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lib/test_scanf: Handle n_bits == 0 in random tests
[ Upstream commit fe8e3ee ] UBSAN reported (via LKP) [ 11.021349][ T1] UBSAN: shift-out-of-bounds in lib/test_scanf.c:275:51 [ 11.022782][ T1] shift exponent 32 is too large for 32-bit type 'unsigned int' When n_bits == 0, the shift is out of range. Switch code to use GENMASK to handle this case. Fixes: 50f530e ("lib: test_scanf: Add tests for sscanf number conversion") Reported-by: kernel test robot <oliver.sang@intel.com> Signed-off-by: Andy Shevchenko <andriy.shevchenko@linux.intel.com> Reviewed-by: Richard Fitzgerald <rf@opensource.cirrus.com> Signed-off-by: Petr Mladek <pmladek@suse.com> Link: https://lore.kernel.org/r/20210727150132.28920-1-andriy.shevchenko@linux.intel.com Signed-off-by: Sasha Levin <sashal@kernel.org>
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