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Igor Pro functions for helping analyzing LEEM/PEEM data. It can be used for extracting low-energy electron microscopy (LEEM) and photoelectron emission microscopy (PEEM) data. Image Loading package can extract header (i.e. micrometer x-y, temperature, OBJ, STV, and FOV) from Elmitec's proprietary .dat image format. The functionalities are divided in 4 parts:

LEEM/PEEM image loading Load Elmitec proprietary .dat files into image waves Browsing Extraction of header info. Set scale according to the FOV Stitching images into a larger one. NEXAFS data Currently only support SLRI's LEEM/PEEM format Load and display multiple NEXAFS spectra (different ROIs, or different scans) Immediately display I0-normalized spectra Automatic recipe for normalization Recipe modifications Dispersive XPS in PEEM Automatic searching for the dispersive line position with manual adjust Multiple data extraction from different positions along the dispersive line Dispersion factor adjustment Zero point energy adjustment Imaging XPS in PEEM Fit spectra pixel by pixel (better used with some binning) Currently supported 2 XPS peaks and secondary-electron yield cut-off (for workfunction mapping) Display up to six extracted parameter mapping More fitting modes, including NEXAFS, to be added in the future development Isochromaticity correction with fine adjustment (x,y,intensity,size,rotation) to correct peak position over the image field of view. A display of histogram for the parameter maps.