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[DAGCombiner] try to form test+set out of shift+mask patterns
The motivating bugs are: https://bugs.llvm.org/show_bug.cgi?id=41340 https://bugs.llvm.org/show_bug.cgi?id=42697 As discussed there, we could view this as a failure of IR canonicalization, but then we would need to implement a backend fixup with target overrides to get this right in all cases. Instead, we can just view this as a codegen opportunity. It's not even clear for x86 exactly when we should favor test+set; some CPUs have better theoretical throughput for the ALU ops than bt/test. This patch is made more complicated than I expected because there's an early DAGCombine for 'and' that can change types of the intermediate ops via trunc+anyext. Differential Revision: https://reviews.llvm.org/D66687 llvm-svn: 370668
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