[InstCombine] add tests for icmp with trunc op; NFC

llvm · Nov 3, 2021 · d18b7ea · d18b7ea
1 parent 34b903d
commit d18b7ea
Showing 1 changed file with 50 additions and 12 deletions.
diff --git a/llvm/test/Transforms/InstCombine/icmp-trunc.ll b/llvm/test/Transforms/InstCombine/icmp-trunc.ll
@@ -91,8 +91,6 @@ define <2 x i1> @ult_2044_splat(<2 x i16> %x) {
   ret <2 x i1> %r
 }
 
-; negative test - need high-bit-mask constant
-
 define i1 @ult_96(i32 %x) {
 ; CHECK-LABEL: @ult_96(
 ; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
@@ -104,8 +102,6 @@ define i1 @ult_96(i32 %x) {
   ret i1 %r
 }
 
-; negative test - no extra use allowed
-
 define i1 @ult_192_use(i32 %x) {
 ; CHECK-LABEL: @ult_192_use(
 ; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
@@ -119,6 +115,52 @@ define i1 @ult_192_use(i32 %x) {
   ret i1 %r
 }
 
+define i1 @ugt_3(i32 %x) {
+; CHECK-LABEL: @ugt_3(
+; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
+; CHECK-NEXT:    [[R:%.*]] = icmp ugt i8 [[T]], 3
+; CHECK-NEXT:    ret i1 [[R]]
+;
+  %t = trunc i32 %x to i8
+  %r = icmp ugt i8 %t, 3
+  ret i1 %r
+}
+
+define <2 x i1> @ugt_7_splat(<2 x i16> %x) {
+; CHECK-LABEL: @ugt_7_splat(
+; CHECK-NEXT:    [[T:%.*]] = trunc <2 x i16> [[X:%.*]] to <2 x i11>
+; CHECK-NEXT:    [[R:%.*]] = icmp ugt <2 x i11> [[T]], <i11 7, i11 7>
+; CHECK-NEXT:    ret <2 x i1> [[R]]
+;
+  %t = trunc <2 x i16> %x to <2 x i11>
+  %r = icmp ugt <2 x i11> %t, <i11 7, i11 7>
+  ret <2 x i1> %r
+}
+
+define i1 @ugt_4(i32 %x) {
+; CHECK-LABEL: @ugt_4(
+; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
+; CHECK-NEXT:    [[R:%.*]] = icmp ugt i8 [[T]], 4
+; CHECK-NEXT:    ret i1 [[R]]
+;
+  %t = trunc i32 %x to i8
+  %r = icmp ugt i8 %t, 4
+  ret i1 %r
+}
+
+define i1 @ugt_3_use(i32 %x) {
+; CHECK-LABEL: @ugt_3_use(
+; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
+; CHECK-NEXT:    call void @use(i8 [[T]])
+; CHECK-NEXT:    [[R:%.*]] = icmp ugt i8 [[T]], 3
+; CHECK-NEXT:    ret i1 [[R]]
+;
+  %t = trunc i32 %x to i8
+  call void @use(i8 %t)
+  %r = icmp ugt i8 %t, 3
+  ret i1 %r
+}
+
 define i1 @ugt_253(i32 %x) {
 ; CHECK-LABEL: @ugt_253(
 ; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
@@ -141,10 +183,8 @@ define <2 x i1> @ugt_239_splat(<2 x i16> %x) {
   ret <2 x i1> %r
 }
 
-; negative test - need inverted power-of-2 constant
-
-define i1 @ugt_3(i32 %x) {
-; CHECK-LABEL: @ugt_3(
+define i1 @ugt_252(i32 %x) {
+; CHECK-LABEL: @ugt_252(
 ; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
 ; CHECK-NEXT:    [[R:%.*]] = icmp ugt i8 [[T]], -4
 ; CHECK-NEXT:    ret i1 [[R]]
@@ -154,10 +194,8 @@ define i1 @ugt_3(i32 %x) {
   ret i1 %r
 }
 
-; negative test - no extra use allowed
-
-define i1 @ugt_2_use(i32 %x) {
-; CHECK-LABEL: @ugt_2_use(
+define i1 @ugt_253_use(i32 %x) {
+; CHECK-LABEL: @ugt_253_use(
 ; CHECK-NEXT:    [[T:%.*]] = trunc i32 [[X:%.*]] to i8
 ; CHECK-NEXT:    call void @use(i8 [[T]])
 ; CHECK-NEXT:    [[R:%.*]] = icmp ugt i8 [[T]], -3