Wrap errors for embedded-hal trait implementations #30
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The current implementations of the
OutputPin
,InputPin
andStatefulOutputPin
traits require thatPortDriver::Error
implementsembedded_hal::digital::Error
, which is never going to be the case. Thus, these traits are never usable.Here is a small example that should result in lots of compiler errors because of unsatisfied trait bounds:
This change wraps the error type used in
ErrorKind::Error
in a wrapper structPinError<BE>
which implementsembedded_hal::digital::Error
. Like this all upstream errors that arecore::fmt::Debug
should be compatible withembedded-hal
.The return types for
Pin::set_high()
andOutputPin::set_high()
are different now, since the returned error from thePin
implementation do not wrap errors inPinError
. This could cause problems, so maybe it's a good idea to wrap these errors as well?