TFStudio 1.7.1

[aai2k]

Do you use an ellipsometer? This release imports measured Ψ and Δ, and I want it to read your instrument's files exactly as exported. Share a sample file in issue #66 and the format gets supported.

Changelog

v1.7.1

Added

• Monitoring windows: an absolute noise floor joins the relative signal error, so a wavelength where the signal has died scores as unusable instead of noiseless.
• Monochromatic Monitoring Wizard: one wavelength and one termination strategy can be set on the whole run at once.
• Wavelength vs Angle: a new analysis window maps T, R or A over a wavelength range and an angle range at once, as a heatmap or a rotatable surface.

Changed

• Every analysis window that sweeps a wavelength range now warns when it reaches past a material's measured data and offers to pull the range back; windows that work at a single wavelength offer the same for that wavelength.
• Plot Engine: the curve and surface panels now use the same controls as the rest of the analysis windows.
• Monitor Worksheet: Layers per chip now goes up to the whole run, so direct monitoring on a single chip can be planned; long runs also compute much faster.
• Monochromatic Monitoring Wizard: the per-layer monitoring plan has its own page; Auto λ now plans wavelength and termination strategy together, and is much faster on long designs.
• Process Exporter and the Broadband Monitoring Wizard compute much faster on designs with many layers.

Fixed

• A 3D surface now draws each swept axis over the range it was swept, instead of squeezing the data into a corner of the box.
• A surface with a point it could not compute now colours the rest of the map normally, instead of flattening every cell to one colour.
• Surfaces and heatmaps: the colour bar fills the plot and names the value on hover; both redraw much faster and no longer trail behind a window resize.
• Plot Engine: number fields in the curve and surface panels can be cleared and retyped.
• The Monitor Worksheet and Process Exporter charts no longer lag on designs with hundreds of layers.
• Monochromatic Monitoring Wizard: running the simulation on a design with hundreds of layers no longer freezes the app.
• Monitoring wizards: the layer buttons scroll on long designs instead of running off the page, and the selected layer stays in view during playback.
• Monitoring wizard signal previews: the readout can now land exactly on the marked cut line instead of hopping over it.
• The app menu arrow beside the TFStudio logo is now big enough to read as an arrow instead of a dot.

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This discussion was created from the release TFStudio 1.7.1.

[xluo3166-pixel]

第一层信息99.78%，我基片的透过率才只有92左右，镀的是SIO2，规整膜系中的6H的晶控厚度没显示。我给了一张OptiLayer的监控表格，还有个请求，图表能不能支持DB的显示，因为我是做滤光片的，材料导入能不能支持TFCalc和Essential Macleod，公式的录入很多时候的手工录入的格式是LHLHL6HLHLH中间没有空格，谢谢大神。

OptiLayer

[aai2k]

@xluo3166-pixel
This is caused because your incident medium is not air, and worksheet uses it for calculations. I now see that this is a problem, so I'll make it so incident medium for witness chips will be n=1.

On the 6H layers: the Crystal column was only filled for layers the optical monitor cannot terminate well, as the hint to run those on the crystal. The 6H layers were the only ones on your sheet that terminate well optically, so they were the only blanks. In the next release the column shows the thickness for every layer, with the flagged layers highlighted.

Formulas without spaces: LHLHL6HLHLH will parse in the next release. Until then a space before the number works: LHLHL 6HLHLH.

dB display: will do. The spectrum plot will get dB and optical density as axis units.

TFCalc and Essential Macleod materials: I have sample files for TFCalc imports so that can be done, but I don't have Essential Macleod. If you attach exported material files from it I will add the reader.

Thanks for the OptiLayer sheet, it was useful. With a BK7 witness chip at 1471 nm TFStudio now reads 92.21% on the bare chip against OptiLayer's 92.22.

Would that be satisfactory or you have other notes?

[xluo3166-pixel]

我重新跟你发邮件了