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Add LPSPI sampling configuration API
Expose a public method to allow users to change sampling point of an LPSPI peripheral. I've experienced RX FIFO overruns when the SAMPLE: SAMPLE_1 (delayed edge) is used with non-hardware controlled chip select pins (ie, manually driving a CS pin with GPIO embedded_hal traits). Changing this configuration setting to SAMPLE_0 fixed the issue. Tested on a Teensy 4.0 and 4.1.
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