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JP-3365: Increase MOS cutout margin #7976

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merged 4 commits into from
Sep 27, 2023

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melanieclarke
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@melanieclarke melanieclarke commented Sep 26, 2023

Resolves JP-3365

Closes #7877

This PR addresses edge effects in resampling MOS slit cutouts by adding a couple extra pixels of WCS coverage at the top and bottom of each slit.

Checklist for maintainers

  • added entry in CHANGES.rst within the relevant release section
  • updated or added relevant tests
  • updated relevant documentation
  • added relevant milestone
  • added relevant label(s)
  • ran regression tests, post a link to the Jenkins job below.
    How to run regression tests on a PR
  • Make sure the JIRA ticket is resolved properly

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codecov bot commented Sep 26, 2023

Codecov Report

All modified lines are covered by tests ✅

Files Coverage Δ
jwst/assign_wcs/nirspec.py 93.66% <100.00%> (ø)

📢 Thoughts on this report? Let us know!.

@hbushouse hbushouse added this to the Future milestone Sep 27, 2023
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Started a regression test run against the PR branch at https://plwishmaster.stsci.edu:8081/job/RT/job/JWST-Developers-Pull-Requests/977 Expecting small differences in results for any MOS processing.

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Code updates are simple enough. Will wait for regtests to finish before final approval.

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Regression test results show a few unrelated failures (cause is known) and many expected differences in all MOS products beyond the stage where extract_2d has been run to extract individual slitlets. All cal, s2d, and other intermediate level-2b products show differences in the extraction region size, almost always an extra 4 pixels in the cross-dispersion direction (2 on top and bottom?), all of which seems reasonable. 1D extractions also show small differences due to inclusion of new edge pixel values. So I think this looks OK.

@hbushouse hbushouse merged commit 485223e into spacetelescope:master Sep 27, 2023
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@melanieclarke melanieclarke deleted the mos_cutout_margin branch October 2, 2023 13:57
@hbushouse hbushouse modified the milestones: Future, Build 10.0 Dec 7, 2023
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Resampling edge effects for off-center MOS targets
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