Interactive visualization tool for wafer defect inspection data.
Displays defect points, event regions, packet boundaries, spiral trajectory, and raw image overlays on a circular wafer map.
| Package | Minimum Version |
|---|---|
| Python | 3.11.0 |
| PySide6 | 6.11.0 |
| NumPy | 2.4.4 |
| Matplotlib | 3.10.9 |
| Pillow | 12.2.0 |
| pyqtgraph | 0.14.0 |
See requirements.txt for pip-installable dependencies.
MidView/
├── main.py # Entry point
├── build.py # PyInstaller packaging script
├── backend/
│ ├── models.py # Data structures
│ ├── data_load/ # CSV & binary data loaders
│ └── unpacking8M.py # 8M binary image parser
├── frontend/
│ ├── main_window.py # Main application window
│ ├── circular_view.py # Circular wafer visualization
│ ├── detail_panel.py # Defect detail panel
│ └── theme.py # Light theme stylesheet
└── .claude/ # Claude Code configuration
conda activate MidView
conda update pip
pip install -r requirements.txt
python main.pyClick Load Data to select a folder containing defects.csv, events.csv, and packet_raw_meta.csv.