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Changelog
- Small tweaks to the code, such as better resizing with Numpad hotkeys and more consistent spacing when switching scale bar & label positions
- New feature: Correction of tilted perspective, e.g., for EBSD/FIB-SEM tilts (only pixel size for measurements or re-scaling of the image with TransformJ). Useful as a "post correction" if tilt correction was not enabled at the microscope during acquisition. Note: At the moment, it assumes that the y-direction/vertical is the tilted surface. Rotate an image 90° if your x direction is the tilted surface.
- New hotkey: [ s ] for saving as SVG, requires BioVoxxel Figure Tools
Third time is a charm. Fix rounding issue: If settings lead to scale bar length of less than 1 unit, set it to 1 unit. This should prevent most rounding issues I could catch (for now...) Hopefully the last of these fixes.
- Another update to addScalebar() function in FEI/TFS function to prevent rounding errors.
- Update addScalebar() function in FEI/TFS function, which caused rounding errors on the scale bar length.
- Scale-bar length is now calculated as a 1-2-5 series, thanks to Aleš Kladnik! (#9). As a result, (i) the list with predefined length values and (ii) the option to add extra values were removed
- Export/Import functionality to store/load parameters as csv files
- A set of new hotkeys on the numpad
- General clean-up of the code
- Linked repository to Zenodo
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Slightly changed the icon styles.
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The grabbed value for
Set pixel size and unit
for the current image is read-out with more decimals. -
New function:
Set image width and unit
to scale the image based on known image width. -
New function:
Calculate electron wavelength
from given beam energy. Will be posted to the log window. -
New function:
Edit source code
. Advanced option to easily access/edit the source code. -
New features for QuickScaleBar: The
Use Angstrom
option can be used to skip/ignore the Angstrom unit forAuto-unit switching
. It will then switch directly from nm to pm.Consider additional scale bar values
can be used to extend the dictionary of "magic values"" for the scale bar width to snap to. -
New features for FEI Crop Scale bar: The new
Add scale bar
checkbox can be deselected to only crop/scale the FEI/TFS image.
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Rewrote
FEI_crop_scalebar.ijm
to crop the FEI/TFS info bar based on the[Scan] VerFieldSize
and[Scan] PixelHeight
values. This should make the cropping work for every FEI/TFS machine as long as both values are found in the tiff metadata. -
Added a legacy option to use "list-based" cropping as in the old v0.2 version in the
FEI_crop_scalebar.ijm
option menu (Use list from code for cropping value (legacy option)
). Important: If your cropping does not work with the new version, copy your determined cropping values into the new if-clause in the code and activate the aforementioned menu option. -
The
Help
is now found in a new drop-down menu. -
A new function
Set pixel size and unit
was added to the drop-down menu. IT will fetch the values from the front-most image. You can then specify the values directly or use some special formats for electron microscopy from theUse special unit
menu. The latter do not show on my Windows system, but on Linux. Currently in the list: Å, Å$^{-1}$, and nm$^{-1}$. -
Updated the README.
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Renamed
ScaleBarTools.ijm
toEMScaleBarTools.ijm
because there is also a plugin by Gilles Carpentier with a similar name. Makes it clear that is meant for EM. -
Reorganization of the code:
QuickScaleBar.ijm
was merged intoEMScaleBarTools.ijm
.FEI_Crop_Scalebar.ijm
is still a stand-alone macro for easier use with batch processing. -
Included option menus for some icon tools, which can be accessed by right-click. More convenient editing than in the source code.
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Options parameters are stored internally in java variables and saved for future sessions (
ij.get
andij.set
calls). I took inspiration from another toolsets macro: Roi 1-click tools -
Added more options for scale bar appearance (serif font, bold, hide, ...).
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Added two additional tools in the menu: Move Overlays and Remove Overlays for quick manipulation of the scale bar (which is often an overlay).