Skip to content
New issue

Have a question about this project? Sign up for a free GitHub account to open an issue and contact its maintainers and the community.

By clicking “Sign up for GitHub”, you agree to our terms of service and privacy statement. We’ll occasionally send you account related emails.

Already on GitHub? Sign in to your account

【工具推荐】IEEE 754 双精度浮点数内部可视化展示 #2253

Open
shfshanyue opened this issue Mar 9, 2022 · 0 comments
Open

Comments

@shfshanyue
Copy link

shfshanyue commented Mar 9, 2022

image

展示 IEEE754 下双精度浮点数的内部表示,对 0.1 + 0.2 !== 0.3 问题理解更加深入。

地址: https://devtool.tech/double-type

Sign up for free to join this conversation on GitHub. Already have an account? Sign in to comment
Projects
None yet
Development

No branches or pull requests

2 participants