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On VCK190, support for graphs with up to 36 input PLIOs and 36 output PLIOs
On VEK280, support for graphs with up to 16 input PLIOs and 16 output PLIOs
Performance testing mode has been enhanced to allow testing the performance of the graph with a sequence of user-provided data followed by a user-specified number of randomly generated values
New functional testing mode allows testing the functionality of the graph without any limit on the size of the dataset.
PLIO throughput for each channel is 5GB/sec (32 bits @ 1.25GHz)
User-defined number of replays for upscaling the size of datasets in performance testing mode on each input and output channel
User-defined start delay for each input and output PLIO
Built-in support for AIE event trace
SW APIs to develop a test application to run the AIE graph and transfer data to and from the AIE
Utility scripts to build the application and create a SD card image for board run on VCK190 and VEK280