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Provide sanity test cases for NANO_ESF/NANO_ISF structures #2490
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by Sharron LIU: whitebox test point covered by development test. |
by Mark Linkmeyer: Fixing incorrect priority |
by Andrew Boie: Robert Beatty Mark Linkmeyer |
by Robert Beatty: Andrew Boie , moving to {{v1.9}} as there is not immediate commit for {{v1.8}} |
@andrewboie is this still need, should we assign to someone else to create tests? |
@nashif yes this should be tested. |
@kumarvikash1 please assign someone to create tests for this. |
@kumarvikash1 any updates on getting someone assigned for this? |
Is this still relevant? |
Reported by Andrew Boie:
These data structures depend heavily on the number and ordering that registers are pushed onto the stack during an exception and are susceptible to bit-rot. Devise a testcase for each target arch that verifies that the NANO_ESF and NANO_ISF structs created during exception/irq handling are laid out correctly.
Can probably do this by pre-populating the desired registers with sentinel values and then triggering the exception and verifying the state.
(Imported from Jira ZEP-985)
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