The aim of this repository is to house the metadata schemas for different measurement techniques used in Materials Science. The schemas are written according to the XML Schema Definition (XSD) or JavaScript Object Notation (JSON) format. Sample files are also provided which are written according to the respective schemas.
- Schema for scanning electron microscopy (SEM)
- JSON Schema
- Sample SEM Image
- Example JSON file
- XSD Schema - old version
- Example XML file
- Example XML file which is populated only with the required fields
- Schema for transmission electron microscopy (TEM)
- Schema for magnetic resonance imaging (MRI)
- General Schema for describing a user
- Schemas for Metadata contained in BAM reference dataset for creep tests
- Schemas for FIB/SEM serial sectioning tomography