test(passport-sdk-writer): generate a new random DID for writer ceramic integration tests #15
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…ic integration tests When using the same DID for all test runs, the tests will eventually slow down and time out due to ever-increasing number of updates to apply. Replacing this with a newly generated DID each time results in fast-enough integration tests that pass more consistently.
gdixon
approved these changes
Jul 14, 2022
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test(passport-sdk-writer): generate a new random DID for writer ceramic integration tests
When using the same DID for all test runs, the tests will eventually
slow down and time out due to ever-increasing number of updates to
apply.
Replacing this with a newly generated DID each time results in fast-enough integration
tests that pass more consistently.