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Release v1.0.1.8
feat: Enhanced IQ Correction Algorithm Configuration and Test Data Simulation
π New Features
IQ Correction Algorithm System Enhancement
- Advanced IQ Correction Parameters: Expanded from simple orthogonality correction switch to comprehensive IQ correction algorithm configuration
- Dual Mode Support: Added automatic/manual mode selection for IQ correction algorithm
- Precision Control: Introduced floating-point correction value parameter for fine-tuning
- Parameter Address Optimization: Reorganized parameter type definitions (OrthogonalityCorrectionSwitch: 0x10000004, OrthogonalityCorrectionMode: 0x1000000C, OrthogonalityCorrectionValue: 0x1000000D)
Test Environment Improvements
- Simulated Device Status: Added fixed simulation data for TEC NTC temperature (999), board temperature (22.22Β°C), and PD current (100.12)
- Enhanced Testing Reliability: Provides stable mock data for development and validation
π§ Technical Improvements
- Parameter System Refactoring: Updated serialization/deserialization logic for new IQ correction parameter types
- Type Safety Enhancement: Improved parameter type mapping and validation
- Protocol Documentation Sync: Updated communication protocol documentation to reflect parameter changes
π Documentation
- Communication Protocol Update: Synchronized protocol documentation with new parameter definitions
- Parameter Reference: Added comprehensive parameter address mapping and value ranges