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xtest regression 4007_ecc and 4011 leave generated keys behind #652
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Agreed. |
Is there an easy way to fix it? I'm not very familiar with xtest code but I think the missing bit is |
@jforissier I tried to fix the issue, but my knowledge of op-tee is very limited. The key pairs are generated on the se050 when tests call |
I don't have an answer but I believe @ldts can help. |
yes, it is borken with the regression xtests (not with the pkcs11 ones) : see OP-TEE/optee_os#5086 I suggest using some tool like https://github.com/foundriesio/fio-se05x-cli to clear the device nvm until we have a proposal to the issue above.. |
When running xtest on the device with secure element (SE050) some tests generate objects in the element. These objects are not deleted by the tests: OP-TEE/optee_test#652 In the long run secure element runs out of space and all tests start failing with strange errors. To mitigate this the script will call reset method on SE050 after all tests are completed. This should at least fix the problem of residual objects. Signed-off-by: Milosz Wasilewski <milosz.wasilewski@foundries.io>
When running xtest on the device with secure element (SE050) some tests generate objects in the element. These objects are not deleted by the tests: OP-TEE/optee_test#652 In the long run secure element runs out of space and all tests start failing with strange errors. To mitigate this the script will call reset method on SE050 after all tests are completed. This should at least fix the problem of residual objects. Signed-off-by: Milosz Wasilewski <milosz.wasilewski@foundries.io>
When running xtest on the device with secure element (SE050) some tests generate objects in the element. These objects are not deleted by the tests: OP-TEE/optee_test#652 In the long run secure element runs out of space and all tests start failing with strange errors. To mitigate this the script will call reset method on SE050 after all tests are completed. This should at least fix the problem of residual objects. Signed-off-by: Milosz Wasilewski <milosz.wasilewski@foundries.io>
When running xtest on the device with secure element (SE050) some tests generate objects in the element. These objects are not deleted by the tests: OP-TEE/optee_test#652 In the long run secure element runs out of space and all tests start failing with strange errors. To mitigate this the script will call reset method on SE050 after all tests are completed. This should at least fix the problem of residual objects. Signed-off-by: Milosz Wasilewski <milosz.wasilewski@foundries.io>
This issue has been marked as a stale issue because it has been open (more than) 30 days with no activity. Remove the stale label or add a comment, otherwise this issue will automatically be closed in 5 days. Note that you can always re-open a closed issue at any time. |
When running regression 4007_ecc and regression 4011 with SE050 xtest creates key pairs in the element. These are left behind after the tests complete. After running a few iterations of xtest SE050 runs out of space for creating new keys. IMHO each test should delete the temporary objects once they're no longer used.
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