter/readers/ellips/eln_data.yaml
@@ -2,7 +2,7 @@ Data:
   data_identifier: 1
   data_software: WVASE
   data_software/@url: https://www.jawoollam.com/ellipsometry-software/wvase
-  data_software/@version: '3.882'
+  data_software/version: '3.882'
   data_type: Psi/Delta
   spectrum_type: wavelength
   spectrum_unit: Angstroms
@@ -35,9 +35,10 @@ Instrument:
   rotating_element_type: compensator (source side)
   software: CompleteEASE
   software/@url: https://www.jawoollam.com/ellipsometry-software/completeease
-  software/@version: '6.37'
+  software/version: '6.37'
 Sample:
   atom_types: Si, O
+  backside_roughness: false
   chemical_formula: SiO2
   layer_structure: 2nm SiO2 on Si
   sample_history: Commercially purchased sample
@@ -68,4 +69,4 @@ filename: test-data.dat
 plot_name: Psi and Delta
 sep: \t
 skip: 3
-start_time: '2022-01-27T03:35:00+00:00'
+start_time: '2022-01-27T03:35:00+00:00'