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1. IC-DefectNCD IC-DefectNCD Public

   Wafer surface defects in semiconductor manufacturing have a critical impact on product yield and reliability.We propose IC-DefectNCD, a semi-supervised framework that performs single-image intrinsi…

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5. Anomaly-aware-Neighborhood-Contrastive-Segmentation Anomaly-aware-Neighborhood-Contrastive-Segmentation Public

   Anomaly detection in IC SEM images is critical to yield, yet existing methods depend on large-scale annotations and often generalize poorly to fast-evolving processes and complex, repetitive layout…