In the semiconductor manufacturing, the reliability and integrity of the integrated circuits (ICs) are especially critical to the automotive and aerospace industries whereby any premature failure will lead to catastrophic consequences. The test process is the last quality gate before the ICs are shipped to the customers, and thus it is most important process in the whole manufacturing chain to ensure that there are no defect being shipped out.
Many companies place high emphasis on quality management and achieving ‘zero defect’. In quality management, the 6-sigma process control is widely used to improve quality and eliminate defects. When the lot (batch of ICs) does not meet the quality and customer requirements, the process control will flag and stop the lot from proceeding on to the packing process and the lot will be on hold (LOH). The LOH will then be sent for further investigation to assess its risk and understand the cause of the deviation which may arise due to product or process-related problems.
Official Full Name | Student ID (MTech Applicable) | Work Items (Who Did What) | Email (Optional) |
---|---|---|---|
CH'NG WEI LUEN | A0195251E | Prepare and extract data for system development, interview respective domains & design the rule requirement for each sub-goals. Provided executable scripts and decision table to perform rule workflow; responsible for knowledge modelling (specification &refinement), drafted business process flow | e0384882@u.nus.edu |
LIM LI WEI | A0087855L | Feasibility Study with JBPM and Software Testing, Recommending and Exploring Solutions for Development, Helped with Drafting System Features and Conclusion in Report, Logo/Background design and integration. | e0319479@u.nus.edu |
PAMELA LIN YAN LING | A0196413A | Provided problem domain with real industrial application and provided real data; responsible for knowledge modelling (identification & specification) – designing activity flow chart, data attribute, inference diagram, rule table for each sub-goals | e0388053@u.nus.edu |
PREM S/O PIRAPALA CHANDRAN | A0195324A | Integrated different sections of report from group members to create flow in group report. Wrote executive summary and aspects of conclusion. Proof read report. Designed front end skin banner for the interface design. | e0384955@u.nus.edu |
YE CHANGHE | A0150138N | Core developer of Jbpm and Java,model implement, workfolw implement and combination, Decision table enhancement, runable script combination and testing, end-to end testing and test case part in report, Git Repo management. | e0015120@u.nus.edu |
ZHANG HAIHAN | A0150701X | Developer of Jbpm and Java ,model optimization, rule optimization and implement,end-to-end testing and test case,user guide, git file management and helped solution part in report. | e0015787@u.nus.edu |
<Github File Link>
: https://github.com/teamHexMtech/IRS-MR-2019-01-19-ISY5001-GRP-HEX-LOH_Disposition_Decision-Making_Process_System/blob/master/UserGuide/User%20Guide%20with%20Sample%20Case.pdf
download pre-built virtual machine from http://bit.ly/iss-vm
start iss-vm
open terminal in iss-vm
run KIE server
Go to URL using web browser http://localhost:8080/console-jbpm
<Github File Link>
: https://github.com/teamHexMtech/IRS-MR-2019-01-19-ISY5001-GRP-HEX-LOH_Disposition_Decision-Making_Process_System/blob/master/ProjectReport/Lot%20Disposition%20Recommendation%20Report.pdf
- commonality_test.R (Required by project)
- lotList.csv (Required by project)
- rawData.csv (Required by project)
- Skin.zip