Igor Pro functions for helping analyzing LEEM/PEEM data. It can be used for extracting low-energy electron microscopy (LEEM) and photoelectron emission microscopy (PEEM) data. Image Loading package can extract header (i.e. micrometer x-y, temperature, OBJ, STV, and FOV) from Elmitec's proprietary .dat image format. The functionalities are divided in 4 parts:
- LEEM/PEEM image loading
- Load Elmitec proprietary .dat files into image waves
- Browsing
- Extraction of header info.
- Set scale according to the FOV
- Stitching images into a larger one.
- NEXAFS data
- Currently only support SLRI's LEEM/PEEM format
- Load and display multiple NEXAFS spectra (different ROIs, or different scans)
- Immediately display I0-normalized spectra
- Automatic recipe for normalization
- Recipe modifications
- Dispersive XPS in PEEM
- Automatic searching for the dispersive line position with manual adjust
- Multiple data extraction from different positions along the dispersive line
- Dispersion factor adjustment
- Zero point energy adjustment
- Imaging XPS in PEEM
- Fit spectra pixel by pixel (better used with some binning)
- Currently supported 2 XPS peaks and secondary-electron yield cut-off (for workfunction mapping)
- Display up to six extracted parameter mapping
- More fitting modes, including NEXAFS, to be added in the future development
- Isochromaticity correction with fine adjustment (x,y,intensity,size,rotation) to correct peak position over the image field of view.
- A display of histogram for the parameter maps.