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FUTURE_SEQUANA: failing to pass block device tests. #9620

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ithinuel opened this Issue Feb 5, 2019 · 6 comments

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ithinuel commented Feb 5, 2019

Description

mbed test -t GCC_ARM -m FUTURE_SEQUANA -n mbed-os-features-storage-tests-blockdevice-general_block_device -v fails with

[1549386440.54][CONN][RXD] >>> Running 8 test cases...
[1549386440.54][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing Init block device}}, queued...
[1549386440.54][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing read write random blocks}}, queued...
[1549386440.55][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing multi threads erase program read}}, queued...
[1549386440.55][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing contiguous erase, write and read}}, queued...
[1549386440.57][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing BlockDevice erase functionality}}, queued...
[1549386440.57][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing program read small data sizes}}, queued...
[1549386440.58][CONN][RXD]
[1549386440.58][CONN][RXD] >>> Running case #1: 'SD Testing Init block device'...
[1549386440.58][CONN][RXD]
[1549386440.58][CONN][INF] found KV pair in stream: {{__testcase_name;SD Testing Deinit block device}}, queued...
[1549386440.58][CONN][INF] found KV pair in stream: {{__testcase_name;DEFAULT Testing get type functionality}}, queued...
[1549386440.59][CONN][INF] found KV pair in stream: {{__testcase_start;SD Testing Init block device}}, queued...
[1549386440.60][CONN][RXD] Test Init block device.
[1549386440.60][CONN][RXD]
[1549386440.60][CONN][RXD]
[1549386440.60][CONN][RXD] ++ MbedOS Error Info ++
[1549386440.60][CONN][RXD] Error Status: 0x80FF0100 Code: 256 Module: 255
[1549386440.60][CONN][RXD] Error Message: Fatal Run-time error
[1549386440.60][CONN][RXD] Location: 0x1008AE07
[1549386440.60][CONN][RXD] Error Value: 0x0
[1549386440.61][CONN][RXD] Current Thread: main  Id: 0x8011B28 Entry: 0x10086BDD StackSize: 0x1770 StackMem: 0x80127D8 SP: 0x8013CF4
[1549386440.63][CONN][RXD] For more info, visit: https://mbed.com/s/error?error=0x80FF0100&tgt=FUTURE_SEQUANA
[1549386440.63][CONN][RXD] -- MbedOS Error Info --

Using mbed's cishield and this configuration :

"target.components_add"             : ["SD"],
"sd.SPI_MOSI"                       : "D11",
"sd.SPI_MISO"                       : "D12",
"sd.SPI_CLK"                        : "D13",
"sd.SPI_CS"                         : "D10",

Issue request type

[ ] Question
[ ] Enhancement
[x] Bug
@MarceloSalazar

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MarceloSalazar commented Feb 5, 2019

FYI @lrusinowicz
Let me know if you need more information to reproduce this

@ciarmcom ciarmcom added the type: bug label Feb 5, 2019

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ciarmcom commented Feb 5, 2019

@lrusinowicz

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lrusinowicz commented Feb 6, 2019

Using mbed's cishield

Which one is that?

"sd.SPI_CS" : "D10",

How does SD component use this signal? Does it try to configure it as hardware-controlled part of SPI object? This won't work at the moment; current HAL implementation supports only a single SS signal per interface and that's P9_3, available only on microBUS connector.
For other SS signals one has to resort to GPIO - I think #9469 could help here.
Trying to configure hardware SS signal on D10 will result in Mbed error generated in a HAL layer - likely reason of this failure.

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ithinuel commented Feb 6, 2019

The SD driver control the CS as a GPIO and do not pass it to the SPI driver.

The ci-test-shield is : https://github.com/ARMmbed/mbed-HDK-Eagle-Projects
But any micro sd adapter would do the trick, for example :

You may have to pay attention to the voltages supported by the host board and the µsd adapter.

lrusinowicz added a commit to lrusinowicz/mbed-os that referenced this issue Feb 8, 2019

FUTURE_SEQUANA: SPI HAL fixes
1. Removed random i/o glitches occurring during device reconfiguration
2. Fixed hazardous reads occurring at the end of transfer resulting
   in incorrect values being received
3. Added spi_free() function
4. Replaced default M0 image with a one ignoring i/o reservation. This is
   a workaround for missing proper destructors in Mbed drivers and BlockDevice
   tests failing on repeated initialization
Fixes issue ARMmbed#9620.
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cmonr commented Feb 11, 2019

@ithinuel Does #9647 resolve your issue?

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0xc0170 commented Feb 20, 2019

@ithinuel Does #9647 resolve your issue?

Should be, reopen if not

@0xc0170 0xc0170 closed this Feb 20, 2019

cmonr added a commit that referenced this issue Feb 21, 2019

FUTURE_SEQUANA: SPI HAL fixes
1. Removed random i/o glitches occurring during device reconfiguration
2. Fixed hazardous reads occurring at the end of transfer resulting
   in incorrect values being received
3. Added spi_free() function
4. Replaced default M0 image with a one ignoring i/o reservation. This is
   a workaround for missing proper destructors in Mbed drivers and BlockDevice
   tests failing on repeated initialization
Fixes issue #9620.

rajkan01 added a commit to rajkan01/mbed-os that referenced this issue Mar 7, 2019

FUTURE_SEQUANA: SPI HAL fixes
1. Removed random i/o glitches occurring during device reconfiguration
2. Fixed hazardous reads occurring at the end of transfer resulting
   in incorrect values being received
3. Added spi_free() function
4. Replaced default M0 image with a one ignoring i/o reservation. This is
   a workaround for missing proper destructors in Mbed drivers and BlockDevice
   tests failing on repeated initialization
Fixes issue ARMmbed#9620.
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