Visual Defect Analyzer 2026 v1.0.0
Industrial metrology application developed by Dr. Ing. Santiago D. Barrionuevo for calibrated defect detection, visual inspection, SQL traceability, wafer-yield scenario projection and process-quality reporting.
This release includes:
- Windows-testable local application
- Controlled lattice-defect inspection demo
- Custom and random defect-generation modes
- Point vacancy, extra atom/contamination, displaced-site and line-defect analysis
- Uploaded-image analysis pathway for SEM/TEM/STEM/AFM/optical-style images
- Green/yellow/red engineering status dashboard
- Defect manifest export in CSV/JSON
- SQLite traceability log
- Visual review dashboard with zoomable outputs
- Wafer-yield scenario projection
- Downloadable engineering reports and outputs
This is a production-oriented technical prototype. Real industrial deployment would require validation using real inspection datasets, expert-labeled defects, calibrated metrology references, gauge R&R, false-positive/false-negative analysis and process-specific acceptance criteria.
Developed by Dr. Ing. Santiago D. Barrionuevo
Contact: +34 666 788 608 | [santi.barri@unizar.es](mailto:santi.barri@unizar.es)