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Bump to 5.4.0 and improve test robustness#226

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ed-xmos merged 10 commits intoxmos:developfrom
ed-xmos:feature/test_robustness
Oct 1, 2024
Merged

Bump to 5.4.0 and improve test robustness#226
ed-xmos merged 10 commits intoxmos:developfrom
ed-xmos:feature/test_robustness

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@ed-xmos ed-xmos commented Oct 1, 2024

Add FIFO to decouple xscope writes in test. Works around occasional error such as:

Build and Docs / HW tests / Run tests / test_BasicMicArray[1_isr-16frame-8n_mics] – test_mic_array.Test_BasicMicArray

Also changes to support broader range of executors as often waiting for 3800 jobs

Note - there was an issue where v5.3.0 was tagged and released but not marked as latest release hence not bumping version before as I though 5.2.0 was latest.

@ed-xmos ed-xmos self-assigned this Oct 1, 2024
@ed-xmos ed-xmos changed the title Add FIFO to decouple xscope writes in test Test robustness Oct 1, 2024
@ed-xmos ed-xmos changed the title Test robustness Bump to 5.4.0 and improve test robustness Oct 1, 2024
@ed-xmos ed-xmos merged commit ec5e08b into xmos:develop Oct 1, 2024
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