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drivers: si70xx: result bugfixes #5240
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TEST_I2C_ADDR ?= 128 | ||
TEST_PIN_EN ?= 57 | ||
TEST_I2C_ADDR ?= 0x80 | ||
TEST_PIN_EN ?= GPIO_PIN\(PD,9\) |
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I think it would make sense to choose something more generic here, as GPIO_PIN(0, 0)
, as PD
is not defined for every cpu...
changes look good, ACK once the comment above is addressed. |
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Addressed the issue and rebased. |
so let's see if Murdock it fine with this... |
Murdock is happy. Should I squash it into two commits (driver + test) or just one? |
@haukepetersen If #5231 get's merged first, I'll rebase onto that one once more. |
#5231 is merged, please rebase and let's merge this as soon as the CI is happy (again). |
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Murdock is happy. I already squashed it into one commit. |
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While testing #5231, I found two bugs that I should have seen earlier.
si70xx_get_relative_humidity
could wrap around, resulting in humidity 100% where it should be ~0%. ffe3fe3 fixes this.si70xx_get_revision
andsi70xx_get_serial
start with tainted buffers. In case of I2C failures, I noticed that it still passedsi70xx_test
because of exactly the right values in the buffers (possibly uncleared RAM). By clearing them on beforehand, they should return an invalid revision number or serial number. 08e7e3c fixes this.I also took the liberty of improving the test application.