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media: hi556: correct the test pattern configuration
commit 020f602 upstream.
Hynix hi556 support 8 test pattern modes:
hi556_test_pattern_menu[] = {
{
"Disabled",
"Solid Colour",
"100% Colour Bars",
"Fade To Grey Colour Bars",
"PN9",
"Gradient Horizontal",
"Gradient Vertical",
"Check Board",
"Slant Pattern",
}
The test pattern is set by a 8-bit register according to the
specification.
+--------+-------------------------------+
| BIT[0] | Solid color |
+--------+-------------------------------+
| BIT[1] | Color bar |
+--------+-------------------------------+
| BIT[2] | Fade to grey color bar |
+--------+-------------------------------+
| BIT[3] | PN9 |
+--------+-------------------------------+
| BIT[4] | Gradient horizontal |
+--------+-------------------------------+
| BIT[5] | Gradient vertical |
+--------+-------------------------------+
| BIT[6] | Check board |
+--------+-------------------------------+
| BIT[7] | Slant pattern |
+--------+-------------------------------+
Based on function above, current test pattern programming is wrong.
This patch fixes it by 'BIT(pattern - 1)'. If pattern is 0, driver
will disable the test pattern generation and set the pattern to 0.
Fixes: e621384 ("media: hi556: Add support for Hi-556 sensor")
Cc: stable@vger.kernel.org
Signed-off-by: Bingbu Cao <bingbu.cao@intel.com>
Signed-off-by: Sakari Ailus <sakari.ailus@linux.intel.com>
Signed-off-by: Hans Verkuil <hverkuil@xs4all.nl>
Signed-off-by: Greg Kroah-Hartman <gregkh@linuxfoundation.org>
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