CHArge artiFact supprEssion tool for scanning electRon microscope images
Contains:
- charge artefact suppression filter for 2D and 3D SEM images - requires respective charge centres to be segmented in a separate file
- functions for upscaling 3D data along X and Y axis, and preserving along Z axis
- unet (fastai) predictor - requires model file
Folder /samples contains data samples and notebooks examples of usage.