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intel_spr_sde_test
fails now and then.
#23545
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Interesting, it doesn't always fail. Not sure why this happens but I am taking a look. |
sde_simd_avx512_test
fails now and then.intel_spr_sde_test
fails now and then.
I messed up the title here, the failing test is |
disabling the ci job until I figure out what's happening #23566 |
closing. #24268 fixes it. |
This is happening again, https://github.com/numpy/numpy/actions/runs/5716892291/job/15489817515?pr=24188 |
Taking a look. |
Looks like it was only partially fixed :( I found more AVX-512 use cases where the bug still persists. Will disable the test, again! Minimal reproducer:
Command to run in SDE: Output:
|
@r-devulap, The changes happens to reserved bits of x87 FPU control word, so |
My apologies; it wasn't the reserved bits, but rather the rounding control bits. Some AVX512(BW/DW) instructions exhibited a bug due to counting the FPU control to emulate on-the-fly(IMM rounding bits) rounding without restoring the previous state. |
SDE tests are enabled on TGL and SPR platforms. I can finally close this :) |
The basic cause seems to be due to changing fp mode
There are also some wrong results, but I suspect they are related to the fp mode.
See https://github.com/numpy/numpy/actions/runs/4631776714/jobs/8195205969?pr=23542 for more detail.
@r-devulap Thoughts?
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