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FEA — Free Electron Absorption Architecture

A transistor-free computing architecture on hydrogen-passivated Si(100). Electrons travel along dangling bond wires (DBWs); 5-atom cross-shaped dangling-bond clusters selectively capture passing electrons via Breit–Wigner resonance under gate-voltage control. One cluster (Fusion Block) stores one bit; 64 Fusion Blocks form a 64-bit Word.

Architectural hierarchy: 5-atom Fusion Block, 64-bit Word, and 256×256-block Zone on H-Si(100)

Fusion Block (a), 64-bit Word (b), 256×256-block Zone (c). A 3 cm² die contains ~1.7 × 10⁹ Zones.

Preprint: 10.5281/zenodo.19559255 · Paper PDF: Paper/FEA-architecture.pdf (22 pages, 8 figures, 14 simulations, 13 references).

The Zenodo preprint reports numbers from FEA_sim_v1.cpp. The current reference implementation is simulations/FEA_sim_v2.cpp, which replaces the hardcoded Γ with a first-principles derivation, adds a 2D thermal solver, adds a contention-model crossbar, and makes the ALU/VM simulations consistent under a multi-FIRE write-fidelity model. Numbers below are v2.


Key Numbers

Value
Physical primitive 5-atom cross DB cluster on H-Si(100)
1 Fusion Block 1 bit
1 Word 64 Fusion Blocks
Practical block density 3.77 × 10¹³ cm⁻²
System clock (T_cycle = 108.85 ps) 9.19 GHz
Resonance broadening Γ (derived) 45 meV
Data-plane power density 26.47 mW/cm²
Charging energy E_C 0.65 eV
Retention τ_ret at 300 K 52.2 ms
Refresh overhead 0.011%
ADD_64 single-FIRE ideal / multi-FIRE (N=18) 0.87 ns / 2.72 ns
MUL_64 single-FIRE ideal / multi-FIRE 2.18 ns / 4.03 ns
Slingshot hop (8-lane parallel) 1.09 ns
3 cm² die: in-situ memory 14.1 TB
3 cm² die: data-plane power 79.4 mW
3 cm² die: total chip power (incl. CMOS control plane) ~3.8 W

Simulation Suite (v2, 14 simulations)

Source: simulations/FEA_sim_v2.cpp (~1,370 lines, C++17, no external dependencies).

# Name Result
1 Hamiltonian + lead self-energy Γ = 45 meV (derived from Σ = t_c² g_L)
2 Transmission: Green's function vs Breit–Wigner T(E) from full GF; injection-averaged capture
3 Kramers retention + Langevin MC τ_ret = 52.2 ms; FPT distribution exponential
4 Wavepacket with embedded cluster On/off absorption contrast ~1,066×
5 CLA ADD with multi-FIRE redundancy N_FIRE = 18 → 0/1,000 failures → 2.72 ns
6 ARM/FIRE/CONFIRM timing 33 + 42.9 + 33 = 108.85 ps
8 Density, memory, power breakdown 14.1 TB; P_transit + P_absorb + P_gate
9 2D steady-state thermal (SOR) ΔT_max ≈ 1.07 K with CMOS, <3 mK data-plane only
10 FEA VM — three programs, 100-run MC vector add 96%, dot product 98%, branch 98%
11 Full-chip stability (binomial MC) 99.99% compute utilisation under τ/2 refresh
12 Crossbar contention (real arbitration) 147 / 133 / 9 GOPS/zone (row / random / strided)
14 Cross-die access (fat-tree routing) 95th %ile 32 hops (34.8 ns), max 34 hops (37.0 ns)

v1's SIM 7 and SIM 13 were tautological Monte Carlo self-checks and have been removed; the underlying physics is now covered by SIM 3 (Langevin) and SIM 5 (block-level CLA).


Build & Run

C++17 compiler (clang, gcc). No external libraries.

make          # builds FEA_sim_v2
make run      # runs v2
make v1       # builds the archived v1 for reproducibility

One-liner:

c++ -std=c++17 -O2 -o FEA_sim_v2 simulations/FEA_sim_v2.cpp && ./FEA_sim_v2

Captured reference outputs: simulations/FEA_sim_v2_output.txt, simulations/FEA_sim_v1_output.txt.


Architecture

  1 Fusion Block  =  1 bit    (5-atom cross DB cluster)
  64 Fusion Blocks =  1 Word   (64-bit parallel register)
  1024 Words       =  1 Zone   (256×256 = 65,536 blocks)
  ~10⁹ Zones       =  1 Chip   (3 cm² M4-Max die)

CIM, PIM, and FEA compared

Compute–memory integration. (a) CIM: array + peripheral ADCs + accumulators + separate decoder. (b) PIM: logic near DRAM banks, fetch–execute boundary preserved per bank. (c) FEA: each Fusion Block is simultaneously the memory cell and the compute unit.

Instruction set (5 micro-ops, CMOS control plane):

  • ARM Zone, Word — address target Word (1 cycle)
  • FIRE Op — execute ALU op on armed Word (1–20 cycles)
  • CONFIRM — read back result via AC charge sensing (1 cycle)
  • SLINGSHOT src, dst — 8-lane parallel 64-bit transfer (10 cycles)
  • BRANCH cond, offset — conditional jump (1 cycle, no speculation)

Sparse-Workload Power

The data plane has no dark-silicon floor. The CMOS control plane (~3.8 W, dominated by PLL distribution) does, unless actively duty-cycled. The three relevant numbers at 5% activation (95%-sparse transformer):

Layer Power at 5% activation
Data plane only ~4 mW
Full chip, static CMOS ~3.81 W
Full chip, duty-cycled CMOS (100 mW floor) ~0.29 W

Full-chip power vs activation fraction

Full-chip power vs activation fraction (3 cm² die, log–log). Green: data plane only. Blue: total chip, static CMOS. Purple: total chip, duty-cycled CMOS. Dashed red: Apple M4 Max (40 W). Dotted orange: human brain (20 W).


Limitations

  • Room-temperature DB retention has not been experimentally measured. All retention figures are Kramers-model extrapolations from cryogenic (~4 K) STM measurements.
  • No compiler. Instruction traces are hand-compiled.
  • Fabrication of 10¹⁴ clusters on a 3 cm² die requires massively parallel atomic-precision patterning; current STM demonstrations operate at the 10²–10⁴-atom scale.
  • CMOS control-plane power is an analytical estimate; physical design would be required to confirm it and to bound clock-distribution, I/O, and PDN contributions.

Citation

@misc{ali2026fea,
  author    = {Ali, Syed Abdur Rehman},
  title     = {Free Electron Absorption: A Bit-Level Transistor-Free Computing
               Architecture on Hydrogen-Passivated Silicon},
  year      = 2026,
  month     = apr,
  publisher = {Zenodo},
  version   = {v1.0},
  doi       = {10.5281/zenodo.19559255},
  url       = {https://doi.org/10.5281/zenodo.19559255},
}

Plain text:

Ali, S. A. R. (2026). Free Electron Absorption: A Bit-Level Transistor-Free Computing Architecture on Hydrogen-Passivated Silicon (v1.0). Zenodo. https://doi.org/10.5281/zenodo.19559255


License

Code: MIT — see LICENSE.


Syed Abdur Rehman Ali · Independent Researcher · ORCID 0009-0004-6611-2918

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