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NXlab_sample_mounting.nxdl.xml
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NXlab_sample_mounting.nxdl.xml
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<?xml version="1.0" encoding="UTF-8"?>
<?xml-stylesheet type="text/xsl" href="nxdlformat.xsl"?>
<!--
# NeXus - Neutron and X-ray Common Data Format
#
# Copyright (C) 2014-2024 NeXus International Advisory Committee (NIAC)
#
# This library is free software; you can redistribute it and/or
# modify it under the terms of the GNU Lesser General Public
# License as published by the Free Software Foundation; either
# version 3 of the License, or (at your option) any later version.
#
# This library is distributed in the hope that it will be useful,
# but WITHOUT ANY WARRANTY; without even the implied warranty of
# MERCHANTABILITY or FITNESS FOR A PARTICULAR PURPOSE. See the GNU
# Lesser General Public License for more details.
#
# You should have received a copy of the GNU Lesser General Public
# License along with this library; if not, write to the Free Software
# Foundation, Inc., 59 Temple Place, Suite 330, Boston, MA 02111-1307 USA
#
# For further information, see http://www.nexusformat.org
-->
<definition xmlns="http://definition.nexusformat.org/nxdl/3.1" xmlns:xsi="http://www.w3.org/2001/XMLSchema-instance" category="application" name="NXlab_sample_mounting" extends="NXobject" type="group" xsi:schemaLocation="http://definition.nexusformat.org/nxdl/3.1 ../nxdl.xsd">
<symbols>
<doc>
The symbols used in the schema to specify e.g. dimensions of arrays.
</doc>
</symbols>
<doc>
Embedding of a sample in a medium for easing processability.
</doc>
<group type="NXentry">
<!--by default for appdefs the value of the exists keyword is required unless it is explicitly specified differently-->
<attribute name="version">
<doc>
Version specifier of this application definition.
</doc>
</attribute>
<field name="definition">
<doc>
Official NeXus NXDL schema with which this file was written.
</doc>
<enumeration>
<item value="NXlab_sample_mounting"/>
</enumeration>
</field>
<group name="SAMPLE" type="NXsample" minOccurs="1" maxOccurs="1"/>
<group name="USER" type="NXuser" minOccurs="1" maxOccurs="unbounded"/>
<field name="start_time" type="NX_DATE_TIME"/>
<field name="end_time" type="NX_DATE_TIME"/>
<!--(NXlab_mounting_machine):-->
<group name="mounting_machine" type="NXfabrication">
<field name="vendor"/>
<field name="model"/>
<field name="identifier" recommended="true"/>
</group>
<field name="mounting_method">
<doc>
Qualitative statement how the sample was mounted.
</doc>
<enumeration>
<item value="cold_mounting"/>
<item value="hot_mounting"/>
</enumeration>
</field>
<field name="embedding_medium">
<doc>
Type of material.
</doc>
<enumeration>
<item value="resin"/>
<item value="epoxy"/>
</enumeration>
</field>
<field name="electrical_conductivity" type="NX_FLOAT" units="NX_ANY">
<doc>
Electrical conductivity of the embedding medium.
</doc>
</field>
</group>
<!--temperature control of the mounting (e.g. relevant when hot_mounting Al)
cleaning procedures
a descriptor of the shape of the specimen
borrow from NXlab_thermo_mechanical_processing to document the external
stimuli (eventually) applied during mounting
temperature, mechanical, magnetic, electro-magnetic, are externally
applied stimuli on the sample, can we use one master schema?
e.g. one can even store NXcg_polyhedron_set and NXcg_face_list_data_structure
instances to keep track of the geometry of specific instrument and how
the samples were arranged in these
key question is which steps has the sample experienced?-->
</definition>